IP Library Granted Patent US 12,136,620
Granted Patent B2
US 12,136,620 · App. 17/690,952 · Granted Nov 5, 2024

Optical systems fabricated by printing-based assembly

Inventors: John A. Rogers (Wilmette, IL); Ralph Nuzzo (Champaign, IL); Matthew Meitl (Durham, NC); Etienne Menard (Durham, NC); Alfred Baca (Urbana, IL); Michael Motala (Champaign, IL); Jong-Hyun Ahn (Suwon, KR); Sang-Il Park (Savoy, IL); Chang-Jae Yu (Urbana, IL); Heung Cho Ko (Gwangju, KR); Mark Stoykovich (Dover, NH); Jongseung Yoon (Urbana, IL)
Assignees: The Board of Trustees of the University of Illinois; X-Celeprint Limited
H01L25/50H01L21/00H01L25/042H01L25/0753H01L25/167H01L27/1214H01L27/124H01L27/1285H01L27/1292H01L27/14627H01L27/14636H01L27/14643H01L31/02005H01L31/02008H01L31/02168H01L31/02325H01L31/02327H01L31/0288H01L31/03046H01L31/043H01L31/0525H01L31/0543H01L31/0547H01L31/0693H01L31/0725H01L31/167H01L31/1804H01L31/1824H01L31/1868H01L31/1876H01L31/1892H01L33/005H01L33/0093H01L33/06H01L33/30H01L33/483H01L33/52H01L33/54H01L33/56H01L33/58H01L33/62H01S5/021H01S5/02251H01S5/183H01S5/3013H01S5/34326H01S5/423B81C2201/0185B82Y10/00H01L29/78603H01L29/78681H01L2924/0002H01L2933/005H01L2933/0058H01L2933/0066H01L2933/0091Y02E10/52Y02E10/547Y02P70/50
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Quick Facts
Patent No.
US 12,136,620
App. No.
17/690,952
Granted
Nov 5, 2024
Kind
B2
Abstract

Provided are optical devices and systems fabricated, at least in part, via printing-based assembly and integration of device components. In specific embodiments the present invention provides light emitting systems, light collecting systems, light sensing systems and photovoltaic systems comprising printable semiconductor elements, including large area, high performance macroelectronic devices. Optical systems of the present invention comprise semiconductor elements assembled, organized and/or integrated with other device components via printing techniques that exhibit performance characteristics and functionality comparable to single crystalline semiconductor based devices fabricated using conventional high temperature processing methods. Optical systems of the present invention have device geometries and configurations, such as form factors, component densities, and component positions, accessed by printing that provide a range of useful device functionalities. Optical systems of the present invention include devices and device arrays exhibiting a range of useful physical and mechanical properties including flexibility, shapeability, conformability and stretchablity.

Claims (22)

1. A display system comprising:

a device substrate;

a plurality of semiconductor elements disposed directly on a surface of the device substrate, wherein each semiconductor element of the plurality of semiconductor elements has at least a length or a width less than or equal to 200 microns and a thickness less than or equal to 100 microns, wherein the semiconductor elements are printed onto the device substrate from a source wafer, wherein the device substrate comprises a material different from a material of the semiconductor device, and wherein the semiconductor elements comprise an array of micro-transfer-printed inorganic LEDs controlled by transistors and electrically connected with an array of electrodes, gate lines, and data lines disposed on the device substrate.

2. The display system of claim 1 , wherein each semiconductor element of the plurality of semiconductor elements has a thickness no greater than 30 microns.

3. The display system of claim 1 , wherein each semiconductor element of the plurality of semiconductor elements comprises two electrodes disposed on a common side of the semiconductor element.

4. The display system of claim 1 , wherein the device substrate is flexible, bendable, shapeable, conformable and/or stretchable.

5. The display system of claim 1 , wherein the device substrate is rigid.

6. The display system of claim 1 , wherein at least a portion of a bridge element extends from a side of each semiconductor element of the plurality of semiconductor elements.

7. The display system of claim 1 , wherein the semiconductor elements of the plurality of semiconductor elements are disposed on the device substrate with a density equal to or greater than 5 elements per millimeter.

8. The display system of claim 1 , wherein the semiconductor elements of the plurality of semiconductor elements are disposed on the device substrate with a density equal to or greater than 50 elements per millimeter.

9. The display system of claim 1 , wherein the device substrate has a fill factor less than 30%.

10. The display system of claim 1 , wherein the device substrate comprises glass, polymer, or ceramic.

11. The display system of claim 1 , wherein each semiconductor element of the plurality of semiconductor elements is micro-transfer printed to the device substrate.

12. The display system of claim 1 , wherein each semiconductor element of the plurality of semiconductor elements is a light-emitting diode.

13. The display system of claim 1 , comprising optical components, wherein each of the optical components is aligned with a semiconductor element of the plurality of semiconductor elements.

14. The display system of claim 13 , wherein each of the optical components is a polymer lens.

15. The display system of claim 1 , comprising a planarizing layer disposed on the device substrate.

16. The display system of claim 1 , wherein the device substrate comprises glass or a polymer.

17. A display system comprising:

a device substrate;

a plurality of semiconductor elements disposed directly on a surface of the device substrate, wherein each semiconductor element of the plurality of semiconductor elements has at least a length or a width less than or equal to 200 microns and a thickness less than or equal to 100 microns, wherein the semiconductor elements are printed onto the device substrate from a source wafer, and wherein the device substrate comprises a material different from a material of the semiconductor device; and

a display comprising an emission region and a non-emission region, the semiconductor elements being either in the emission region or the non-emission region.