IP Library Granted Patent US 11,774,480
Granted Patent B1
US 11,774,480 · App. 17/886,032 · Granted Oct 3, 2023

Systems, apparatuses, and methods for automated robotic tuning

Inventors: James Scott Sacks (Pleasanton, CA); Baker M. Sharif (Santa Cruz, CA); Thomas Matthew Graves (Livermore, CA); Nicholas Aaron Vong (Elk Grove, CA)
Assignee: CAES SYSTEMS LLC
G01R29/0871H04N7/183
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Quick Facts
Patent No.
US 11,774,480
App. No.
17/886,032
Granted
Oct 3, 2023
Kind
B1
Abstract

Systems, devices, and associated methods are provided for testing and tuning radiofrequency (RF) modules. An example system includes a test station including an imaging device, a measurement device, and a robotic arm. The system may include a rotary stage coupled with the robotic arm, measurement probes disposed in the rotary stage and operably coupled with the measurement device, and tuning tips disposed in the rotary stage. The system may include a galvo scanner and laser to remove conductive material. In operation, the test station may perform a testing procedure on an RF module where the measurement probes generate testing data indicative of testing parameters. The test station may perform a tuning procedure on the RF module where a tuning tip or the laser modifies the RF module based on the testing parameters. The testing and tuning may be performed by a user, semi-autonomously, or autonomously.

Claims (65)

1. A system for tuning a radiofrequency (RF) module, the system comprising:

a test station comprising:

an imaging device;

a measurement device;

a robotic arm;

a galvo scanner;

a laser;

an input device;

a rotary stage coupled with the robotic arm;

one or more measurement probes supported by the rotary stage and operably coupled with the measurement device; and

one or more tuning tips supported by the rotary stage;

wherein, in operation, the test station is configured to:

receive a first input via the input device of a location on the RF module at which to perform a testing procedure;

perform the testing procedure on an RF module received by the test station in which the one or more measurement probes generate testing data indicative of one or more testing parameters of the RF module;

receive a second input via the input device of a tuning procedure; and

perform the tuning procedure on the RF module in which:

a tuning tip of the one or more tuning tips is selected on the rotary stage; and

the RF module is modified by the selected tuning tip based on the one or more testing parameters.

2. The system according to claim 1 , wherein the test station, in performing the testing procedure, is further configured to:

utilize the robotic arm to position the one or more measurement probes at one or more locations on the RF module; and

generate testing data indicative of one or more testing parameters of the RF module at the one or more locations.

3. The system according to claim 2 , wherein the test station, in performing the tuning procedure, is configured to modify the RF module at the location with the selected tuning tip based on the testing data indicative of one or more testing parameters of the RF module at the location.

4. The system according to claim 2 , wherein the imaging device is configured to generate image data indicative of at least the location of the RF module for rendering via a display.

5. The system according to claim 1 , wherein the test station, in performing the tuning procedure, is further configured to:

compare the testing data with one or more parameter thresholds; and

modify the RF module in an instance in which the testing data fails to satisfy the one or more parameter thresholds.

6. The system according to claim 5 , wherein the test station is further configured to:

generate modified testing data indicative of one or more testing parameters of the modified RF module; and

further modify the modified RF module in an instance in which the modified testing data fails to satisfy the one or more parameter thresholds.

7. The system according to claim 6 , wherein the test station is further configured to iteratively modify the modified RF module until the modified testing data indicative of one or more testing parameters of the modified RF module satisfies the one or more parameter thresholds.

8. The system according to claim 1 , wherein the tuning procedure comprises an additive tuning procedure in which metal is deposited on the RF module.

9. The system according to claim 1 , wherein the tuning procedure comprises an additive tuning procedure in which epoxy is deposited on the RF module.

10. The system according to claim 1 , wherein the tuning procedure comprises a subtractive tuning procedure in which laser ablation removes at least a portion of the RF module.

