Granted Patent B2

US 12,607,575 · App. 17/855,540 · Granted Apr 21, 2026

Inventors: Mathias Kraken (Braunschweig, DE); Erik Rohkohl (Wolfenbüttel, DE); Sven Rathmann (Braunschweig, DE); Malte Schönemann (Braunschweig, DE); Alexander Tornow (Ummern, DE)

Assignee: PowerCo SE

G01N23/04G01N23/083G01N2223/04G01N2223/40H01M10/0525H01M10/0585

Abstract

Claims (39)

1 . A method for determining a placement accuracy of a plurality of electrode sheets,

wherein the electrode sheets extend on mutually parallel planes and are stacked on top of one another and form a stack of electrode sheets;

wherein the placement accuracy describes positions of the edges of all of the electrode sheets relative to one another in the stack of electrode sheets;

wherein the method is carried out using a measuring device having a two-dimensionally resolving X-ray system with at least one beam source for X-ray radiation and a detector, and

comprising at least the following steps:

a) providing the stack of electrode sheets and arranging the stack of electrode sheets in the measuring device between at least one beam source and the detector;

b) irradiating the stack of electrode sheets with the at least one beam source from a first spatial coordinate, with a beam direction extending at least transversely to the parallel planes and toward the detector, and with a beam from the beam source detecting the edges of the electrode sheets that are arranged one above the other and projecting a two-dimensional first contour of the edges of the stack of electrode sheets onto the detector;

c) irradiating the stack of electrode sheets with the at least one beam source from at least one second spatial coordinate that differs from the first spatial coordinate, the beam detecting the stacked edges of the electrode sheets and projecting a two-dimensional second contour of the edges of the stack of electrode sheets onto the detector;

d) detecting the two-dimensional first contour using the detector;

e) detecting the two-dimensional second contour using the detector; and

f) evaluating the two-dimensional first contour and the two-dimensional second contour, and determining the positions of the edges of the electrode sheets,

g) performing an assessment of the placement accuracy;

wherein a limit value for a maximum deviation of the respective contour from a desired position of an edge is specified for the stack of electrode sheets, and

wherein whichever electrode sheet is closest to the detector is assumed to produce the maximum deviation, and

wherein

the steps of providing, of irradiating the stack of electrode sheets with the at least one beam source from a first spatial coordinate, of detecting the two-dimensional first contour, of evaluating and determining, and of performing are initially carried out in order to determine the placement accuracy, and

the steps of irradiating the stack of electrode sheets with the at least one beam source from at least one second spatial coordinate and of detecting the two-dimensional second contour are carried out when it is determined in the step of performing an assessment that the limit value has been exceeded.

2 . The method as set forth in claim 1 , wherein the first spatial coordinate and the at least one second spatial coordinate differ from one another by a mutually different separation from the stack of electrode sheets, in which case the separation extends along a first direction which is transverse to the parallel planes, or by a mutually different distance from the edges, in which case the mutually different distance extends along a second direction which is parallel to the parallel planes and is transverse to the edges.

3 . The method as set forth in claim 1 , wherein, during the step of evaluating and determining, the edges of each of the electrode sheets in the two-dimensional first contour and/or the two-dimensional second contour are correlated with the respective spatial coordinates using linear equations.

4 . The method as set forth in claim 1 , wherein, when it is determined that the limit value has been exceeded, the steps of irradiating the stack of electrode sheets with the at least one beam source from at least one second spatial coordinate and of detecting the two-dimensional second contour are carried out exactly twice with mutually different spatial coordinates, whereupon the steps of evaluating and determining and of performing an assessment are carried out again.

5 . The method as set forth in claim 1 , wherein artificial intelligence is used at least for the step of evaluating and determining.

6 . The method as set forth in claim 1 , further comprising:

h) determining and altering at least one process parameter from the evaluation of the placement accuracy according to the step of performing an assessment used to produce the respective stack of electrode sheets, thereby improving the placement accuracy for further stacks of electrode sheets.

7 . The method as set forth in claim 4 , wherein, when it is repeatedly determined in the step of performing an assessment that the limit value has been exceeded, the steps of irradiating the stack of electrode sheets with the at least one beam source from at least one second spatial coordinate and of detecting the two-dimensional second contour are carried out with a number of repetitions that are required for the unambiguous determination of the positions of all edges.

8 . A method for determining a placement accuracy of a plurality of electrode sheets,

wherein the electrode sheets extend on mutually parallel planes and are stacked on top of one another and form a stack of electrode sheets;

wherein the placement accuracy describes positions of the edges of all of the electrode sheets relative to one another in the stack of electrode sheets;

wherein the method is carried out using a measuring device having a two-dimensionally resolving X-ray system with at least one beam source for X-ray radiation and a detector, and

comprising at least the following steps:

a) providing the stack of electrode sheets and arranging the stack of electrode sheets in the measuring device between the at least one beam source and the detector;

b) irradiating the stack of electrode sheets with the at least one beam source from a first spatial coordinate, with a beam direction extending at least perpendicular to the parallel planes and toward the detector, and with a beam from the beam source detecting the edges of the electrode sheets that are arranged one above the other and projecting a two-dimensional first contour of the edges of the stack of electrode sheets onto the detector;

c) irradiating the stack of electrode sheets with the at least one beam source from at least one second spatial coordinate that differs from the first spatial coordinate, the beam detecting the stacked edges of the electrode sheets and projecting a two-dimensional second contour of the edges of the stack of electrode sheets onto the detector;

d) detecting the two-dimensional first contour using the detector;

e) detecting the two-dimensional second contour using the detector; and

f) evaluating the two-dimensional first contour and the two-dimensional second contour using a convolutional neural network, and determining the positions of the edges of the electrode sheets;

wherein the convolutional neural network learns from a synthetic data set for a stack of electrode sheets with known positions of the edges of the electrode sheets in order to then determine the position of the edge of each electrode sheet from the contours of the stack of electrode sheets detected in the step of detecting the two-dimensional first contour.

9 . The method as set forth in claim 8 , wherein the first spatial coordinate and the at least one second spatial coordinate differ from one another by a mutually different separation from the stack of electrode sheets, in which case the separation extends along a first direction which is transverse to the parallel planes, or by a mutually different distance from the edges, in which case the mutually different distance extends along a second direction which is parallel to the parallel planes and is transverse to the edges.

10 . The method as set forth in claim 8 , wherein, during the step of evaluating and determining, the edges of each of the electrode sheets in the two-dimensional first contour and/or the two-dimensional second contour are correlated with the respective spatial coordinates using linear equations.

11 . The method as set forth in claim 8 , wherein artificial intelligence is used at least for the step of evaluating and determining.

Assignments (2)

Priority Claims (1)

Continuity (1)

References Cited (14)