Polarization compensation in silicon-dominant electrode cells
Systems and methods are provided for managing operation of silicon-dominant electrode cells. Polarization in a silicon-dominant cell during charge/discharge cycles may be assessed, with the polarization being assessed, at least in part, based on one or both of charge rate and discharge rate. One or more adjustments may be determined based on the assessing of polarization, and the one or more adjustments may be applied to operation of the silicon-dominant cell. The one or more adjustments configured to compensate for at least some of the effects of polarization in the silicon-dominant cell.
1. A method for managing operation of a silicon-dominant cell, the method comprising:
assessing polarization in the silicon-dominant cell during charge/discharge cycles, wherein the polarization is assessed, at least in part, based on one or both of charge rate and discharge rate;
determining one or more adjustments based on the assessing of polarization;
determining at least one of the one or more adjustments based on a state of health of the silicon-dominant cell; and
applying the one or more adjustments to operation of the silicon-dominant cell.
2. The method of claim 1 , wherein the one or more adjustments to operation of the silicon-dominant cell comprise adjusting cutoff points used during the charge/discharge cycles.
3. The method of claim 2 , further comprising adjusting one or more cutoff points during at least one charge/discharge cycle.
4. The method of claim 3 , further comprising decreasing voltage cutoff point applicable to discharge of the silicon-dominant cell during the at least one charge/discharge cycle.
5. The method of claim 3 , further comprising increasing voltage cutoff point applicable to charging of the silicon-dominant cell during the at least one charge/discharge cycle.
6. The method of claim 1 , further comprising determining the state of health based on a self-assessment performed when the silicon-dominant cell is not being used.
7. The method of claim 1 , further comprising performing a pulse test on the silicon-dominant cell, and determining the state of health based on the pulse test.
8. The method of claim 1 , further comprising determining when to apply at least one of the one or more adjustments based on polarization capacity fade.
9. The method of claim 8 , further comprising applying the at least one of the one or more adjustments when the polarization capacity fade exceeds a preset threshold.
10. A system comprising:
a silicon-dominant cell; and
one or more circuits for managing operation of the silicon-dominant cell, wherein the one or more circuits are configured to:
assess polarization in the silicon-dominant cell during charge/discharge cycles, wherein the polarization is assessed, at least in part, based on one or both of charge rate and discharge rate;
determine one or more adjustments based on the assessing of polarization;
determine at least one of the one or more adjustments based on a state of health of the silicon-dominant cell; and
apply the one or more adjustments to operation of the silicon-dominant cell.
11. The system of claim 10 , wherein the one or more adjustments to operation of the silicon-dominant cell comprise adjusting cutoff points used during the charge/discharge cycles, and wherein the one or more circuits are configured to adjust one or more cutoff points during at least one charge/discharge cycle.
12. The system of claim 11 , wherein the one or more circuits are configured to decrease voltage cutoff point applicable to discharge of the silicon-dominant cell during the at least one charge/discharge cycle.
13. The system of claim 11 , wherein the one or more circuits are configured to increase voltage cutoff point applicable to charging of the silicon-dominant cell during the at least one charge/discharge cycle.
14. The system of claim 10 , wherein the one or more circuits are configured to determine the state of health based on a self-assessment performed when the silicon-dominant cell is not being used.
15. The system of claim 10 , wherein the one or more circuits are configured to perform a pulse test on the silicon-dominant cell, and to determine the state of health based on the pulse test.
16. The system of claim 10 , wherein the one or more circuits are configured to determine when to apply at least one of the one or more adjustments based on polarization capacity fade.
17. The system of claim 16 , wherein the one or more circuits are configured to apply the at least one of the one or more adjustments when the polarization capacity fade exceeds a preset threshold.