IP Library Granted Patent US 12,397,458
Granted Patent B2
US 12,397,458 · App. 17/551,841 · Granted Aug 26, 2025

Razor blade

Inventors: Ioannis Papatriantafyllou (Maroussi, GR); Taxiarchis Terlilis (Athenes, GR); Labros Kontokostas (N. Irakleio, GR)
Assignee: BIC-VIOLEX SA
B26B21/56B26B21/58
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Quick Facts
Patent No.
US 12,397,458
App. No.
17/551,841
Granted
Aug 26, 2025
Kind
B2
Abstract

A razor blade including a substrate with a cutting edge portion ending in a sharpened tip. The substrate having a thickness of between 1.55 and 1.97 micrometers measured at a distance of five micrometers from the tip, a thickness of between 4.6 and 6.34 micrometers measured at a distance of twenty micrometers from the tip, and a thickness of between 19.8 and 27.12 micrometers measured at a distance of one hundred micrometers from the tip.

Claims (30)

1. A razor blade comprising a substrate including a cutting edge having a symmetrical tapering geometry with two substrate sides and a planar portion ending in a sharpened tip, the tapering geometry having a thickness of between 1.55 and 1.97 micrometers measured at a distance of five micrometers from the tip, to a thickness of between 4.60 and 6.34 micrometers measured at a distance of twenty micrometers from the tip, to a thickness of between 19.8 and 27.12 micrometers measured at a distance of hundred micrometers from the tip,

wherein the thickness of the cutting edge of the substrate is described with the following mathematical formulas:

t=a ·( x b )  (A)

t =( c·x )+ d   (B)

wherein, a and c are constants from an interval (0, 1), b is a constant from an interval (0.5, 1), d is a constant from an interval (0.5, 20), x refers to a distance from the tip in micrometers and t refers to the thickness of the blade in micrometers, and wherein equation (A) is used to determine the thickness of the cutting edge from the tip to a transition point, and equation (B) is used to determine the thickness of the cutting edge starting from the transition point,

wherein a blade thickness increase rate is defined by a slope from the sharpened tip to the transition point, wherein the blade thickness increase rate in a region between the tip to the transition point is greater than the blade thickness increase rate of the cutting edge starting from the transition point.

2. The razor blade according to claim 1 , wherein the tapering geometry of the substrate further includes a thickness of between 6.50 and 8.94 micrometers measured at a distance of thirty micrometers from the tip, wherein the tapering geometry of the substrate further includes a thickness of between 8.40 and 11.54 micrometers measured at a distance of forty micrometers from the tip, wherein the tapering geometry of the substrate further includes a thickness of between 10.30and 14.13 micrometers measured at a distance of fifty micrometers from the tip, wherein the tapering geometry of the substrate further includes a thickness of between 29.30and 40.11 micrometers measured at a distance of hundred fifty micrometers from the tip, wherein the tapering geometry of the substrate further includes a thickness of between 38.80 and 49.74 micrometers measured at a distance of two hundred micrometers from the tip.

3. The razor blade according to claim 1 , wherein the tapering geometry of the substrate further includes a thickness of between 48.30 and 59.37 micrometers measured at a distance of two hundred fifty micrometers from the tip.

4. The razor blade according to claim 1 , wherein the tapering geometry of the substrate further includes a thickness of between 57.80 and 69.00 micrometers measured at a distance of three hundred micrometers from the tip.

5. The razor blade according to claim 1 , wherein the tapering geometry of the substrate further includes a thickness of between 67.30 and 78.62 micrometers measured at a distance of three hundred fifty micrometers from the tip.

6. The razor blade according to claim 1 , wherein the substrate is a stainless steel comprising, in weight:

0.62-0.75% of carbon,

12.7-13.7% of chromium,

0.45-0.75% of manganese,

0.20-0.50% of Silicon,

no more than traces of Molybdenum, and

balanced iron.

7. The razor blade according to claim 1 , wherein the substrate is covered by a strengthening coating.

8. The razor blade according to claim 7 , wherein the strengthening coating comprises Titanium and Boron.

9. The razor blade according to claim 8 , wherein the substrate is covered by an interlayer and the interlayer is covered by the strengthening layer.

10. The razor blade according to claim 8 , wherein the strengthening layer is covered by a top layer.

11. The razor blade according to claim 10 , wherein the top layer is covered by a polytetrafluoroethylene (PTFE) layer.

12. The razor blade according to claim 1 , wherein the blade thickness increase rate in a region between a distance from 40 micrometers to 300 micrometers from the tip is less than the blade thickness increase rate from the tip of the blade to the distance of 40 micrometers from the tip.

13. The razor blade according to claim 12 , wherein the blade thickness increase rate in a region between a distance from 40 micrometers to 350 micrometers from the tip is less than the blade thickness increase rate from the tip of the blade to the distance of 40 micrometers from the tip.

14. The razor blade according to claim 1 , wherein the transition point is between about 20 micrometers from the tip to about 40 micrometers from the tip.

