IP Library Granted Patent US 12,442,845
Granted Patent B2
US 12,442,845 · App. 17/592,998 · Granted Oct 14, 2025

Method of generating metadata from acquired signals for search, filtering, and machine learning inputs

Inventors: Frederick B. Kuhlman, III (Nashville, TN); Adam M. Reeves (Nashville, TN); Thomas Buida (Nashville, TN); Gary J. Waldo (Hillsboro, OR); Keith D. Rule (Beaverton, OR); James R. Bailey (Brentwood, TN); Mitchell Parsons (Franklin, TN)
Assignee: TEKTRONIX, INC.
G01R23/16G06N5/022
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Quick Facts
Patent No.
US 12,442,845
App. No.
17/592,998
Granted
Oct 14, 2025
Kind
B2
Abstract

A computing device includes a port to allow the computing device to connect to a network, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to determine that a new waveform has been added to a repository connected to the computing device, perform a set of measurements on the new waveform, attach results from the measurements to the new waveform as metadata, and store the new waveform and attached metadata to the repository. A method of managing waveform data includes determining that a new waveform has been added to a repository, performing a set of measurements on the new waveform, attaching results from the measurements to the new waveform as metadata, and storing the new waveform and attached metadata to the repository.

Claims (47)

1. A computing device, comprising:

a port to allow the computing device to connect to a network; and

one or more processors, the one or more processors configured to execute code to cause the one or more processors to:

determine that a new waveform has been added to a repository connected to the computing device;

perform a set of measurements on the new waveform, including performing one or more of: all available measurements; a user-definable set of measurements; and a defined set of measurements after performing an initial assessment, wherein performing the initial assessment comprises performing at least one of: operating a machine learning process to produce a classification; performing pattern recognition; and basing the initial assessment on one of measurement results, user-defined characteristics, and metadata attached to the new waveform;

attach results from the measurements to the new waveform as metadata, wherein the metadata further includes administrative information related to acquisition of the new waveform and the results of the set of measurements;

store the new waveform and attached metadata to the repository;

update a library of measurements and algorithms based on the set of measurements performed on the new waveform, wherein the library is configured to be dynamically updated to include new measurements and algorithms; and

crawl historical waveform data already stored in the repository and apply the updated library of measurements and algorithms such that data stored in the repository undergoes all measurements of the updated library and the data stored in the repository is searchable, thereby attaching updated metadata to the historical waveform data.

2. The computing device as claimed in claim 1 , wherein the one or more processors are further configured to execute code to cause the one or more processors to:

receive a new set of measurements across the network from a user device; and

add the new set of measurements to the repository.

3. The computing device as claimed in claim 2 , wherein the one or more processors are further configured to execute code to cause the one or more processors to:

perform the new set of measurements on existing waveforms in the repository; and

add results from the new set of measurements to metadata attached to each waveform.

4. The computing device as claimed in claim 1 , wherein the one or more processors are further configured to execute code to cause the one or more processors to:

receive signals from a user device;

perform at least one task indicated by the signals; and

provide results of the task to the user device.

5. The computing device as claimed in claim 4 , wherein the at least one task comprises one or more of searching, sorting, filtering, classifying, triggering, detecting, and predicting.

6. The computing device as claimed in claim 1 , wherein at least one of the one or more processors is configured as part of a machine learning system.

7. The computing device as claimed in claim 6 , wherein the machine learning system is configured to classify waveforms in the repository into types of waveforms.

8. The computing device as claimed in claim 6 , wherein the machine learning system is configured to provide predictions about future measurements.

9. The computing device as claimed in claim 1 , wherein the computing device is connected to one or more test and measurement devices.

10. The computing device as claimed in claim 1 , wherein the computing device comprises multiple computing devices and the one or more processors are distributed among the multiple computing devices.

11. A method of managing waveform data, comprising:

determining that a new waveform has been added to a repository;

performing a set of measurements on the new waveform, including performing one or more of: all available measurements; a user-definable set of measurements; and a defined set of measurements after performing an initial assessment, wherein performing the initial assessment comprises performing at least one of: operating a machine learning process to produce a classification; performing pattern recognition; and basing the initial assessment on one of measurement results, user-defined characteristics, and metadata attached to the new waveform;

attaching results from the measurements to the new waveform as metadata, wherein the metadata further includes administrative information related to acquisition of the waveform data and the results of the set of measurements;

storing the new waveform and attached metadata to the repository;

updating, by a computing device, a library of measurements and algorithms based on the set of measurements performed on the new waveform, wherein the library is configured to be dynamically updated to include new measurements and algorithms; and

crawling, by the computing device, historical waveform data stored in the repository to apply the updated library of measurements and algorithms such that data stored in the repository undergoes all measurements of the updated library and the data stored in the repository is searchable, thereby attaching updated metadata to the historical waveform data.

12. The method as claimed in claim 11 , further comprising:

receiving a new set of measurements from a user device; and

adding the new set of measurements to the repository.

13. The method as claimed in claim 12 , further comprising:

performing the new set of measurements on existing waveforms in the repository; and

adding results from the new set of measurements to metadata attached to each waveform.

14. The method as claimed in claim 11 , further comprising:

receiving signals from a user device;

performing at least one task indicated by the signals; and

providing results of the task to the user device.

15. The method as claimed in claim 14 , wherein the at least one task comprises one or more of searching, sorting, filtering, classifying, triggering, detecting, and predicting.

16. The method as claimed in claim 11 , further comprising using machine learning to classify waveforms in the repository into types of waveforms.

17. The method as claimed in claim 11 , further comprising using machine learning to provide predictions about future measurements on waveforms based upon the metadata.

18. The method as claimed in claim 11 , wherein a computing device is configured to perform the method and the computing device is connected to one or more test and measurement devices.

19. The method as claimed in claim 18 , wherein the computing device comprises multiple computing devices and the one or more processors are distributed among the multiple computing devices.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2024
From: INITIAL STATE TECHNOLOGIES, INC.
To: TEKTRONIX, INC
Reel/Frame 066023/0297 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 2, 2022
From: KUHLMAN, FREDERICK B., III; REEVES, ADAM M.; BUIDA, THOMAS; WALDO, GARY J.; RULE, KEITH D.; BAILEY, JAMES R.; PARSONS, MITCHELL
To: INITIAL STATE TECHNOLOGIES, INC.
Reel/Frame 061958/0247 →
Continuity (2)
Provisional Application 63147153 · Feb 8, 2021
Related Publication 20220252647A1 · Aug 11, 2022
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