Techniques for improved additive fabrication on a film surface and related systems and methods
According to some aspects, techniques are provided to mitigate challenges with additive fabrication devices that utilize a film. These techniques include: improvements to an additive fabrication device build platform to more evenly apply forces onto the film; techniques for inhibiting adhesion between a pair of films and for removing dirt or dust therein; techniques for detecting and/or mitigating the effects of scratches or dust on films; and techniques for detecting film punctures, detecting an imminent film puncture, and/or reducing the impact on the device when punctures occur.
1. A method of detecting a contaminated region of a film in an additive fabrication device, the method comprising:
emitting light from a light source included in a movable stage, wherein the movable stage is configured to move in a first direction with respect to the additive fabrication device;
directing the emitted light by an optical scanning device included in the movable stage to a plurality of locations on a film of a liquid container, wherein the film corresponds to a curing plane for the additive fabrication device;
detecting, by a light sensor, different intensities of light reflected from the film for each of the plurality of locations on the film;
detecting one or more contaminants on the film by comparing the different intensities of the reflected light from the film;
in response to detecting the one or more contaminants on the film, calculating respective locations of the one or more contaminants on the film; and
moving the container relative to a build platform of the additive fabrication device during a layer curing process, said moving being based on the calculated location of at least one of the one or more contaminants on the film.
2. The method of claim 1 , wherein directing the emitted light by the optical scanning device is performed in conjunction with moving the movable stage in the first direction.
3. The method of claim 1 , wherein detecting the one or more contaminants on the film comprises measuring a first intensity of reflected light from a first region on the film that is lower or higher than a second intensity of reflected light from a second region on the film that is adjacent to the first region.
4. The method of claim 1 , wherein the film is a bottom film and wherein the container includes a top film spaced apart from the bottom film.
5. The method of claim 4 , wherein one or more dust control devices are installed between the top film and the bottom film to provide a contained space beneath the top film.
6. The method of claim 4 , wherein the bottom film includes a textured surface.
7. The method of claim 1 , comprising moving the container in response to determining that the at least one of the one or more contaminants on the film is aligned with a surface of a part being fabricated during the layer curing process.
8. An additive fabrication device, comprising:
a build platform;
a light processing unit configured to move in a first direction with respect to the additive fabrication device, the light processing unit including:
an optical scanning device,
a light source, and
a light sensor;
a container including a lower film, an upper film spaced apart from the lower film, and a skirt attached to the upper film that hangs down to provide a contained space between the upper film and lower film and to prevent contamination from entering the contained space; and
one or more processors configured to:
operate the light source to emit light;
operate the optical scanning device to direct the emitted light to a plurality of locations on the film;
operate the light sensor to detect different intensities of light reflected from the film for each of the plurality of locations on the film;
detect one or more contaminants on the film by comparing the different intensities of the reflected light from the film; and
in response to detecting the one or more contaminants on the film, calculate respective locations of the one or more contaminants on the film.
9. The additive fabrication device of claim 8 , wherein detecting the one or more contaminants on the film comprises measuring a first intensity of reflected light from a first region on the film that is lower or higher than a second intensity of reflected light from a second region on the film that is adjacent to the first region.
10. The additive fabrication device of claim 8 , wherein the lower film includes a textured surface.
11. The additive fabrication device of claim 8 , wherein the one or more processors are further configured to, in response to calculating the respective locations of the one or more contaminants on the film, jitter a position of the container relative to the build platform during a layer curing process.