Silicon-oxygen compound, method for preparation thereof, and related secondary battery, battery module, battery pack and apparatus
The present application discloses a silicon-oxygen compound, a method for preparation thereof, and a secondary battery, a battery module, a battery pack and an apparatus related thereto. The silicon-oxygen compound includes both manganese element and a copper element, a content of the manganese element is from 20 ppm to 500 ppm, and a mass ratio of the manganese element to the copper element is from 1 to 18.
1. A silicon-oxygen compound, the silicon-oxygen compound having a formula SiO x , in which 0<x<2, wherein the silicon-oxygen compound contains both manganese element and copper element, a content of the manganese element is from 20 ppm to 500 ppm, and a mass ratio of the manganese element to the copper element is from 1 to 18; wherein in X-ray diffraction analysis, the silicon-oxygen compound has a diffraction peak at a position where a diffraction angle 2θ is from 19° to 27°, and the diffraction peak has a full width at half maxima of from 4° to 12°.
2. The silicon-oxygen compound according to claim 1 , wherein the content of the manganese element is from 70 ppm to 400 ppm.
3. The silicon-oxygen compound according to claim 1 , wherein a content of the copper element is from 10 ppm to 100 ppm.
4. The silicon-oxygen compound according to claim 1 , wherein the mass ratio of the manganese element to the copper element is from 3.9 to 16.
5. The silicon-oxygen compound according to claim 4 , wherein the mass ratio of the manganese element to the copper element is from 3.9 to 12.1.
6. The silicon-oxygen compound according to claim 1 , wherein in X-ray diffraction analysis, the silicon-oxygen compound has a diffraction peak at a position where a diffraction angle 2θ is from 19° to 27°, and the diffraction peak has a full width at half maxima of from 5° to 10°.
7. The silicon-oxygen compound according to claim 1 , wherein in Raman spectrum analysis, the silicon-oxygen compound has scattering peaks at positions where Raman shifts are from 1300 cm −1 to 1400 cm −1 and from 1550 cm −1 to 1650 cm −1 , respectively.
8. The silicon-oxygen compound according to claim 2 , wherein in Raman spectrum analysis, the silicon-oxygen compound has scattering peaks at positions where Raman shifts are from 1300 cm −1 to 1400 cm −1 and from 1550 cm −1 to 1650 cm −1 , respectively.
9. The silicon-oxygen compound according to claim 1 , wherein the silicon-oxygen compound has an average particle size D v 50 of from 4 μm to 15 μm.
10. The silicon-oxygen compound according to claim 9 , wherein the silicon-oxygen compound has an average particle size D v 50 of from 5 μm to 10 μm.
11. The silicon-oxygen compound according to claim 1 , wherein the silicon-oxygen compound has a specific surface area of from 0.5 m 2 /g to 6 m 2 /g.
12. The silicon-oxygen compound according to claim 1 , wherein the silicon-oxygen compound has a compaction density of from 1.2 g/cm 3 to 1.7 g/cm 3 measured under a pressure of 5 tons (equivalent to 49 KN).
13. The silicon-oxygen compound according to claim 1 , wherein the silicon-oxygen compound has a coating layer on an outer surface, and the coating layer comprises one or more of a polymer, a carbon material, a metal material, and a metal compound.
14. A method for preparing a silicon-oxygen compound, comprising the following steps:
providing raw materials comprising a copper source, a manganese source, and at least one of silicon monoxide powder and a mixture of elemental silicon powder and silicon dioxide powder; and heating the raw materials in an inert atmosphere under normal pressure or reduced pressure to generate a gas; and
cooling the gas in the inert atmosphere under normal pressure or reduced pressure to deposit and thus obtain the silicon-oxygen compound from the gas;
wherein the silicon-oxygen compound has a formula SiO x , in which 0<x<2, the silicon-oxygen compound contains both manganese element and copper element, a content of the manganese element is from 20 ppm to 500 ppm, and a mass ratio of the manganese element to the copper element is from 1 to 18; wherein in X-ray diffraction analysis, the silicon-oxygen compound has a diffraction peak at a position where a diffraction angle 2θ is from 19° to 27°, and the diffraction peak has a full width at half maxima of from 4° to 12°.
15. The method according to claim 14 , wherein the deposition temperature is 850° C. or less.
16. The method according to claim 14 , wherein after the gas is deposited, the method further comprises a step of crushing the obtained deposit.
17. The method according to claim 16 , wherein after the obtained deposit is crushed, the method further comprises a step of surface coating of particles.
18. A secondary battery, comprising the silicon-oxygen compound according to claim 1 .