IP Library Granted Patent US 11,762,106
Granted Patent B2
US 11,762,106 · App. 17/660,658 · Granted Sep 19, 2023

Scintillator array, method for manufacturing scintillator array, radiation detector, and radiation inspection device

Inventors: Hiroyasu Kondo (Yokohama, JP); Kazumitsu Morimoto (Yokohama, JP)
Assignees: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MATERIALS CO., LTD.
G01T1/20A61B6/4216C09K11/02C09K11/7771A61B6/035G01N23/046
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Quick Facts
Patent No.
US 11,762,106
App. No.
17/660,658
Granted
Sep 19, 2023
Kind
B2
Abstract

A scintillator array includes: a structure having at least one scintillator segment and a first reflective layer, the at least one scintillator segment and the first reflective layer having a first surface and a second surface, the at least one scintillator segment having a sintered compact containing a rare earth oxysulfide phosphor, and the first reflective layer being configured to reflect light; and a second reflective layer provided above the first surface via an adhesive layer, the adhesive layer having a thickness of 2 μm or more and 40 μm or less, and the second reflective layer having a film configured to reflect light.

Claims (26)

1. A scintillator array comprising:

a structure comprising at least one scintillator segment and a first reflective layer, the at least one scintillator segment and the first reflective layer having a first surface and a second surface, the at least one scintillator segment having a sintered compact containing a rare earth oxysulfide phosphor, and the first reflective layer being configured to reflect light; and

a second reflective layer provided above the first surface via an adhesive layer, the adhesive layer having a thickness of 2 μm or more and 40 μm or less, and the second reflective layer having a film configured to reflect light.

2. The scintillator array according to claim 1 , wherein

the thickness of the adhesive layer is 5 μm or more and 30 μm or less.

3. The scintillator array according to claim 1 , wherein

at least one reflective layer selected from the group consisting of the first and second reflective layers, contains:

a resin having at least one selected from the group consisting of epoxy resin, silicone resin, phenol resin, urea resin, melamine resin, polyester resin, polyurethane resin, and acrylic resin; and

reflective particles having at least one selected from the group consisting of titanium oxide, aluminum oxide, silicon oxide, barium sulfate, zinc oxide, zirconium oxide, and gadolinium oxide, the reflective particles being configured to reflect light.

4. The scintillator array according to claim 3 , wherein

the resin in the at least one reflective layer has a first mass ratio of 15% or more and 60% or less,

the reflective particles in the at least one reflective layer have a second mass ratio of 40% or more and 85% or less, and

the sum of the first mass ratio and the second mass ratio is 100%.

5. The scintillator array according to claim 1 , wherein

the adhesive layer contains at least one resin selected from the group consisting of epoxy resin, silicone resin, acrylic resin, urethane resin, polyester resin, and polyolefin resin, the at least one resin being cured by light, heat, or moisture.

6. The scintillator array according to claim 5 , wherein

the adhesive layer further contains at least one selected from the group consisting of titanium oxide, zirconium oxide, aluminum oxide, and silicon oxide.

7. The scintillator array according to claim 1 , wherein

the rare earth oxysulfide phosphor has a composition represented by

a general formula RE 2 O 2 S:Pr

where in the general formula, RE denotes at least one element selected from the group consisting of Y, Gd, La and Lu, and a content of Pr to a content of RE 2 O 2 S is 0.001 mol % or more and 10 mol % or less.

8. A radiation detector comprising the scintillator array according to claim 1 .

9. A radiation inspection device comprising the radiation detector according to claim 8 .

10. A method for manufacturing a scintillator array, comprising:

forming a structure comprising at least one scintillator segment and a first reflective layer, the at least one scintillator segment and the first reflective layer having a first surface and a second surface, the at least one scintillator segment having a sintered compact containing a rare earth oxysulfide phosphor, and the first reflective layer being configured to reflect light; and

forming a second reflective layer above the first surface via an adhesive layer having a thickness of 2 μm or more and 40 μm or less, the second reflective layer having a film configured to reflect light.

Assignments (4)
NUNC PRO TUNC ASSIGNMENT Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MATERIALS CO. LTD.
Reel/Frame 074940/0511 →
CHANGE OF NAME Recorded Feb 19, 2026
From: TOSHIBA MATERIALS CO. LTD.
To: NITERRA MATERIALS CO., LTD.
Reel/Frame 074941/0803 →
CHANGE OF ADDRESS Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 074941/0846 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2022
From: KONDO, HIROYASU; MORIMOTO, KAZUMITSU
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MATERIALS CO., LTD.
Reel/Frame 059732/0089 →
Priority Claims (1)
JP 2019-198878 · Oct 31, 2019 · national
Continuity (2)
Continuation PCTJP2020040814 · Oct 30, 2020
Related Publication 20220252739A1 · Aug 11, 2022