Closed-loop testing of integrated circuit card payment terminals
Technologies for closed-looped testing of integrated circuit card payment terminals include loading a test profile onto an integrated circuit payment card. Authorization request and response messages are locally generated and translated to simulate acquirer processor processing and payment network processing. An outcome report indicative of the outcome of the test transaction is generated and transmitted to a remote certification server. Other embodiments are described and claimed.
1. A method for testing of an integrated circuit device terminal, the method comprising:
receiving, by a simulation server and from a merchant transaction server, a first test authorization request message for a test data transaction, the first test authorization request message corresponding to a test profile, and the first test authorization request message being formatted according to an acquirer processor messaging standard;
translating, by the simulation server, the first test authorization request message from the acquirer processor messaging standard into a second test authorization request message being formatted according to a payment network messaging standard;
generating, by the simulation server, a first test authorization response message based on the second test authorization request message and the test profile by locally applying payment logic to the second authorization request message, the first test authorization response message being formatted according to the payment network messaging standard;
translating, by the simulation server, the first test authorization response message from the payment network messaging standard into a second test authorization response message being formatted into the acquirer processor messaging standard;
transmitting, by the simulation server, the second test authorization response message to the merchant transaction server;
receiving, by the simulation server and from an integrated circuit device, test log data corresponding to the test data transaction; and
determining, by the simulation server, an outcome of the test data transaction based on at least part of the received test log data.
2. The method of claim 1 , further comprising, prior to receiving the first test authorization request message:
loading, by the simulation server, the test profile onto the integrated circuit device.
3. The method of claim 1 , wherein the merchant transaction server is the integrated circuit device terminal.
4. The method of claim 1 , further comprising:
transmitting, by the simulation server and to a certification management server, an outcome report based on the outcome of the test data transaction.
5. The method of claim 4 , wherein determining the outcome of the test data transaction comprises:
determining whether the test data transaction passed or failed by comparing one or more of a transaction amount, transaction type, and transaction vehicle characteristics of the test profile with the test log data.
6. The method of claim 5 , wherein the test log data comprises transaction data generated by the merchant transaction server based on the first test authorization request message and the second test authorization response message.
7. The method of claim 1 , wherein the integrated circuit device terminal is a point-of-sale device.
8. The method of claim 1 , wherein the test profile comprises test parameters defining the test data transaction to be processed.
9. A system for testing of an integrated circuit device terminal, the system comprising:
one or more processors; and
one or more storage devices storing instructions which, when executed by the one or more processors, cause the one or more processors to perform operations comprising:
receiving, by a simulation server and from a merchant transaction server, a first test authorization request message for a test data transaction, the first test authorization request message corresponding to a test profile, and the first test authorization request message being formatted according to an acquirer processor messaging standard;
translating, by the simulation server, the first test authorization request message from the acquirer processor messaging standard into a second test authorization request message being formatted according to a payment network messaging standard;
generating, by the simulation server, a first test authorization response message based on the second test authorization request message and the test profile by locally applying payment logic to the second authorization request message, the first test authorization response message being formatted according to the payment network messaging standard;
translating, by the simulation server, the first test authorization response message from the payment network messaging standard into a second test authorization response message being formatted into the acquirer processor messaging standard;
transmitting, by the simulation server, the second test authorization response message to the merchant transaction server;
receiving, by the simulation server and from an integrated circuit device, test log data corresponding to the test data transaction; and
determining, by the simulation server, an outcome of the test data transaction based on at least part of the received test log data.
10. The system of claim 9 , the operations further comprising, prior to receiving the first test authorization request message:
loading, by the simulation server, the test profile onto the integrated circuit device.
11. The system of claim 9 , wherein the merchant transaction server is the integrated circuit device terminal.
12. The system of claim 9 , further comprising:
transmitting, by the simulation server and to a certification management server, an outcome report based on the outcome of the test data transaction.
13. The system of claim 12 , wherein determining the outcome of the test data transaction comprises:
determining whether the test data transaction passed or failed by comparing one or more of a transaction amount, transaction type, and transaction vehicle characteristics of the test profile with the test log data.
14. The system of claim 13 , wherein the test log data comprises transaction data generated by the merchant transaction server based on the first test authorization request message and the second test authorization response message.
15. The system of claim 9 , wherein the integrated circuit device terminal is a point-of-sale device.
16. One or more non-transitory computer readable media for testing of an integrated circuit device terminal, the one or more non-transitory computer readable media storing instructions which, when executed by one or more processors, cause the one or more processors to perform operations comprising:
receiving, by a simulation server and from a merchant transaction server, a first test authorization request message for a test data transaction, the first test authorization request message corresponding to a test profile, and the first test authorization request message being formatted according to an acquirer processor messaging standard;
translating, by the simulation server, the first test authorization request message from the acquirer processor messaging standard into a second test authorization request message being formatted according to a payment network messaging standard;
generating, by the simulation server, a first test authorization response message based on the second test authorization request message and the test profile by locally applying payment logic to the second authorization request message, the first test authorization response message being formatted according to the payment network messaging standard;
translating, by the simulation server, the first test authorization response message from the payment network messaging standard into a second test authorization response message being formatted into the acquirer processor messaging standard;
transmitting, by the simulation server, the second test authorization response message to the merchant transaction server;
receiving, by the simulation server and from an integrated circuit device, test log data corresponding to the test data transaction; and
determining, by the simulation server, an outcome of the test data transaction based on at least part of the received test log data.