Imager time and lighting heat balancing

1. An apparatus comprising:

a memory comprising (i) first parameters for an image sensor and (ii) second parameters for a light emitting device; and

a processor configured to (i) receive a first temperature signal from said image sensor, (ii) receive a second temperature signal from said light emitting device, (iii) present a first adjustment signal to said image sensor and (iv) present a second adjustment signal to said light emitting device, wherein

(a) said first parameters and said second parameters correspond to a predetermined temperature,

(b) said first adjustment signal is configured to scale said first parameters based on a difference between said first temperature signal and said predetermined temperature,

(c) said second adjustment signal is configured to scale said second parameters based on a difference between said second temperature signal and said predetermined temperature and

(d) said processor scales said first parameters and said second parameters in order to compensate for performance degradation of (i) said image sensor caused by changes in said first temperature signal and (ii) said light emitting device caused by changes in said second temperature signal.

2. The apparatus according to claim 1 , wherein said (i) said image sensor is a near infrared image sensor, (ii) said near infrared image sensor enables in cabin monitoring of a vehicle and (iii) said light emitting device comprises near infrared light emitting diodes configured to provide illumination for said near infrared image sensor.

3. The apparatus according to claim 1 , wherein said memory comprises a lookup table for said first parameters and said second parameters.

4. The apparatus according to claim 1 , wherein said processor is configured to scale said first parameters and said second parameters by extrapolating settings in response to said difference between said first temperature signal and said second temperature signal from said predetermined temperature.

5. The apparatus according to claim 1 , wherein said performance degradation of said image sensor and said light emitting device is caused by excessive heat.

6. The apparatus according to claim 1 , wherein said first parameters comprise an exposure time of said image sensor and said second parameters comprise a power setting of said light emitting device.

7. The apparatus according to claim 6 , wherein said first parameters are scaled to reduce said exposure time as said first temperature signal from said image sensor increases from said predetermined temperature and said power setting of said light emitting device is increased.

8. The apparatus according to claim 6 , wherein said second parameters are scaled to reduce said power setting as said second temperature signal from said light emitting device increases from said predetermined temperature and said exposure time of said image sensor is increased.

9. The apparatus according to claim 1 , wherein (i) said image sensor comprises a built-in temperature sensor configured to provide said first temperature signal and (ii) said processor is configured to poll said built-in temperature sensor.

10. The apparatus according to claim 1 , wherein (i) said light emitting device comprises a positive temperature coefficient (PTC) resistor, (ii) said PTC resistor is implemented having a linear resistance curve and (iii) and said processor is configured to determine said second temperature signal based on a resistance of said PTC resistor.

11. The apparatus according to claim 1 , wherein (i) said light emitting device comprises a negative temperature coefficient (NTC) resistor, (ii) said NTC resistor is implemented having a linear resistance curve and (iii) and said processor is configured to determine said second temperature signal based on a resistance of said NTC resistor.

12. The apparatus according to claim 1 , wherein said processor is configured to read said second temperature signal in response to measuring a current through diodes of said light emitting device.

13. The apparatus according to claim 12 , wherein (i) said diodes have a flat drop voltage across a wide temperature range and (ii) a voltage sensor is implemented by said light emitting device and used to determine said current through said diodes.

14. The apparatus according to claim 1 , wherein said apparatus is an electronic control unit (ECU) of a vehicle.

15. The apparatus according to claim 1 , wherein said apparatus implements an imager time and lighting heat balancing.

16. The apparatus according to claim 1 , wherein said image sensor and said light emitting device are configured to operate together to generate images of an interior of a vehicle.

17. The apparatus according to claim 16 , wherein (i) scaling said first parameters prevents said image sensor from overheating, (ii) said processor is further configured to adjust said second parameters to compensate for a degradation of said images generated caused by scaling said first parameters and (iii) said second parameters complement a functionality of said image sensor for generating said images affected by said first parameters.

18. The apparatus according to claim 16 , wherein (i) scaling said second parameters prevents said light emitting device from overheating, (ii) said processor is further configured to adjust said first parameters to compensate for a degradation of said images generated caused by scaling said second parameters and (iii) said first parameters complement a functionality of said light emitting device for generating said images affected by said first parameters.