IP Library Granted Patent US 12,189,360
Granted Patent B2
US 12,189,360 · App. 17/597,309 · Granted Jan 7, 2025

Manufacturing facility diagnosis support apparatus

Inventor: Minoru Tachibana (Tokyo, JP)
Assignee: TMEIC CORPORATION
G05B19/4063G05B23/0205
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Quick Facts
Patent No.
US 12,189,360
App. No.
17/597,309
Granted
Jan 7, 2025
Kind
B2
Abstract

There is provided a manufacturing facility diagnosis support apparatus that can support efficient diagnosis of a manufacturing facility even when past operation information on the manufacturing facility is not present. The diagnosis support apparatus includes a storage unit configured to store operation information in each of processes of a manufacturing facility for processing a material and information on a position of the material in association with each other, and an extraction unit configured to extract, when a range including the position of the material is designated, operation information changed at a position corresponding to the designated range, from the operation information stored in the storage unit. According to the diagnosis support apparatus, it is possible to support efficient diagnosis of the manufacturing facility even when the past operation information on the manufacturing facility is not present.

Claims (38)

1. A manufacturing facility diagnosis support apparatus, comprising:

a storage unit configured to store operation information in each of processes of a manufacturing facility for transferring and for processing a material to be rolled, and information on a position of the material to be rolled in association with each other;

a designation unit configured to designate a range including investigation target position of the material to be rolled in a transfer direction by operation from outside; and

an extraction unit configured to extract specific operation information in a specific process of current processes of the manufacturing facility, the specific operation information corresponding to the designated range including the investigation target position of the material, the specific operation information indicating that a value of a change rate per unit time in the specific process is greater than a preset threshold from the operation information of the current processes of the manufacturing facility stored in the storage unit, without using operation information of past processes of the manufacturing facility for another material to be rolled, wherein

the operation information includes temperature of the material to be rolled,

only the specific operation information in the specific process that is upstream of the process in which abnormality has been found is extracted from the current processes of the manufacturing facility, and

the manufacturing facility diagnosis support apparatus controls transmission of the specific operation information to a terminal apparatus as detection of an abnormal event of the manufacturing facility.

2. The manufacturing facility diagnosis support apparatus according to claim 1 ,

wherein the operation information includes at least one of the temperature of the material to be rolled, load applied to the material to be rolled, or a speed of the material to be rolled, in each process of the current processes of the manufacturing facility.

3. The manufacturing facility diagnosis support apparatus according to claim 1 ,

wherein two or more processes of the current processes of the manufacturing facility is grouped as a single process to be extracted.

4. The manufacturing facility diagnosis support apparatus according to claim 1 ,

wherein the specific operation information is displayed with identification information of the material to be rolled and identification information of the specific process as detection of the abnormal event of the manufacturing facility, by a terminal apparatus.

5. A manufacturing facility diagnosis support apparatus, comprising:

a non-transitory computer readable storage device that stores operation information in each of processes of a manufacturing facility that transfer and process a material to be rolled, and information on a position of the material to be rolled in association with each other, the operation information including temperature of the material to be rolled; and

circuitry configured to

designate, a range including investigation target position of the material to be rolled in a transfer direction by an external operation,

extract specific operation information in a specific process of the current processes of the manufacturing facility, the specific operation information corresponding to the designated range including the investigation target position of the material, the specific operation information indicating that a value of a change rate per unit time in the specific process is greater than a preset threshold, from the operation information of the current processes of the manufacturing facility stored in the non-transitory computer readable storage device, without using operation information of past processes of the manufacturing facility for another material to be rolled, and

control transmission of the specific operation information to a terminal apparatus as detection of an abnormal event of the manufacturing facility,

wherein only the specific operation information in the specific process that is upstream of the process in which abnormality has been found is extracted from the current processes of the manufacturing facility.

6. The manufacturing facility diagnosis support apparatus according to claim 5 ,

wherein the operation information includes at least one of the temperature of the material to be rolled, load applied to the material to be rolled, or a speed of the material to be rolled, in each process of the current processes of the manufacturing facility.

7. The manufacturing facility diagnosis support apparatus according to claim 5 ,

wherein two or more processes of the current processes of the manufacturing facility is grouped as a single process to be extracted.

8. The manufacturing facility diagnosis support apparatus according to claim 5 ,

wherein the specific operation information is displayed with identification information of the material to be rolled and identification information of the specific process as detection of the abnormal event of the manufacturing facility, by a terminal apparatus.

9. A manufacturing facility diagnosis support method, the method comprising:

storing operation information in each of processes of a manufacturing facility for transferring and for processing a material to be rolled, and information on a position of the material to be rolled in association with each other, the operation information including being temperature of the material to be rolled;

designating a range including investigation target position of the material to be rolled in a transfer direction by operation from outside;

extracting specific operation information in a specific process of current processes of the manufacturing facility, the specific operation information corresponding to the designated range including the investigation target position of the material, the specific operation information indicating that a value of a change rate per unit time in the specific process is greater than a preset threshold, from the operation information of the current processes of the manufacturing facility, without using operation information of past processes of the manufacturing facility for another material to be rolled; and

controlling transmission of the specific operation information to a terminal apparatus as detection of an abnormal event of the manufacturing facility,

wherein only the specific operation information in the specific process that is upstream of the process in which abnormality has been found is extracted from the current processes of the manufacturing facility.

10. The manufacturing facility diagnosis support method according to claim 9 ,

wherein the operation information includes at least one of the temperature of the material to be rolled, load applied to the material to be rolled, or a speed of the material to be rolled, in each process of the current processes of the manufacturing facility.

11. The manufacturing facility diagnosis support method according to claim 9 ,

wherein two or more processes of the current processes of the manufacturing facility is grouped as a single process to be extracted.

12. The manufacturing facility diagnosis support method according to claim 9 ,

wherein the specific operation information is displayed with identification information of the material to be rolled and identification information of the specific process as detection of the abnormal event of the manufacturing facility, by a terminal apparatus.

Assignments (2)
CHANGE OF NAME Recorded Apr 26, 2024
From: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
To: TMEIC CORPORATION
Reel/Frame 067244/0359 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 3, 2022
From: TACHIBANA, MINORU
To: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
Reel/Frame 058524/0959 →
Continuity (1)
Related Publication 20220317655A1 · Oct 6, 2022
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