IP Library Granted Patent US 12,469,690
Granted Patent B2
US 12,469,690 · App. 17/684,056 · Granted Nov 11, 2025

Desorption ion source with post-desorption ionization in transmission geometry

Inventors: Andreas Haase (Bremen, DE); Jens Höhndorf (Bremen, DE); Jens Boßmeyer (Bremen, DE)
H01J49/0463H01J49/164H01J49/24
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,469,690
App. No.
17/684,056
Granted
Nov 11, 2025
Kind
B2
Abstract

An apparatus to generate ions from sample material deposited on a substrate which is at least partially transparent to electromagnetic waves, comprises: —a support device having a holder for the substrate, —a desorption/ionization unit including a desorption device and an ionization device, said desorption device being configured to desorb deposited sample material from a desorption site on the substrate using at least one energy burst, and said ionization device being configured to irradiate the desorbed sample material above the substrate with electromagnetic waves after the at least one energy burst, wherein the electromagnetic waves pass through the substrate before encountering the desorbed sample material at a location which corresponds to the desorption site, and—an extraction device which is arranged and designed to extract ions from the desorbed sample material and transfer them into an analyzer. The invention also relates to a correspondingly arranged method.

Claims (23)

1 . An apparatus to generate ions from sample material deposited on a substrate which is at least partially transparent to electromagnetic waves, comprising:

a support device which has a holder for the substrate,

a desorption/ionization unit which contains a desorption device and an ionization device, said desorption device being arranged and designed to desorb deposited sample material from a desorption site on the substrate using at least one energy burst, and said ionization device being arranged and designed to irradiate the desorbed sample material above the substrate with a beam of electromagnetic waves after the at least one energy burst, wherein the beam of electromagnetic waves passes through the substrate before encountering the desorbed sample material at a location which corresponds to the desorption site,

an extraction device which is arranged and designed to extract ions from the desorbed sample material and transfer them into an analyzer, and further being configured to allow an unused portion of the beam of electromagnetic waves, which has passed through desorbed sample material above the substrate without interacting with molecules therein, to pass; and

a beam dump located substantially behind the extraction device and configured to catch said unused portion of the beam of electromagnetic waves which has passed the extraction device.

2 . The apparatus according to claim 1 , wherein the support device contains a chamber in which the holder for the substrate is located, and which is arranged and designed to create a conditioned environment for the substrate including the deposited sample material.

3 . The apparatus according to claim 2 , wherein the chamber is connected to a vacuum source to evacuate the environment of the deposited sample material.

4 . The apparatus according to claim 2 , wherein the chamber is connected to a gas feed device which is arranged and designed to feed an inert buffer gas, a reactive gas, a moist gas, and/or a dopant gas which is susceptible of absorbing electromagnetic waves, into the chamber.

5 . The apparatus according to claim 1 , wherein the desorption device is arranged and designed to direct an energetic beam onto the deposited sample material to trigger the at least one energy burst.

6 . The apparatus according to claim 5 , wherein the energetic beam is a laser beam to ablate the deposited sample material.

7 . The apparatus according to claim 5 , wherein the energetic beam passes through the substrate at the position which corresponds to the desorption site before encountering the deposited sample material.

8 . The apparatus according to claim 1 , wherein the ionization device contains a laser to generate coherent electromagnetic waves, a discharge lamp, or a light-emitting diode (LED).

9 . The apparatus according to claim 8 , wherein the laser operates in pulsed operation or continuous-wave operation in discontinuous mode, or the discharge lamp or LED has a flash-like or continuous emission characteristic.

10 . The apparatus according to claim 1 , wherein the ionization device is arranged and designed to irradiate the desorbed sample material with a pulsed beam of electromagnetic waves which is temporally coordinated with the at least one energy burst.

11 . The apparatus according to claim 1 , wherein the desorption device and the ionization device use a same original beam of coherent electromagnetic waves, which is conditioned to different energies for desorption/ablation and ionization.

12 . The apparatus according to claim 1 , wherein the extraction device includes at least one deflection electrode, which is arranged and designed so that extracted ions change their direction of motion at least once.

