IP Library Granted Patent US 12,298,642
Granted Patent B2
US 12,298,642 · App. 17/937,282 · Granted May 13, 2025

Pinhole mitigation for optical devices

Inventors: Robin Sean Friedman (Redwood City, CA); Sridhar Karthik Kailasam (Fremont, CA); Rao P. Mulpuri (Saratoga, CA); Ronald M. Parker (Olive Branch, MS); Ronald A. Powell (Portola Valley, CA); Anshu Ajit Pradhan (Collierville, TN); Robert Tad Rozbicki (Saratoga, CA); Vinod Khosla (Portola Valley, CA)
Assignee: VIEW OPERATING CORPORATION
G02F1/1524B01J19/121C03C23/0025G01M11/0207G01R31/08G02F1/0147G02F1/1309G09G3/006B05D3/12G02F1/15G02F1/15165G02F1/153G02F1/1533G02F1/163G02F2201/508Y10T156/10
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Quick Facts
Patent No.
US 12,298,642
App. No.
17/937,282
Granted
May 13, 2025
Kind
B2
Abstract

Methods, apparatus, and systems for mitigating pinhole defects in optical devices such as electrochromic windows. One method mitigates a pinhole defect in an electrochromic device by identifying the site of the pinhole defect and obscuring the pinhole to make it less visually discernible. In some cases, the pinhole defect may be the result of mitigating a short-related defect.

Claims (26)

1. A method of visually obscuring a non-tinting area within a viewable area of an electrochromic window comprising an electrochromic device on a transparent substrate, the method comprising:

identifying the non-tinting area, said non-tinting area having a higher light transmittance than areas of the electrochromic device in a tinted state; and

applying laser energy proximal the non-tinting area to change properties locally to lower light transmittance and/or increase light scattering at the non-tinting area.

2. The method of claim 1 , wherein the non-tinting area comprises an electrical short or a pinhole.

3. The method of claim 1 , wherein identifying the non-tinting area comprises identifying coordinates of a short-related defect, mitigating the short-related defect via laser circumscription to form a pinhole, and identifying the non-tinting area of the pinhole based on the coordinates of the short-related defect.

4. The method of claim 1 , wherein applying laser energy to the non-tinting area comprises melting material of the electrochromic device locally to form small beads or an uneven surfaces that scatters or diffuses light passing through the non-tinting area.

5. The method of claim 1 , wherein applying laser energy to the non-tinting area comprises altering chemistry of material of the electrochromic device in the non-tinting area to be different from the chemistry of bulk of the electrochromic device such that the electrochromic device in the non-tinting area has lower light transmittance than the bulk of the electrochromic device in a bleached state.

6. The method of claim 1 , wherein the non-tinting area is a site of a visible defect.

7. The method of claim 1 , wherein applying laser energy to the non-tinting area comprises changing light transmittance of the transparent substrate by melting, ablating or otherwise changing morphology of the transparent substrate.

8. The method of claim 1 , wherein the electrochromic window comprises a laminate and the laser energy is applied to an adhesive of the laminate to change transmittance of the adhesive proximal the non-tinting area.

9. An electrochromic window comprising:

an electrochromic device coating on a transparent substrate;

a non-tinting area in a viewable area of the electrochromic window, the non-tinting area configured for blocking or at least modifying light passing through the non-tinting area during operation.

10. The electrochromic window of claim 9 , wherein the non-tinting area comprises an electrical short or a pinhole.

11. The electrochromic window of claim 9 , wherein at least a portion of the non-tinting area is where material of the electrochromic device coating has been melted locally with laser energy to form small beads or an uneven surface that scatters or diffuses light passing through the non-tinting area.

12. The electrochromic window of claim 9 , wherein at least a portion of the non-tinting area is where laser energy has been applied to material of the electrochromic device coating altering chemistry of the material to be different from chemistry of a bulk of the electrochromic device coating such that the electrochromic device coating in the non-tinting area has lower light transmittance than the bulk of the electrochromic device coating in a bleached state.

13. The electrochromic window of claim 9 , wherein the non-tinting areas is a site of a visible defect.

14. The electrochromic window of claim 9 , wherein at least a portion of the non-tinting area is where laser energy has been applied changing light transmittance of the transparent substrate by melting, ablating or otherwise changing morphology of the transparent substrate.

15. An electrochromic lite of a window, the electrochromic lite comprising:

an electrochromic device coating disposed on a transparent substrate, the electrochromic device coating comprising an electrochromic device stack; and

a non-active device area in the electrochromic device stack within a viewable area of the electrochromic lite, the non-active device area configured to block or at least modify light passing through the non-active device area during operation, wherein the non-active device area is where:

(i) material of the electrochromic device stack has been melted locally with a laser to form small beads or an uneven surface that scatters or diffuses light passing through the non-active device area, or

(ii) laser energy has been applied to material of the electrochromic device stack to alter the chemistry of the electrochromic device stack material in the non-active device area to be different from the chemistry of bulk of the electrochromic device coating such that the electrochromic device stack material in the non-active device area has lower light transmittance than the bulk of the electrochromic device coating in a bleached state.

16. The electrochromic lite of claim 15 , incorporated into an insulated glass unit or into a laminate.

17. The method of claim 3 , wherein the pinhole has dimensions of between about 25 micrometers and about 300 micrometers.

18. The method of claim 3 , wherein the pinhole has dimensions of between 50 micrometers and about 150 micrometers.

Assignments (3)
MERGER AND CHANGE OF NAME Recorded Dec 19, 2024
From: VIEW, INC.; PVMS MERGER SUB, INC.; VIEW OPERATING CORPORATION
To: VIEW OPERATING CORPORATION
Reel/Frame 069743/0586 →
SECURITY INTEREST Recorded Oct 17, 2023
From: VIEW, INC.
To: CANTOR FITZGERALD SECURITIES
Reel/Frame 065266/0810 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2023
From: FRIEDMAN, ROBIN; KAILASAM, SRIDHAR K.; MULPURI, RAO; PARKER, RONALD M.; POWELL, RONALD A.; PRADHAN, ANSHU A.; ROZBICKI, ROBERT T.; KHOSLA, VINOD
To: VIEW, INC.
Reel/Frame 063008/0120 →
Continuity (5)
Continuation 16443585 · Jun 17, 2019
Continuation 15252099 · Aug 30, 2016
Continuation 14384146
Provisional Application 61610241 · Mar 13, 2012
Related Publication 20230144015A1 · May 11, 2023
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