Occlusion sensing in ophthalmic laser probes
In certain embodiments, a system for sensing occlusions in an optical system includes a first laser source configured to generate optical signals and a set of optical elements arranged to receive the optical signals from the first laser source and to direct the optical signals along a beam path. The system also includes a detector arranged to receive reflections of the optical signals traveling along at least a portion of the beam path and a control system communicably coupled to the detector. The control system is configured to detect, based on signals generated by the detector, reflection signals associated with the reflections of the optical signals, and disable a second laser source based on detection of the reflection signals.
1. An ophthalmic surgical system for detecting occlusions in a surgical probe, comprising:
a connector configured to couple to the surgical probe comprising one or more optical elements;
a treatment laser source;
a probe laser source;
a function generator communicably coupled to the probe laser source, the function generator configured to generate a modulation signal to modulate a probe optical signal generated by the probe laser source;
a detector;
a set of optical elements configured to:
receive a treatment optical signal from the treatment laser source and direct the treatment optical signal along a first beam path toward the one or more optical elements of the surgical probe;
receive a modulated probe optical signal from the probe laser source and direct the modulated probe optical signal along a second beam path toward the one or more optical elements of the surgical probe; and
receive a reflection of the modulated probe optical signal caused by one or more of the optical elements in the surgical probe and direct the reflection of the modulated probe optical signal toward the detector; and
a control system comprising a processor and memory storing executable instructions, the control system communicably coupled to the detector;
a lock-in amplifier communicably coupled to the detector, the function generator, and the control system, the lock-in amplifier configured to extract, based on the modulation signal, electrical signals from the detector that are based on the reflected modulated probe optical signal, wherein the lock-in amplifier is further configured to provide the extracted electrical signals to the control system; and
wherein the control system executable instructions, when executed by the processor, causes the control system to:
determine a presence or an absence of an occlusion in the surgical probe based on the extracted electrical signals; and
disable the treatment laser source based on the determined presence of the occlusion.
2. The system of claim 1 , wherein the set of optical elements comprises a beam splitter arranged to transmit the modulated probe optical signal along the second beam path and to reflect the reflection of the modulated probe optical signal toward the detector.
3. The system of claim 1 , wherein the set of optical elements comprises a dichroic mirror configured to transmit the treatment optical signal and to reflect the modulated probe optical signal.
4. The system of claim 1 , wherein:
the treatment laser source is configured to generate the treatment optical signal having a wavelength between 500-600 nm (nanometers); and
the probe laser source is configured to generate the probe optical signal having a wavelength between 600-700 nm or between 800-900 nm.
5. The system of claim 1 , wherein the set of optical elements comprises a terminating optical element, and the detector is arranged to receive reflections of optical signals caused by the terminating optical element.
6. The system of claim 1 , wherein the set of optical elements is arranged to direct optical signals generated by the probe laser source toward an optical fiber, and at least one of the optical elements in the set of optical elements is configured to direct optical signals generated by the treatment laser source toward the optical fiber.
7. The system of claim 1 , wherein the probe laser source is configured to generate optical signals having a wavelength different from that of the treatment laser source.
8. The system of claim 1 , wherein the control system executable instructions, when executed by the processor, further enable the control system to:
determine a beam strength of the reflected modulated probe optical signal based on the extracted electrical signals.
9. The system of claim 8 , wherein the determined presence or absence of the occlusion is based on the determined beam strength of the reflected modulated probe optical signal.
10. The system of claim 9 , wherein the control system disables the treatment laser source based on a determination that the determined beam strength of the reflected modulated probe optical signal is above a threshold value indicating the presence of the occlusion.