Method for surface plasmon resonance fluorescence analysis and device for surface plasmon resonance fluorescence analysis

1. A surface plasmon resonance fluorescence analysis method, comprising the steps:

applying excitation light generated by an excitation light generator to an analysis chip disposed in a chip holder and detecting fluorescence that is emitted by a fluorescence material when the fluorescence material is excited by the excitation light, the detected fluorescence indicating a presence or an amount of a detection object based on a surface plasmon resonance,

acquiring output information by applying excitation light from the excitation light irradiator to the analysis chip and by detecting reflection light, the reflection light being a part of the excitation light that is reflected by at least an incidence surface of the analysis chip, the output information being based on the reflection light and including a power of the excitation light generated by the excitation light irradiator, the analysis chip including a prism including the incidence surface and a film formation surface, a metal film disposed on the film formation surface, and a capturing body fixed on the metal film, and

determining whether the excitation light irradiator is in a normal condition in accordance with the output information,

wherein the step of determining whether the excitation light irradiator is in a normal condition includes comparing the output information of the excitation light irradiator with preliminarily acquired output information that serves as a reference of the excitation light irradiator, the preliminarily acquired output information being output information of the excitation light irradiator in an initial state.

2. The surface plasmon resonance fluorescence analysis method according to claim 1 further comprising acquiring position information of the analysis chip by applying excitation light from the excitation light irradiator to the analysis chip installed in the chip holder fixed on a conveyance stage, and by detecting the reflection light, which is the excitation light reflected by at least the incidence surface of the analysis chip.

3. The surface plasmon resonance fluorescence analysis method according to claim 2 , wherein the acquiring the output information of the excitation light irradiator and the acquiring the position information of the analysis chip are simultaneously performed by an excitation light detector using the same reflection light, and the detecting fluorescence is performed using a fluorescence detector that is separate from the excitation light detector.

4. The surface plasmon resonance fluorescence analysis method according to claim 2 further comprising:

moving the analysis chip to a measurement position by moving the chip holder by the conveyance stage based on the position information; and

applying excitation light to the analysis chip disposed at the measurement position from the excitation light irradiator to detect fluorescence emitted from the fluorescence material labelling the detection object substance captured by the capturing body.

5. The surface plasmon resonance fluorescence analysis method according to claim 1 further comprising applying excitation light to the analysis chip from the excitation light irradiator to detect fluorescence emitted from the fluorescence material labelling the detection object substance captured by the capturing body.

6. The surface plasmon resonance fluorescence analysis method according to claim 1 , further comprising the step of correcting a detection value of the fluorescence in accordance with the output information.

7. The surface plasmon resonance fluorescence analysis method according to claim 1 , wherein the step of determining whether the excitation light irradiator is in a normal condition includes determining that the excitation light irradiator is abnormal in a case where a difference between the output information of the excitation irradiator and the preliminarily acquired output information is greater than a predetermined threshold.

8. A surface plasmon resonance fluorescence analysis apparatus that detects presence or an amount of a detection object substance by detecting fluorescence that is emitted by a fluorescence material labelling the detection object substance when the fluorescence material is excited by localized light based on a surface plasmon resonance, the surface plasmon resonance fluorescence analysis apparatus comprising:

a chip holder for detachably holding an analysis chip including a prism including an incidence surface and a film formation surface, a metal film disposed on the film formation surface, and a capturing body fixed on the metal film;

an excitation light irradiator that applies excitation light to the analysis chip held by the chip holder;

an excitation light detector that detects reflection light, wherein the reflection light is a part of the excitation light reflected by at least the incidence surface of the analysis chip;

a fluorescence detector that detects fluorescence emitted from the fluorescence material labelling the detection object substance captured by the capturing body; and

a processor that acquires output information based on a detection result of the excitation light detector, the output information including a power of the excitation light generated by the excitation light irradiator, and the processor being configured to determine whether the excitation light irradiator is in a normal condition in accordance with the output information,

wherein the processor determines whether the excitation light irradiator is in a normal condition by comparing the output information of the excitation light irradiator with preliminarily acquired output information that serves as a reference of the excitation light irradiator, the preliminarily acquired output information being output information of the excitation light irradiator in an initial state.

9. The surface plasmon resonance fluorescence analysis apparatus according to claim 8 further comprising a conveyance stage that moves the chip holder,

wherein the processor further acquires position information of the analysis chip held by the chip holder based on the detection result of the excitation light detector; and

wherein the processor moves the analysis chip to a measurement position by causing the conveyance stage to move the chip holder based on the position information.

10. The surface plasmon resonance fluorescence analysis apparatus according to claim 8 ,

wherein the excitation light detector is a photodiode including a plurality of light reception surfaces; and

wherein the output information of the excitation light irradiator is information relating to a power of the excitation light irradiator and an irradiation direction of excitation light of the excitation light irradiator.

11. The surface plasmon resonance fluorescence analysis apparatus according to claim 8 ,

wherein the excitation light detector is a position detection device; and

wherein the output information of the excitation light irradiator is information relating to a power of the excitation light irradiator and an irradiation direction of the excitation light of the excitation light irradiator.

12. The surface plasmon resonance fluorescence analysis apparatus according to claim 8 , wherein the processor is configured to correct a detection value of the fluorescence in accordance with the output information.

13. The surface plasmon resonance fluorescence analysis apparatus according to claim 8 , wherein the processor determines that the excitation light irradiator is abnormal in a case where a difference between the output information of the excitation light irradiator and the preliminarily acquired output information is greater than a predetermined threshold.