IP Library Granted Patent US 12,298,123
Granted Patent B1
US 12,298,123 · App. 17/700,386 · Granted May 13, 2025

Optical alignment for ultra-high coplanarity of two planes

Inventors: Peter Topalian (Seattle, WA); Kavous Jorabchi (Bellevue, WA)
Assignee: Meta Platforms Technologies, LLC
G01B11/272G02B27/4205G06T7/0004G06T2207/20056G06T2207/30148
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Quick Facts
Patent No.
US 12,298,123
App. No.
17/700,386
Granted
May 13, 2025
Kind
B1
Abstract

A device for determining coplanarity of two surfaces includes an illumination system for providing first light to a first surface and providing second light to a second surface. The first surface redirects at least a portion of the first light and the second surface redirects at light a portion of the second light. The device also includes an optical detector positioned to receive an overlap of the redirected portion of the first light and the redirected portion of the second light. An image of the overlap of the redirected portion of the first light and the redirected portion of the second light indicates coplanarity of the first surface and the second surface.

Claims (29)

1. A device for determining coplanarity of two surfaces, the device comprising:

at least one light source positioned to provide first light that is non-perpendicular to a first surface and provide second light that is non-perpendicular to a second surface, wherein the second surface is distinct and separate from the first surface, the first surface redirects at least a portion of the first light via diffraction, the second surface redirects at least a portion of the second light via reflection or refraction, the first light provided to the first surface and the second light provided to the second surface are parallel to each other, and the portion of the first light redirected by the first surface and the portion of the second light redirected by the second surface are directed in respective directions that form a non-zero angle between each other; and

an optical detector positioned to receive an overlap of the redirected portion of the first light and the redirected portion of the second light, wherein an image of the overlap of the redirected portion of the first light and the redirected portion of the second light indicates coplanarity of the first surface and the second surface.

2. The device of claim 1 , wherein the first light is coherent and the second light is coherent.

3. The device of claim 1 , wherein the first light is a portion of the second light transmitted through the second surface.

4. The device of claim 1 , wherein the at least one light source includes a first laser for providing the first light, a second laser, distinct and separate from the first laser for providing the second light.

5. The device of claim 1 , wherein the first surface is on a first substrate and the second surface is on a second substrate that is distinct and separate from the first substrate.

6. The device of claim 1 , wherein the first surface includes one or more diffraction structures.

7. The device of claim 6 , wherein the one or more diffraction structures include a diffraction grating.

8. The device of claim 6 , wherein the one or more diffraction structures are located along a periphery of a first substrate.

9. The device of claim 1 , further comprising:

one or more processors; and

memory storing instructions for execution by the one or more processors, the stored instructions including instructions for analyzing an image corresponding to the overlap of the redirected portion of the first light and the redirected portion of the second light.

10. The device of claim 9 , wherein the instructions for analyzing the image include instructions for performing Fourier transform on the image.

11. A method for determining coplanarity of two surfaces, the method comprising:

providing first light that is non-perpendicular to a first surface, wherein the first surface redirects at least a portion of the first light via diffraction;

providing second light that is non-perpendicular to a second surface, wherein the second surface is distinct and separate from the first surface, and the second surface redirects at least a portion of the second light via reflection or refraction, wherein the first light and the second light define a first angle with respect to each other; and

receiving, with an optical detector, an overlap of the redirected portion of the first light and the redirected portion of the second light, wherein an image of the overlap of the redirected portion of the first light and the redirected portion of the second light indicates coplanarity of the first surface and the second surface and the redirected portion of the first light and the redirected portion of the second light define a second angle, that is greater than the first angle, with respect to each other.

12. The method of claim 11 , wherein:

the first surface includes one or more diffraction structures for redirecting the at least a portion of the first light; and

the second surface includes one or more diffraction structures for redirecting the at least a portion of the second light.

13. The device of claim 1 , wherein the at least one light source includes a first light source positioned to provide the first light and a second light source positioned to provide the second light, and the first light source and the second light source include beam delivery optics that split light generated within the at least one light source into the first light and the second light.

14. The device of claim 4 , wherein the first laser and the second laser are pumped by a common pump laser.

15. The device of claim 14 , wherein the first light and the second light are coherent to each other.

16. The device of claim 1 , wherein the at least one light source includes a first light source positioned to provide the first light and a second light source positioned to provide the second light, and the second light source is positioned on an opposite side of the first surface from the first light source.

17. A device for determining coplanarity of two surfaces, the device comprising:

a first light source positioned to provide first light that is non-perpendicular to a first surface, wherein the first surface redirects at least a portion of the first light via diffraction;

a second light source positioned to provide second light that is non-perpendicular to a second surface, wherein the second surface is distinct and separate from the first surface, the second surface redirects at least a portion of the second light via reflection or refraction, the first light provided by the first light source and the second light provided by the second light source are non-parallel to each other, and the portion of the first light redirected by the first surface and the portion of the second light redirected by the second surface are substantially parallel to each other; and

an optical detector positioned to receive an overlap of the redirected portion of the first light and the redirected portion of the second light, wherein an image of the overlap of the redirected portion of the first light and the redirected portion of the second light indicates coplanarity of the first surface and the second surface.

Assignments (3)
CHANGE OF NAME Recorded Jun 24, 2022
From: FACEBOOK TECHNOLOGIES, LLC
To: META PLATFORMS TECHNOLOGIES, LLC
Reel/Frame 060441/0744 →
CHANGE OF NAME Recorded Jun 7, 2022
From: FACEBOOK TECHNOLOGIES, LLC
To: META PLATFORMS TECHNOLOGIES, LLC
Reel/Frame 060306/0247 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2022
From: TOPALIAN, PETER; JORABCHI, KAVOUS
To: FACEBOOK TECHNOLOGIES, LLC
Reel/Frame 059578/0600 →
References Cited (4)
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Flanders D.C., et al., “A New Interferometric Alignment Technique,” Applied Physics Letters, vol. 31, No. 7, Oct. 1, 1977, 3 pages. [cited by applicant]
International Search Report and Written Opinion for International Application No. PCT/US2023/015659, mailed Jun. 13, 2023, 10 pages. [cited by applicant]