Digital backed flash refresh
A method comprising the steps of responding to expiration of a timer, transmitting a signal from the timer to circuitry; responsive to receiving the signal, retrieving by the circuitry (i) first values stored in an analog array, and (ii) second values stored in a digital non-volatile memory; performing, by the circuitry, operations comprising a comparison of the first values and the second values; analyzing, by the circuitry, results of the comparison to determine whether an error is greater than or equal to a predefined threshold; responsive to determining the error is greater than or equal to the predefined threshold, initiating, by the circuitry, operations to reprogram the analog array with the second value is described.
1. A method, comprising:
accessing a first set of data and a second set of data in response to receiving a signal from a timer;
wherein the signal is generated in response to an expiration of the timer;
the expiration of the timer configured to expire at one or more predetermined intervals;
in response to expiration of the timer, transmitting the signal to read-out circuitry to activate retrieval of the first set of data comprising one or more values stored in an analog array;
identifying an error or degradation of the one or more values stored based on a comparison of the first and the second sets of data; and
performing a reprogramming of the first set of data based on the second set of data.
2. The method of claim 1 , wherein the error is a difference between corresponding data points in the first and the second sets of data, and wherein the error is greater than or equal to a predefined threshold.
3. The method of claim 2 , wherein the predefined threshold includes a predefined threshold percentage.
4. The method of claim 3 , wherein the predefined threshold percentage is between ninety and one-hundred and ten percent of the second set of data.
5. The method of claim 2 , wherein the error is produced from a voltage drift within an analog array.
6. The method of claim 2 , wherein the error is produced from a current leakage within an analog array.
7. The method of claim 2 , wherein the reprogramming is done automatically upon a determination of a result greater than or equal to the predefined threshold.
8. The method of claim 1 , wherein the one or more predetermined intervals are selected from a set comprising: one minute, two minutes, one hour, twenty-four hours, or one week.
9. The method of claim 1 , wherein the one or more predetermined intervals are dynamically generated.
10. The method of claim 1 , wherein the signal is received by circuitry.
11. The method of claim 1 , wherein the signal is a voltage signal.
12. The method of claim 1 , wherein the signal is a logic signal.
13. The method of claim 1 , wherein the error is generated upon a determination that a data point of the first set of data does not correspond to a corresponding data point of the second set of data.
14. The method of claim 1 , wherein the analog array is configured to supply an input to a first layer of a neural network.
15. The method of claim 1 , wherein the reprogramming is performed by at least one of: a microcontroller, and a state machine.