13 . A method to generate ions from sample material, comprising:

depositing the sample material on a substrate which is at least partially transparent to electromagnetic waves,

desorbing the deposited sample material from a desorption site on the substrate using at least one energy burst,

ionizing particles and/or molecules in the desorbed sample material above the substrate after the at least one energy burst by irradiating them with a beam of electromagnetic waves which pass through the substrate at a position which corresponds to the desorption site before they encounter the desorbed sample material,

extracting ions from the desorbed sample material and transferring them into an analyzer, and

catching an unused portion of the beam of electromagnetic waves, which has passed through desorbed sample material above the substrate, without interacting with molecules therein, using a beam dump located substantially behind a position where ions are extracted.

14 . The method according to claim 13 , wherein the sample material comprises a tissue section, a homogenate, or individual material deposits on the substrate.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2022
From: HAASE, ANDREAS
To: BRUKER DALTONICS GMBH & CO. KG
Reel/Frame 059156/0995 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2022
From: HÖHNDORF, JENS
To: BRUKER DALTONICS GMBH & CO. KG
Reel/Frame 059157/0380 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2022
From: BOSSMEYER, JENS
To: BRUKER DALTONICS GMBH & CO. KG
Reel/Frame 059157/0423 →
Priority Claims (1)
DE 102021105327.7 · Mar 5, 2021 · national
Continuity (1)
Related Publication 20220285142A1 · Sep 8, 2022
References Cited (28)
US 5828063A · Koester · 1998 [cited by applicant]
US 6111251A · Hillenkamp · 2000 [cited by applicant]
US 7180058B1 · Izgarian · 2007 [cited by examiner]
US 10037878B2 · Haase · 2018 [cited by applicant]
US 10236173B2 · Bossmeyer et al. · 2019 [cited by applicant]
US 20020134765A1 · Tanaka · 2002 [cited by examiner]
US 20050092916A1 · Vestal · 2005 [cited by examiner]
US 20100213367A1 · Miller · 2010 [cited by examiner]
US 20130302847A1 · Mix · 2013 [cited by applicant]
US 20200075304A1 · Vestal · 2020 [cited by examiner]
US 20210118661A1 · Corkum · 2021 [cited by examiner]
DE 69718438T2 · 2003 [cited by applicant]
DE 102010052975A1 · 2012 [cited by applicant]
DE 102015115416A1 · 2017 [cited by applicant]
DE 102016124889A1 · 2018 [cited by applicant]
DE 1020201203942A1 · 2022 [cited by applicant]
EP 1271609A2 · 2003 [cited by applicant]
WO 2003050517A1 · 2003 [cited by applicant]
WO WO2007097285A1 · 2007 [cited by examiner]
WO 2010085720A1 · 2010 [cited by applicant]
WO 2012072467A2 · 2012 [cited by applicant]
WO 2020046892A1 · 2020 [cited by applicant]
WO2007097285, machine translation (Year: 2007). [cited by examiner]
Mathieu, H.J., et al., “Use of Post-Ionisation Techniques to Complement SIMS Analysis. A Review With Practical Aspects”, High Temperature Materials and Processes, vol. 17: No. 1-2, 1998, 29-44. [cited by applicant]
Soltwisch, Jens, et al., “Mass spectrometry imaging with laser-induced postionization” (Science 348 (6231), 211-215. [cited by applicant]
Spivey, Eric C., et al., “Combining MALDI-2 and Transmission Geometry Laser Optics to Achieve High Sensitivity for Ultra-High Spatial Resolution Surface Analysis”, Journal of Mass Spectrometry, vol. 54, Issue 4, Apr. 20… [cited by applicant]
Niehaus, M., et al., “Transmission-mode MALDI-2 mass spectrometry imaging of cells and tissues at subcellular resolution”, Nature Methods vol. 16, pp. 925-931 (2019). [cited by applicant]
Elia, Efstathios A., et al., “Atmospheric pressure MALDI mass spectrometry imaging using in-line plasma induced post-ionization”, Anal. Chem. 2020, 92, 23, 15285-15290. [cited by applicant]