IP Library Granted Patent US 11,927,517
Granted Patent B2
US 11,927,517 · App. 17/593,222 · Granted Mar 12, 2024

Resonance shear measurement device

Inventors: Kazue Kurihara (Sendai, JP); Masashi Mizukami (Sendai, JP); Motohiro Kasuya (Sendai, JP)
Assignee: TOHOKU UNIVERSITY
G01N11/16G01N3/24G01N2203/0094
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Quick Facts
Patent No.
US 11,927,517
App. No.
17/593,222
Granted
Mar 12, 2024
Kind
B2
Abstract

A resonance shear measurement device ( 1 ) of the present invention includes an upper unit ( 10 ) having a piezoelectric element ( 15 ), an upper disk substrate ( 16 ), and a spring ( 17 ), and a lower unit ( 11 ) having a lower disk substrate ( 14 ), in which a sample insertion portion ( 21 ) is formed between a lower surface of the upper disk substrate ( 16 ) and an upper surface of the lower disk substrate ( 14 ), the piezoelectric element ( 15 ) and the upper disk substrate ( 16 ) are vibratably connected to a fixed apparatus 30 via the spring ( 17 ), a strain gauge ( 19 ) is attached to the spring ( 17 ), and by applying an AC voltage to the piezoelectric element ( 15 ) while changing a frequency of the AC voltage, a response voltage at the resonance from the strain gauge ( 19 ) due to a vibration of the upper unit ( 10 ) is measured.

Claims (13)

1. A resonance shear measurement device comprising:

an upper unit having a piezoelectric element, an upper disk substrate, and a spring; and

a lower unit having a lower disk substrate,

wherein a sample insertion portion is formed between a lower surface of the upper disk substrate and an upper surface of the lower disk substrate,

the piezoelectric element and the upper disk substrate are vibratably connected to a fixed apparatus via the spring,

a strain gauge is attached to the spring, and

a response voltage at the resonance is measured from the strain gauge due to a vibration of the upper unit by applying an AC voltage to the piezoelectric element while changing a frequency of the AC voltage.

2. The resonance shear measurement device according to claim 1 , further comprising an information processing unit electrically connected to the piezoelectric element,

wherein the strain gauge is electrically connected to the information processing unit, and the information processing unit measures the response voltage at the resonance from the strain gauge due to the vibration of the upper unit by applying the AC voltage to the piezoelectric element while changing the frequency of the AC voltage.

3. The resonance shear measurement device according to claim 1 ,

wherein viscoelasticity of a sample inserted into the sample insertion portion is measured based on an amplitude of the AC voltage at the resonance and an amplitude of the response voltage at the resonance.

4. The resonance shear measurement device according to claim 3 ,

wherein the viscoelasticity of the sample inserted into the sample insertion portion is measured by a physical model analysis based on a resonance shear curve obtained from the amplitude of the AC voltage and the amplitude of the response voltage with respect to the frequency.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2026
From: NABKI, FREDERIC; DESLANDES, DOMINIC; SOER, MICHIEL; MORIN-LAPORTE, GABRIEL; TAHERZADEH-SANI, MOHAMMAD
To: SPARK MICROSYSTEMS INTERNATIONAL INC.
Reel/Frame 073960/0688 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2021
From: KURIHARA, KAZUE; MIZUKAMI, MASASHI; KASUYA, MOTOHIRO
To: TOHOKU UNIVERSITY
Reel/Frame 057462/0586 →
Continuity (1)
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