15. The razor blade according to claim 1 , wherein equation (A) is used to determine the thickness of the cutting edge from the tip to about 40 micrometers from the tip, where a=0.5 and b=0.8, and either equation (A) or equation (B) with constants c=0.2 and d=1.5 used to determine the thickness of the cutting edge from about 40 micrometers from the tip.

16. The razor blade according to claim 1 , wherein equation (A) is used to determine the thickness of the cutting edge from the tip to about 20 micrometers from the tip, where a=0.47 and b=0.84, and either equation (A) or equation (B) with constants c=0.251 and d=0.800 used to determine the thickness of the cutting edge from about 20 micrometers from the tip.

17. The razor blade according to claim 1 , wherein equation (B) is used to determine the thickness of the cutting edge from about 150 micrometers to about 350 micrometers, with constants c=0.1775 and d=11.8750.

18. The razor blade according to claim 1 , wherein equation (A) is used to determine the thickness of the cutting edge from the tip to about 20 micrometers from the tip, where a=0.45 and b=0.79, and either equation (A) or equation (B) with constants c=0.296 and d=0.93 used to determine the thickness of the cutting edge from about 20 micrometers from the tip.

19. The razor blade according to claim 1 , wherein equation (A) is used to determine the thickness of the cutting edge from the tip to about 20 micrometers from the tip, where a=0.54 and b=0.80, and equation (A) with constants a=0.40 and b=0.90 used to determine the thickness from about 20 micrometers from the tip to about 200 micrometers from the tip, and equation (B) with constants c=0.18 and d=11.10 is used to determine the thickness from about 200 micrometers to about 350 micrometers from the tip.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2021
From: PAPATRIANTAFYLLOU, IOANNIS; TERLILIS, TAXIARCHIS; KONTOKOSTAS, LABROS
To: BIC-VIOLEX SA
Reel/Frame 058399/0586 →
Continuity (2)
Continuation 15535984
Related Publication 20220105648A1 · Apr 7, 2022
References Cited (120)
US 3761372A · Sastri · 1973 [cited by applicant]
US 3835537A · Sastri · 1974 [cited by examiner]
US 3911579A · Lane et al. · 1975 [cited by applicant]
US 4720918A · Curry et al. · 1988 [cited by applicant]
US 4916817A · Atwater · 1990 [cited by examiner]
US 5032243A · Bache · 1991 [cited by examiner]
US 5048191A · Hahn · 1991 [cited by applicant]
US 5056227A · Kramer · 1991 [cited by examiner]
US 5088195A · Lazarshik · 1992 [cited by examiner]
US 5088202A · Boland · 1992 [cited by examiner]
US 5129289A · Boland et al. · 1992 [cited by applicant]
US 5142785A · Grewal · 1992 [cited by examiner]
US 5275672A · Althaus et al. · 1994 [cited by applicant]
US 5497550A · Trotta · 1996 [cited by examiner]
US 5669144A · Hahn et al. · 1997 [cited by applicant]
US 5983756A · Orloff · 1999 [cited by examiner]
US 6105261A · Ecer · 2000 [cited by examiner]
US 6289593B1 · Decker · 2001 [cited by examiner]
US 6327784B1 · Altena · 2001 [cited by examiner]
US 6330750B1 · Meckel · 2001 [cited by applicant]
US 6468642B1 · Bray · 2002 [cited by examiner]
US 6684513B1 · Clipstone et al. · 2004 [cited by applicant]
US 7060367B2 · Yamada et al. · 2006 [cited by applicant]
US 7140113B2 · King et al. · 2006 [cited by applicant]
US 7587829B2 · King · 2009 [cited by examiner]
US 7758707B2 · Millward · 2010 [cited by applicant]
US 8011104B2 · Masek et al. · 2011 [cited by applicant]
US 8322253B2 · Howells · 2012 [cited by applicant]
US 8409462B2 · Keenan · 2013 [cited by examiner]
US 8499462B2 · Masek et al. · 2013 [cited by applicant]
US 8769833B2 · Culf · 2014 [cited by applicant]
US 9079321B2 · Claus et al. · 2015 [cited by applicant]
US 9248579B2 · DePuydt et al. · 2016 [cited by applicant]
US 9751230B2 · Skrobis · 2017 [cited by examiner]
US 9902013B2 · Uemura et al. · 2018 [cited by applicant]
US 10549438B2 · Skrobis et al. · 2020 [cited by applicant]
US 11230024B2 · Papatriantafyllou et al. · 2022 [cited by examiner]
US 11654588B2 · Nisby · 2023 [cited by examiner]
US 11660770B2 · Lee · 2023 [cited by examiner]
US 20030208912A1 · Park et al. · 2003 [cited by applicant]
