PULSE METRIC MEASUREMENT BASED ON SIGNAL DECAY
A system includes an electronic circuit configured to provide a detected waveform including a first detected waveform portion corresponding to a first output light pulse triggered at a first trigger time and a second detected waveform portion corresponding to a second output light pulse triggered at a second trigger time. The system further includes one or more processors configured to determine a pulse metric associated with the second output light pulse including by being configured to determine a difference between a measured level on the second detected waveform portion and a modeled reference level determined based on a signal decay model and a measured pulse period.
1 . A system, comprising:
an electronic circuit configured to provide a detected waveform including a first detected waveform portion corresponding to a first output light pulse triggered at a first trigger time and a second detected waveform portion corresponding to a second output light pulse triggered at a second trigger time; and
one or more processors configured to determine a pulse metric associated with the second output light pulse including by being configured to determine a difference between a measured level on the second detected waveform portion and a modeled reference level determined based on a signal decay model and a measured pulse period.
2 . The system of claim 1 , wherein the pulse metric is associated with pulse energy.
3 . The system of claim 1 , wherein the electronic circuit is configured to provide the detected waveform including by being configured to integrate a pulsed signal associated with the first output light pulse and the second output light pulse.
4 . The system of claim 1 , wherein the electronic circuit is configured to provide the detected waveform including by being configured to apply one or more filters to an integrated pulsed signal.
5 . The system of claim 4 , wherein the one or more filters includes a low-pass filter.
6 . The system of claim 1 , wherein the electronic circuit is configured to provide the detected waveform including by being configured to amplify an integrated and filtered pulsed signal.
7 . The system of claim 1 , wherein the first detected waveform portion and the second detected waveform portion are periodic components of the detected waveform.
8 . The system of claim 1 , wherein the first output light pulse and the second output light pulse are generated by a light source of a lidar system.
9 . The system of claim 1 , wherein the one or more processors are configured to determine the measured level on the second detected waveform portion including by being configured to receive a sampled value of the detected waveform associated with the second trigger time.
10 . The system of claim 1 , wherein the measured level on the second detected waveform portion is associated with a peak of the second detected waveform portion.
11 . The system of claim 1 , wherein the one or more processors are configured to determine the modeled reference level including by being configured to map the measured pulse period to a signal decay value.
12 . The system of claim 11 , wherein the signal decay value is an output of a lookup table representing the signal decay model.
13 . The system of claim 11 , wherein the one or more processors are further configured to determine the modeled reference level including by being configured to receive a sampled value of the detected waveform associated with the first trigger time.
14 . The system of claim 13 , wherein the sampled value of the detected waveform associated with the first trigger time is associated with a peak of the first detected waveform portion.
15 . The system of claim 13 , wherein the one or more processors are further configured to determine the modeled reference level including by being configured to multiply the signal is decay value with the received sampled value.
16 . The system of claim 1 , wherein the measured pulse period corresponds to a time difference between the first trigger time and the second trigger time.
17 . The system of claim 1 , wherein the one or more processors are further configured to calibrate the signal decay model.
18 . The system of claim 1 , wherein the one or more processors are configured to determine the measured level on the second detected waveform portion including by being configured to receive a value of the detected waveform that has been sampled a specified delay after the second trigger time.
19 . A method, comprising:
configuring an electronic circuit to provide a detected waveform including a first detected waveform portion corresponding to a first output light pulse triggered at a first trigger time and a second detected waveform portion corresponding to a second output light pulse triggered at a second trigger time; and
configuring one or more processors to determine a pulse metric associated with the second output light pulse including by configuring the one or more processors to determine a difference between a measured level on the second detected waveform portion and a modeled reference level determined based on a signal decay model and a measured pulse period.
20 . A computer program product embodied in a non-transitory computer readable medium and comprising computer instructions for:
causing an electronic circuit to provide a detected waveform including a first detected waveform portion corresponding to a first output light pulse triggered at a first trigger time and a second detected waveform portion corresponding to a second output light pulse triggered at a second trigger time; and
determining a pulse metric associated with the second output light pulse including by determining a difference between a measured level on the second detected waveform portion and is a modeled reference level determined based on a signal decay model and a measured pulse period.