Local metallization for semiconductor substrates using a laser beam
Local metallization of semiconductor substrates using a laser beam, and the resulting structures, e.g., micro-electronic devices, semiconductor substrates and/or solar cells, are described. For example, a solar cell includes a substrate and a plurality of semiconductor regions disposed in or above the substrate. A plurality of conductive contact structures is electrically connected to the plurality of semiconductor regions. Each conductive contact structure includes a locally deposited metal portion disposed in contact with a corresponding a semiconductor region.
1. A solar cell, comprising:
a substrate;
a plurality of semiconductor regions disposed above the substrate; and
a plurality of conductive contact structures electrically connected to the plurality of semiconductor regions, each conductive contact structure comprising a locally deposited metal structure disposed in direct physical contact with at least one of the plurality semiconductor regions, a first one of the locally deposited metal structures connected to a portion of a metal foil by a weakened structure of the metal foil, the weakened structure of the metal foil including patterning, and a second one of the locally deposited metal structures disconnected from an entirety of the metal foil.
2. The solar cell of claim 1 , wherein the plurality semiconductor regions is a plurality of N-type and P-type polycrystalline silicon regions disposed above the substrate.
3. The solar cell of claim 1 , further comprising:
an intervening layer disposed on the substrate, wherein the intervening layer includes openings exposing portions of the substrate corresponding to the plurality of conductive contact structures.
4. The solar cell of claim 3 , further comprising:
a metal foil portion disposed over at least a portion of the intervening layer.
5. The solar cell of claim 4 , wherein the metal foil portion is in contact with one of the locally deposited metal structures.
6. The solar cell of claim 5 , wherein the conductive contact structures comprise an edge feature.
7. A method of metalizing a substrate, the method comprising:
forming a plurality of semiconductor regions above the substrate;
locating a metal foil above the plurality of semiconductor regions above the substrate; and
exposing the metal foil to a laser beam to form a plurality of conductive contact structures in direct physical contact with the plurality of semiconductor regions, each having a locally deposited metal portion electrically connected to the substrate, a first one of the locally deposited metal structures connected to a portion of a metal foil by a weakened structure of the metal foil, the weakened structure of the metal foil including patterning, and a second one of the locally deposited metal structures disconnected from an entirety of the metal foil.
8. The method of claim 7 , wherein locating the metal foil over the substrate comprises locating a continuous sheet of the metal foil over the substrate.
9. The method of claim 7 , comprising patterning the plurality of conductive contact structures.
10. The method of claim 7 , further comprising:
subsequent to exposing the metal foil to the laser beam, removing at least a portion of the metal foil.
11. The method of claim 7 , further comprising:
forming an intervening layer above a substrate, the intervening layer having openings exposing portions of the substrate.
12. The solar cell of claim 4 , wherein the metal foil portion is an aluminum foil.
13. The solar cell of claim 12 , wherein the aluminum foil has a thickness of approximately 1 nm-500 μm.
14. The solar cell of claim 12 , wherein the aluminum foil includes aluminum in an amount greater than approximately 97% and silicon in an amount approximately in the range of 0-2%.
15. The solar cell of claim 12 , wherein the aluminum foil is anodized.
16. The method of claim 7 , wherein the metal foil is an aluminum foil.
17. The method of claim 16 , wherein the aluminum foil has a thickness of approximately 1 nm-500 μm.
18. The method of claim 16 , wherein the aluminum foil includes aluminum in an amount greater than approximately 97% and silicon in an amount approximately in the range of 0-2%.
19. The method of claim 16 , wherein the aluminum foil is anodized.