Granted Patent B2

US 12,578,287 · App. 17/781,232 · Granted Mar 17, 2026

Inventors: Daouda Keita Diop (Clichy, FR); Adrien Carlu (Amiens, FR); Théo Rybarczyk (Margny les Compiegne, FR)

Assignee: SAINT-GOBAIN SEKURIT FRANCE

G01N21/958G01J9/02G01M11/0228G01M11/0264G01M11/0271G01M11/0278G01N2021/9586

Abstract

Claims (48)

1 . A method for measuring an optical quality of a region of a glazing of a road or rail vehicle, said region being intended to be positioned in an optical path of an image-acquiring device, the measuring method being implemented by a measuring device comprising an emitter and a wavefront analyzer, the measuring method comprising:

emitting, with the emitter, a beam of light rays in a direction of said region;

analyzing, with the wavefront analyzer, the wavefront of the light rays transmitted by said region, the analyzing comprising:

generating a wavefront-error map,

determining, on the basis of the wavefront-error map, at least one optical-defect map, of any optical defects present in said region of the glazing,

wherein the analyzing further comprises:

dividing the beam of light rays into a plurality of beams,

generating an interferogram map, and

on the basis of the interferogram map, computing a phase difference between the wavefront of the light rays transmitted by said region of the glazing and a reference wavefront, with a view to determining a final wavefront error used to generate the wavefront-error map, and

wherein in the dividing, the wavefront of the beam of light rays transmitted by said region is made to propagate through a diffractive grid spaced apart from a wavefront sensor of the wavefront analyzer so that the beam of light rays is divided by diffraction, the diffractive grid comprising a grid and a diffractive optic contiguous to the grid.

2 . The measuring method as claimed in claim 1 , wherein the emitter and the wavefront analyzer are placed on either side of the glazing or the measuring device comprises a plane mirror placed on one side of the glazing and the emitter and wavefront analyzer are placed on the other side of the glazing; the analyzing comprising:

computing a phase difference between the wavefront of the light rays transmitted by said region of the glazing and a reference wavefront, with a view to determining a final wavefront error used to generate the wavefront-error map.

3 . The measuring method as claimed in claim 2 , further comprising:

generating a wavefront-slope map, and

on the basis of said wavefront-slope map, computing a phase difference between the wavefront of the light rays transmitted by said region of the glazing and a reference wavefront, with a view to determining a final wavefront error used to generate the wavefront-error map.

4 . The measuring method as claimed in claim 1 , wherein the measuring device comprises a plane mirror placed on one side of the glazing and wherein the emitter and the wavefront analyzer are placed on the other side of the glazing, the measuring method comprising returning said light beam.

5 . The measuring method as claimed in claim 1 , wherein the measuring device comprises a plane mirror placed on one side of the glazing and wherein the emitter and the wavefront analyzer are placed on the other side of the glazing, the analyzing comprising:

computing a phase difference between the wavefront of the light rays transmitted by said region of the glazing and a reference wavefront, with a view to determining an intermediate wavefront error;

dividing the intermediate wavefront error by two, with a view to determining a final wavefront error used to generate the wavefront-error map.

6 . The measuring method as claimed in claim 1 , wherein said optical-defect map is chosen from at least one of the maps in the following list:

an optical-aberration map,

a slope map,

an optical-power map,

a map of point spread function,

a map of modulation transfer function,

a vertical-distortion map,

a horizontal-distortion map.

7 . The measuring method as claimed in claim 1 , wherein the analyzing comprises:

selecting a useful region in the generated wavefront-error map,

decomposing said useful region by image processing into a plurality of optical-aberration maps.

8 . The measuring method as claimed in claim 7 , wherein at least one of the optical-aberration maps of the plurality of optical-aberration maps is chosen from the following list:

a focus-error map,

a map of astigmatism oriented at 0°,

a map of astigmatism oriented at 45°,

a map of X-wise coma,

a map of Y-wise coma,

a spherical-aberration map.

9 . The measuring method as claimed in claim 7 , wherein the analyzing step comprises:

comparing wavefront-error amplitudes of the plurality of optical-aberration maps, and

identifying at least one optical aberration having a wavefront-error amplitude higher than wavefront-error amplitudes of the other optical aberrations.

10 . The measuring method as claimed in claim 1 , further comprising storing said optical-defect map in a data storage device.

11 . A device for measuring the optical quality of at least one region of a glazing, comprising:

the emitter configured to emit a beam of light rays in the direction of said region, and

the wavefront analyzer configured to analyze the wavefront of the light rays transmitted by said region,

wherein the device is configured to implement the method of claim 1 .

12 . The measuring device as claimed in claim 11 , wherein the wavefront analyzer comprises a system based on four-wave interferometry.

13 . The measuring device as claimed in claim 11 , comprising a plane mirror configured to be placed on one side of the glazing and wherein the emitter and the wavefront analyzer are configured to be placed on the other side of the glazing.

14 . The measuring method as claimed in claim 1 , wherein the plurality of beams is four beams.

Assignments (2)

Priority Claims (1)

Continuity (1)

References Cited (29)