Interleaved analog-to-digital converter (ADC) gain calibration
An integrated circuit may include a full-scale reference generation circuit that corrects for variation in the gain or full scale of a set of interleaved analog-to-digital converters (ADCs). Notably, the full-scale reference generation circuit may provide a given full-scale or reference setting for a given interleaved ADC, where the given full-scale setting corresponds to a predefined or fixed component and a variable component (which may specify a given full-scale correction for a given full scale). For example, the full-scale reference generation circuit may include a full-scale reference generator replica circuit that outputs a fixed current corresponding to the fixed component. Furthermore, the full-scale reference generation circuit may include a full-scale reference generator circuit that outputs a first voltage corresponding to the given full-scale setting based at least in part on the fixed current and a variable current that, at least in part, specifies the given full-scale correction.
1. An integrated circuit, comprising:
a set of analog-to-digital converters (ADCs) configured to provide quantized outputs corresponding to an input signal; and
a calibration engine, coupled to the set of ADCs, configured to provide full-scale reference corrections and DC offsets to the set of ADCs, wherein the calibration engine is configured to:
compute an average of the quantized outputs; and
determine, for a given ADC in the set of ADCs, a given full-scale reference correction in the full-scale reference corrections and a given DC offset in the DC offsets by comparing the average of the quantized outputs and a reference; and
wherein the calibration engine comprises:
full-scale reference generation circuits configured to generate full-scale reference voltages of full scales of each ADC in the set of ADCs, wherein the full-scale reference voltages correspond to variable components and a fixed component; and wherein the variable components correspond to the full-scale corrections of the full scales of the set of ADCs; and
a full-scale reference generator replica circuit configured to provide the fixed component, wherein the full-scale reference generator replica circuit is open-loop.
2. The integrated circuit of claim 1 , wherein the integrated circuit is configured to correct a given quantized output from the given ADC for the given DC offset.
3. The integrated circuit of claim 1 , wherein the reference comprises a quantized output of one ADC in the set of ADCs.
4. The integrated circuit of claim 1 , wherein the full-scale reference generation circuits comprise analog circuits.
5. The integrated circuit of claim 1 , wherein the full-scale reference generator replica circuit is common to or shared by the full-scale reference generation circuits.
6. The integrated circuit of claim 1 , wherein the variable components correspond to voltages or currents.
7. The integrated circuit of claim 1 , wherein the fixed component corresponds to a voltage or a current.
8. The integrated circuit of claim 1 , wherein the full-scale reference generator replica circuit and at least one of the full-scale reference generation circuits comprise matched open-loop buffers.
9. The integrated circuit of claim 1 , wherein the set of ADCs comprise: a set of interleaved ADCs, a set of interleaved pipelined ADCs or a set of interleaved successive-approximation ADCs.
10. The integrated circuit of claim 1 , wherein a given full-scale reference voltage of the given ADC corresponds to a sum of a given variable component in the variable components and the fixed component.
11. The integrated circuit of claim 1 , wherein the full-scale reference voltages are bipolar.
12. The integrated circuit of claim 11 , wherein a given full-scale reference voltage in the full-scale reference voltages comprise a first voltage and a second voltage that jointly specify the given full-scale reference voltage.
13. The integrated circuit of claim 12 , wherein the first voltage corresponds to a given full-scale correction to a given full scale of the given ADC.
14. The integrated circuit of claim 12 , wherein the second voltage is a supply voltage of the integrated circuit.
15. The integrated circuit of claim 1 , wherein the full-scale reference voltages are independently or separately generated by the full-scale reference generation circuits.
16. A system, comprising:
a set of analog-to-digital converters (ADCs) configured to provide quantized outputs corresponding to an input signal; and
a calibration engine, coupled to the set of ADCs, configured to provide full-scale reference corrections and DC offsets to the set of ADCs, wherein the calibration engine is configured to:
compute an average of the quantized outputs; and
determine, for a given ADC in the set of ADCs, a given full-scale reference correction in the full-scale reference corrections and a given DC offset in the DC offsets by comparing the average of the quantized outputs and a reference; and
wherein the calibration engine comprises:
full-scale reference generation circuits configured to generate full-scale reference voltages of full scales of each ADC in the set of ADCs, wherein the full-scale reference voltages correspond to variable components and a fixed component; and wherein the variable components correspond to the full-scale corrections of the full scales of the set of ADCs; and
a full-scale reference generator replica circuit configured to provide the fixed component, wherein the full-scale reference generator replica circuit is open-loop.
17. The system of claim 16 , wherein the full-scale reference generator replica circuit and at least one of the full-scale reference generation circuits comprise matched open-loop buffers.
18. A method for generating full-scale reference voltages, comprising:
by a system:
receiving an input signal;
providing, using a set of analog-to-digital converters (ADCs), quantized outputs corresponding to the input signal; and
providing, using a calibration engine, full-scale reference corrections and DC offsets to the set of ADCs by performing operations comprising:
computing an average of the quantized outputs;
determining, for a given ADC in the set of ADCs, a given full-scale reference correction in the full-scale reference corrections and a given DC offset in the DC offsets by comparing the average of the quantized outputs and a reference;
generating, using full-scale reference generation circuits, the full-scale reference voltages of full scales of each ADC in the set of ADCs, wherein the full-scale reference voltages correspond to variable components and a fixed component; and wherein the variable components correspond to the full-scale corrections of the full scales of the set of ADCs; and
providing, using a full-scale reference generator replica circuit, the fixed component, wherein the full-scale reference generator replica circuit is open-loop.
19. The method of claim 18 , wherein the full-scale reference generator replica circuit and at least one of the full-scale reference generation circuits comprise matched open-loop buffers.
20. The method of claim 18 , wherein the reference comprises a quantized output of one ADC in the set of ADCs.