Decoupled transversely-excited film bulk acoustic resonators
Acoustic resonator devices and filters are disclosed. An acoustic resonator includes a substrate and a piezoelectric plate supported by the substrate. A portion of the piezoelectric plate suspended across a cavity in the substrate forms a diaphragm. A decoupling dielectric layer is on a front surface of the diaphragm. An interdigital transducer (IDT) has interleaved fingers on the decoupling dielectric layer over the diaphragm. The IDT and piezoelectric plate are configured such that a radio frequency signal applied to the IDT excites shear acoustic waves in the diaphragm.
1. An acoustic resonator device comprising:
a substrate;
at least one piezoelectric plate supported by the substrate;
a diaphragm comprising a portion of the at least one piezoelectric plate suspended across a cavity;
a decoupling dielectric layer on a surface of the diaphragm; and
an interdigital transducer (IDT) with interleaved fingers on the decoupling layer opposite the diaphragm,
wherein the IDT and the at least one piezoelectric plate are configured such that a radio frequency signal applied to the IDT excites shear acoustic waves in the diaphragm.
2. The acoustic resonator device of claim 1 , wherein the at least one piezoelectric plate is rotated Y-cut lithium niobate.
3. The acoustic resonator device of claim 2 , wherein Euler angles of the at least one piezoelectric plate are 0°, β, 0°, and 30°≤β≤38°.
4. The acoustic resonator device of claim 1 , wherein the decoupling dielectric layer comprises one of silicon dioxide, silicon nitride, and aluminum oxide.
5. The acoustic resonator device of claim 1 , wherein a thickness of the at least one piezoelectric plate is greater than or equal to 200 nm and less than or equal to 1000 nm.
6. The acoustic resonator device of claim 5 , wherein a thickness of the decoupling dielectric layer is greater than or equal to 0.05 times the thickness of the at least one piezoelectric plate and less than or equal to 0.5 times the thickness of the at least one piezoelectric plate.
7. The acoustic resonator device of claim 1 , further comprising:
a dielectric layer on the decoupling dielectric layer between the interleaved fingers of the IDT,
wherein a resonant frequency of the acoustic resonator device is determined, in part, by a thickness of the dielectric layer.
8. The acoustic resonator device of claim 7 , wherein the dielectric layer comprises at least one of silicon dioxide, silicon nitride, and aluminum oxide.
9. The acoustic resonator device of claim 1 , wherein the IDT comprises one of aluminum, an aluminum alloy, copper, a copper alloy, beryllium, gold, tungsten, molybdenum, chromium, and titanium.
10. The acoustic resonator device of claim 1 , wherein the substrate comprises a combination of materials and the cavity extends into the substrate.
11. An acoustic resonator acoustic resonator device comprising:
a substrate;
at least one piezoelectric plate supported by the substrate;
a diaphragm comprising a portion of the at least one piezoelectric plate suspended across a cavity;
a decoupling dielectric layer on a surface of the diaphragm; and
an interdigital transducer (IDT) comprising a plurality of interleaved fingers extending alternately from first and second busbars, overlapping portions of the plurality of interleaved fingers on the decoupling layer opposite the diaphragm,
wherein the IDT and the at least one piezoelectric plate are configured such that a radio frequency signal applied between the first and second busbars excites shear acoustic waves in the diaphragm.
12. The acoustic resonator device of claim 11 , wherein the substrate comprises a combination of materials and the cavity extends into the substrate.
13. The acoustic resonator device of claim 11 , wherein the decoupling dielectric layer comprises one of silicon dioxide, silicon nitride, and aluminum oxide.
14. The acoustic resonator device of claim 11 , wherein a thickness of the at least one piezoelectric plate is greater than or equal to 200 nm and less than or equal to 1000 nm.
15. The acoustic resonator device of claim 14 , wherein a thickness of the decoupling dielectric layer is greater than or equal to 0.05 times the thickness of the at least one piezoelectric plate and less than or equal to 0.5 times the thickness of the at least one piezoelectric plate.
16. The acoustic resonator device of claim 11 , further comprising:
a dielectric layer on the decoupling dielectric layer between fingers of the plurality of interleaved fingers of the IDT,
wherein a resonant frequency of the acoustic resonator device is determined, in part, by a thickness of the dielectric layer.
17. The acoustic resonator device of claim 16 , wherein the dielectric layer comprises at least one of silicon dioxide, silicon nitride, and aluminum oxide.
18. The acoustic resonator device of claim 11 , wherein the IDT comprises one of aluminum, an aluminum alloy, copper, a copper alloy, beryllium, gold, tungsten, molybdenum, chromium, and titanium.
19. The acoustic resonator device of claim 11 , wherein the at least one piezoelectric plate is rotated Y-cut lithium niobate.
20. The acoustic resonator device of claim 19 , wherein Euler angles of the at least one piezoelectric plate are 0°, β, 0°, and 30°≤β≤38°.