Differential mems device and methods

1. A sensor device comprising:

a plurality of MEMS sensors comprising a first MEMS sensor and a second MEMS sensor, wherein the first MEMS sensor is associated with a first spatial plane, wherein the second MEMS sensor is associated with a spatial second plane, wherein the first MEMS sensor is configured to provide a first set of data in response to a physical perturbation, wherein the second MEMS sensor is configured to provide a second set of data in response to the physical perturbation, wherein the first MEMS sensor is configured to provide a first reply in response to a first initialization signal, wherein the second MEMS sensor is configured to provide a second reply in response to a second initialization signal; and

a controller coupled to the plurality of MEMS sensors, wherein the controller is configured to provide the first initialization signal to the first MEMS sensor and the second initialization signal to the second MEMS sensor, wherein the controller is configured to receive the first reply at a first time, wherein the controller is configured to receive the second reply at a second time, wherein the first time and the second time need not be identical, wherein the controller is configured to determine a latency in response to the first time and the second time, wherein the controller is configured to receive the first set of data and the second set of data, and wherein the controller is configured to synchronize the first set of data and the second set of data to form motion data in response to the latency.

2. The sensor device of claim 1 wherein the first MEMS sensor is different from the second MEMS sensor, and wherein the first MEMS sensor is selected from a group consisting of: an accelerometer, a gyroscope, a magnetometer.

3. The sensor device of claim 1

wherein the first spatial plane and the second spatial plane are parallel;

wherein the first set of data and the second set of data form differential data; and

wherein the controller is configured to determine the motion data in response to the differential data and to the latency.

4. The sensor device of claim 1 wherein the first spatial plane and the second spatial plane are orthogonal.

5. The sensor device of claim 1 wherein the first MEMS sensor comprises a self-test circuit configured to perform a self-test in response to the first initialization signal.

6. The sensor device of claim 5

wherein the self-test circuit is configured to provide a self-test physical perturbation to the first MEMS sensor in response to the first initialization signal; and

wherein the first MEMS sensor is configured to provide the first reply in response to the self-test physical perturbation.

7. The sensor device of claim 1

wherein the motion data is characterized by a first noise factor;

wherein the first set of data is characterized by a second noise factor; and

wherein the first noise factor is smaller than the second noise factor.

8. A sensor device comprising:

a plurality of MEMS sensors comprising a first MEMS sensor and a second MEMS sensor, wherein the first MEMS sensor is associated with a first spatial plane, wherein the second MEMS sensor is associated with a spatial second plane, wherein the first MEMS sensor is configured to provide a first interrupt in response to a physical perturbation, wherein the first MEMS sensor is also configured to provide a first set of data in response to the physical perturbation, wherein the second MEMS sensor is configured to provide a second interrupt in response to the physical perturbation, wherein the second MEMS sensor is also configured to provide a second set of data in response to the physical perturbation; and

a controller coupled to the plurality of MEMS sensors, wherein the controller is configured to receive the first interrupt at a first time, wherein the controller is configured to receive the second interrupt at a second time, wherein the first time and the second time need not be identical, wherein the controller is configured to determine a latency between the first time and the second time, wherein the controller is configured to receive the first set of data and the second set of data, wherein the controller is configured to synchronize the first set of data to the second set of data to form motion data in response to the latency.

9. The sensor device of claim 8 wherein the plurality of MEMS sensors comprises a single type of MEMS sensor, wherein the single type of MEMS sensor is selected from a group consisting of: an accelerometer, a gyroscope, and a magnetometer.

10. The sensor device of claim 8

wherein the first spatial plane and the second spatial plane are parallel;

wherein the first set of data and the second set of data form differential data; and

wherein the controller is configured to determine the motion data in response to the differential data and to the latency.

11. The sensor device of claim 8 wherein the first spatial plane and the second spatial plane are orthogonal.

12. The sensor device of claim 8 wherein the first MEMS sensor is selected from a group consisting of: a tri-axis accelerometer and a tri-axis gyroscope.

13. The sensor device of claim 8

wherein the first MEMS sensor is operated at a first frequency;

wherein the second MEMS sensor is operated at a second frequency; and

wherein the first frequency and the second frequency are different.

14. The sensor device of claim 8

wherein the controller is configured to receive the first set of data at a third time and the second set of data at a fourth time; and

wherein the controller is configured to synchronize the first set of data to the second set of data to form the motion data in response to the third time, the fourth time and the latency.

15. A method for a sensor device comprising:

receiving, in a first MEMS sensor, a first initialization signal, and receiving, in a second MEMS sensor, a second initialization signal, wherein the first MEMS sensor is associated with a first spatial plane, wherein the second MEMS sensor is associated with a spatial second plane;

outputting, from the first MEMS sensor, a first reply in response to the first initialization signal;

outputting, from the second MEMS sensor, a second reply in response to the second initialization signal;

receiving, in a controller, the first reply at a first time;

receiving, in the controller, the second reply at a second time, wherein the first time and the second time need not be identical;

determining, in the controller, a latency between the first time and the second time;

outputting, from the first MEMS sensor, a first set of data in response to a physical perturbation;

outputting, from the second MEMS sensor, a second set of data in response to the physical perturbation;

receiving, in the controller, the first set of data at a third time;

receiving, in the controller, the second set of data at a fourth time; and

determining, in the controller, motion data comprising the first set of data synchronized to the second set of data, in response to the third time, the fourth time and to the latency.

16. The method of claim 15 wherein the first reply and the second reply are selected from a group consisting of: accelerometer data, gyroscope rotational data, and magnetic data.

17. The method of claim 15 wherein the first spatial plane and the second spatial plane are selected from a group consisting of: orthogonal planes, parallel planes.

18. The method of claim 15 further comprising: writing, with a microcontroller unit, the first initialization signal into a first register of the first MEMS sensor; and

wherein the receiving, in the first MEMS sensor, the first initialization signal comprises reading, with the first MEMS sensor, the first initialization signal from the first register.

19. The method of claim 15

wherein the first initialization signal comprises a first self-test command; and

wherein the outputting, from the first MEMS sensor, the first reply comprises outputting, from the first MEMS sensor, a self-test response in response to the first self-test command.

20. The method of claim 19 wherein the outputting, from the first MEMS sensor, the self-test response comprises:

providing, in the first MEMS sensor, a self-test physical perturbation in response to the first self-test command; and

determining, in the first MEMS sensor, the self-test response in response to the physical perturbation.