Speaker output fault monitoring
An example method includes monitoring audio channels, determining an energy level of the audio channels, identifying a fault of one or more of the audio channels based on the energy level, and determining whether the fault is a low confidence measurement or a high confidence measurement.
1. A method comprising:
monitoring a plurality of audio channels;
determining an energy level on the plurality of audio channels;
identifying a fault of one or more of the plurality of audio channels based on the energy level;
determining whether the fault is a low confidence measurement or a high confidence measurement; and
wherein determining the energy level on the plurality of audio channels comprises determining whether a masking noise is present on the plurality of audio channels.
2. The method of claim 1 , wherein the fault comprises one or more of a short circuit or open circuit.
3. The method of claim 1 , when the fault is determined to be the low confidence measurement, determining whether a low frequency tone signal is present on one or more of the plurality of audio channels.
4. The method of claim 3 , determining the fault exists when the low frequency tone signal is not present on one or more of the plurality of audio channels.
5. The method of claim 1 , comprising
determining the masking noise is present;
determining whether the masking noise is above a threshold energy level; and
determining the fault is the high confidence measurement when the masking noise is above the threshold energy level.
6. The method of claim 1 , comprising
Determining the masking noise is present;
determining whether the masking noise is above a threshold energy level; and
determining the fault is the low confidence measurement when the masking noise is not above the threshold energy level.
7. An apparatus comprising:
a processor configured to
monitor a plurality of audio channels;
determine an energy level on the plurality of audio channels;
identify a fault of one or more of the plurality of audio channels based on the energy level;
determine whether the fault is a low confidence measurement or a high confidence measurement; and
wherein the processor determines the energy level on the plurality of audio channels by being configured to determine whether a masking noise is present on the plurality of audio channels.
8. The apparatus of claim 7 , wherein the fault comprises one or more of a short circuit or open circuit.
9. The apparatus of claim 7 , when the fault is determined to be the low confidence measurement, the processor determines whether a low frequency tone signal is present on one or more of the plurality of audio channels.
10. The apparatus of claim 9 , wherein the processor is configured to determine the fault exists when the low frequency tone signal is not present on one or more of the plurality of audio channels.
11. The apparatus of claim 7 , wherein the processor is further configured to
determine the masking noise is present;
determine whether the masking noise is above a threshold energy level; and
determine the fault is the high confidence measurement when the masking noise is above the threshold energy level.
12. The apparatus of claim 7 , wherein the processor is further configured to
determine the masking noise is present;
determine whether the masking noise is above a threshold energy level; and
determine the fault is a low confidence measurement when the masking noise is not above the threshold energy level.
13. A non-transitory computer readable storage medium configured to store instructions that when executed cause a processor to perform:
monitoring a plurality of audio channels;
determining an energy level on the plurality of audio channels;
identifying a fault of one or more of the plurality of audio channels based on the energy level;
determining whether the fault is a low confidence measurement or a high confidence measurement; and
wherein determining the energy level on the plurality of audio channels comprises determining whether a masking noise is present on the plurality of audio channels.
14. The non-transitory computer readable storage medium of claim 13 , wherein the fault comprises one or more of a short circuit or open circuit.
15. The non-transitory computer readable storage medium of claim 13 , wherein when the fault is determined to be the low confidence measurement, determining whether a low frequency tone signal is present on one or more of the plurality of audio channels.
16. The non-transitory computer readable storage medium of claim 15 , wherein the determining the fault exists when the low frequency tone signal is not present on one or more of the plurality of audio channels.
17. The non-transitory computer readable storage medium of claim 13 , wherein the processor is further configured to perform:
determining the masking noise is present;
determining whether the masking noise is above a threshold energy level; and
determining the fault is the high confidence measurement when the masking noise is above the threshold energy level.