11. A method for testing and tuning a radiofrequency (RF) module, the method comprising:

providing an RF module to a test station comprising:

an imaging device;

a measurement device;

a robotic arm;

a galvo scanner;

a laser;

an input device;

a rotary stage coupled with the robotic arm;

one or more measurement probes disposed in the rotary stage and operably coupled with the measurement device; and

one or more tuning tips disposed in the rotary stage;

receiving, at the test station, a first input via the input device of a location on the RF module at which to perform a testing procedure;

performing, by the test station, a testing procedure on the RF module received by the test station in which the one or more measurement probes generate testing data indicative of one or more testing parameters of the RF module;

receiving, at the test station, a second input via the input device of a tuning procedure; and

performing, by the test station, a tuning procedure on the RF module comprising:

selecting, on the rotary stage, a tuning tip from amongst the one or more tuning tips; and

modifying the RF module by the selected tuning tip based on the determined one or more testing parameters.

12. The method according to claim 11 , wherein performing the testing procedure further comprises:

utilizing the robotic arm to position the one or more measurement probes at one or more locations on the RF module; and

generating testing data indicative of one or more testing parameters of the RF module at the one or more locations.

13. The method according to claim 12 , wherein performing the tuning procedure further comprises modifying the RF module at the location with the selected tuning tip based on the testing data indicative of one or more testing parameters of the RF module at the location.

14. The method according to claim 12 , further comprising generating, via the imaging device, image data indicative of at least the location of the RF module for rendering via a display.

15. The method according to claim 11 , wherein performing the tuning procedure further comprises:

comparing the testing data with one or more parameter thresholds; and

modifying the RF module in an instance in which the testing data fails to satisfy the one or more parameter thresholds.

16. The method according to claim 15 , further comprising:

generating modified testing data indicative of one or more testing parameters of the modified RF module; and

further modifying the modified RF module in an instance in which the modified testing data fails to satisfy the one or more parameter thresholds.

17. The method according to claim 16 , further comprising iteratively modifying the modified RF module until the modified testing data indicative of one or more testing parameters of the modified RF module satisfies the one or more parameter thresholds.

18. The method according to claim 11 , wherein the tuning procedure comprises an additive tuning procedure comprising depositing metal on the RF module.

19. The method according to claim 11 , wherein the tuning procedure comprises an additive tuning procedure comprising depositing epoxy on the RF module.

20. The method according to claim 11 , wherein the tuning procedure comprises a subtractive tuning procedure comprising removing via laser ablation at least a portion of the RF module.

Assignments (8)
RELEASE OF SECOND LIEN SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Aug 30, 2024
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: CAES SYSTEMS LLC
Reel/Frame 068823/0106 →
RELEASE OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Aug 30, 2024
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: CAES SYSTEMS LLC
Reel/Frame 068822/0139 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 9, 2023
From: COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
To: CAES SYSTEMS HOLDINGS LLC
Reel/Frame 062316/0848 →
PATENT ASSIGNMENT AGREEMENT Recorded Jan 5, 2023
From: CAES SYSTEMS HOLDINGS LLC
To: CAES SYSTEMS LLC
Reel/Frame 062300/0217 →
SECOND LIEN US INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Jan 3, 2023
From: CAES SYSTEMS LLC
To: WILMINGTON TRUST, NATIONAL ASSOCIATION, AS SECURITY AGENT
Reel/Frame 062265/0642 →
FIRST LIEN US INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Jan 3, 2023
From: CAES SYSTEMS LLC
To: WILMINGTON TRUST, NATIONAL ASSOCIATION, AS SECURITY AGENT
Reel/Frame 062265/0632 →
PATENT ASSIGNMENT AGREEMENT Recorded Jan 1, 2023
From: COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
To: CAES SYSTEMS HOLDINGS LLC
Reel/Frame 062254/0456 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 11, 2022
From: SACKS, JAMES SCOTT; SHARIF, BAKER M.; GRAVES, THOMAS MATTHEW; VONG, NICHOLAS AARON
To: COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
Reel/Frame 060787/0251 →