US 20040121159A1 · Cloud · 2004 [cited by examiner]
US 20040177516A1 · Teeuw et al. · 2004 [cited by applicant]
US 20050160878A1 · Wort et al. · 2005 [cited by applicant]
US 20060201001A1 · Teeuw et al. · 2006 [cited by applicant]
US 20060265885A1 · Clipstone · 2006 [cited by examiner]
US 20060277767A1 · Sun et al. · 2006 [cited by applicant]
US 20070186424A1 · Becker · 2007 [cited by examiner]
US 20070283578A1 · Newman · 2007 [cited by examiner]
US 20080086888A1 · Scheinfeld · 2008 [cited by examiner]
US 20080178476A1 · Luttgens · 2008 [cited by applicant]
US 20080190758A1 · Papachristos · 2008 [cited by examiner]
US 20090194203A1 · Hirai · 2009 [cited by examiner]
US 20100011590A1 · DePuydt et al. · 2010 [cited by applicant]
US 20100024222A1 · Akari · 2010 [cited by examiner]
US 20100178493A1 · Wang · 2010 [cited by examiner]
US 20100178515A1 · Wang · 2010 [cited by examiner]
US 20100287781A1 · Skrobis · 2010 [cited by examiner]
US 20100288097A1 · Uemura · 2010 [cited by examiner]
US 20100299931A1 · Marchev et al. · 2010 [cited by applicant]
US 20110010950A1 · Madeira · 2011 [cited by examiner]
US 20110209988A1 · Madeira · 2011 [cited by examiner]
US 20120276826A1 · Floter · 2012 [cited by examiner]
US 20120311865A1 · Hamilton · 2012 [cited by examiner]
US 20130014395A1 · Patel et al. · 2013 [cited by applicant]
US 20130014396A1 · Skrobis et al. · 2013 [cited by applicant]
US 20130031794A1 · Duff, Jr. · 2013 [cited by examiner]
US 20150328789A1 · Skrobis et al. · 2015 [cited by applicant]
US 20160016322A1 · Islam et al. · 2016 [cited by applicant]
US 20180043561A1 · Nisby et al. · 2018 [cited by applicant]
US 20180215056A1 · Logothetidis et al. · 2018 [cited by applicant]
US 20200307006A1 · Kontokostas et al. · 2020 [cited by applicant]
US 20200316802A1 · Kontokostas et al. · 2020 [cited by applicant]
US 20210094199A1 · Lee et al. · 2021 [cited by applicant]
US 20230311352A1 · Lee · 2023 [cited by examiner]
US 20230311354A1 · Claus · 2023 [cited by examiner]
US 20230347537A1 · Maziarz · 2023 [cited by examiner]
US 20230364818A1 · Park · 2023 [cited by examiner]
US 20230373119A1 · Skrobis · 2023 [cited by examiner]
US 20230373120A1 · Skrobis · 2023 [cited by examiner]
US 20230373121A1 · Skrobis · 2023 [cited by examiner]
US 20230373122A1 · Skrobis · 2023 [cited by examiner]
US 20240051167A1 · Duff, Jr. · 2024 [cited by examiner]
US 20240051168A1 · Duff, Jr. · 2024 [cited by examiner]
US 20240051169A1 · Duff, Jr. · 2024 [cited by examiner]
US 20240051170A1 · Duff, Jr. · 2024 [cited by examiner]
US 20240131740A1 · Gluche · 2024 [cited by examiner]
US 20240246251A1 · Jung · 2024 [cited by examiner]
US 20240300126A1 · Park · 2024 [cited by examiner]
US 20240308094A1 · Lee · 2024 [cited by examiner]
US 20240316810A1 · Lee · 2024 [cited by examiner]
US 20240383163A1 · Pandis · 2024 [cited by examiner]
US 20250135670A1 · Hanson · 2025 [cited by examiner]
US 20250153381A1 · Jung · 2025 [cited by examiner]
US 20250153382A1 · Jung · 2025 [cited by examiner]
DE 29718352 · 1997 [cited by applicant]
EP 1465697 · 1977 [cited by applicant]
EP 0126128B1 · 1987 [cited by applicant]
EP 0363648B1 · 1993 [cited by applicant]
EP 0612280B1 · 1998 [cited by applicant]
EP 0255834B1 · 1998 [cited by applicant]
EP 0589756B1 · 1998 [cited by applicant]
EP 0884142A1 · 1998 [cited by applicant]
EP 0582676B1 · 2000 [cited by applicant]
EP 1259361B1 · 2002 [cited by applicant]
EP 0757615B1 · 2004 [cited by applicant]
EP 1397234B1 · 2006 [cited by applicant]
EP 1601507B1 · 2010 [cited by applicant]
EP 2323819B1 · 2012 [cited by applicant]
EP 2326470B1 · 2012 [cited by applicant]
EP 2495080B1 · 2014 [cited by applicant]
WO 03006218A1 · 2003 [cited by applicant]
WO 2006079361A1 · 2006 [cited by applicant]
WO 2007095120A2 · 2007 [cited by applicant]
WO 2008065949A1 · 2008 [cited by applicant]
WO 2009143130A2 · 2009 [cited by applicant]
WO 2010008981A1 · 2010 [cited by applicant]
WO 2013010049A1 · 2013 [cited by applicant]
WO 2013010072A1 · 2013 [cited by applicant]
WO 2015179217A1 · 2015 [cited by applicant]
International Search Report of PCT/EP2014/079091, dated Aug. 18, 2015. [cited by applicant]