DEFLECTOMETRY DEVICE FOR DIFFERENTIAL METROLOGY OF MATERIAL REMOVAL
A deflectometry device comprising a kinematic spot part holder, a display, an imaging optic, a stop, and a camera imaging assembly including a camera lens and a camera having a detector. Additionally is described, a deflectometry device that is part of a deterministic finishing machine comprising a display, an imaging optic, a stop, and a camera imaging assembly including a camera lens and a camera. Additionally, a method for characterizing material removal created by a deterministic finishing machine is provided.
1 . A method for characterizing material removal created by a deterministic finishing machine comprising (i) taking initial measurements of a spot part surface, (ii) removing material from the spot part surface with the deterministic finishing machine, (iii) taking subsequent measurements of the spot part surface after removing material, and (iv) determining depth and spatial qualities of the removed material based on the change between the initial measurements and the subsequent measurements;
wherein the initial measurements and the subsequent measurements of the spot part surface are obtained with a deflectometry device, the deflectometry device comprising a display, an imaging optic, a kinematic part holder, a stop, and a camera imaging assembly including a camera lens and a camera.
2 . The method of claim 1 , wherein the steps of taking the initial measurements and the subsequent measurements of the spot part surface obtained with the deflectometry device include emitting light in the form of a spatially varying intensity pattern from the display that is refracted or reflected by the imaging optic, followed by reflection of the light off the spot part surface, followed by redirecting the reflected light back to the imaging optic, where the light is either reflected or refracted by the imaging optic, followed by forming an image of the light from the display at the stop which geometrically controls the light admitted to the camera lens that was reflected by the spot part surface, followed by refracting the admitted light by the camera lens on to the camera detector where it is focused; and wherein the display and camera are synchronized so that programmed changes in the intensity variation are simultaneously captured by the camera, and acquired images then undergo data analysis by a data analyzer to reconstruct a topographical map of the test surface for each of the initial and subsequent measurements.
3 . The method of claim 1 , wherein step (iv) determining depth and spatial qualities of the removed material based on the change between the initial measurements and the subsequent measurements includes determining changes in the surface topography of the spot part surface between the initial measurements and the subsequent measurements, by way of differential metrology, to produce a spot map.
4 . The method of claim 1 , wherein the deterministic finishing machine comprises an MRF machine.
5 . The method of claim 1 , wherein the display comprises a micro-OLED display.
6 . The method of claim 1 , wherein the imaging optic comprises an imaging lens which is optimized for a plano spot part surface.
7 . The method of claim 1 , wherein the imaging optic comprises an achromatic doublet collimating lens.
8 . The method of claim 1 , wherein the imaging optic comprises an imaging lens which is optimized for a non-plano spot part surface.
9 . The method of claim 1 , wherein the imaging optic comprises an imaging mirror which is optimized for measuring a plano spot part surface.
10 . The method of claim 1 , wherein the imaging optic comprises an imaging mirror which is optimized for a non-plano spot part surface.
11 . The method of claim 1 , wherein the steps of taking the initial measurements and the subsequent measurements of the spot part surface obtained with the deflectometry device further include actively controlling the temperature of the camera.
12 . The method of claim 11 , wherein the step of actively controlling the temperature of the camera includes cooling the camera of the camera imaging assembly.
13 . A deflectometry device comprising a kinematic spot part holder, a display, an imaging optic, a stop, and a camera imaging assembly including a camera lens and a camera having a detector; wherein
the kinematic spot part holder is configured to hold and position a spot part surface to be measured;
the imaging optic is designed based on the geometry of the spot part surface prescription;
the display is positioned proximate the imaging optic which is positioned proximate the kinematic spot part holder, and the display and imaging optic are configured for directing the display light towards the spot part surface to be measured when a spot part surface is positioned in the kinematic spot part holder, and for redirecting reflected display light from the spot part surface back to the imaging optic where the light is then directed to the stop;
the stop is positioned proximate the camera imaging assembly and geometrically controls the light reflected by the spot part surface that is admitted to the camera lens, the admitted light is then refracted by the camera lens and focused onto the camera detector; and
a data analyzer which is capable of estimating the shape of the spot part surface.
14 . The device of claim 13 , wherein the imaging optic comprises an imaging lens which is optimized for a plano spot part surface.
15 . The device of claim 13 , wherein the imaging optic comprises an achromatic doublet collimating lens.
16 . The device of claim 13 , wherein the imaging optic comprises an imaging lens which is optimized for a non-plano spot part surface.
17 . The device of claim 13 , wherein the imaging optic comprises an imaging mirror which is optimized for measuring a plano spot part surface.
18 . The device of claim 13 , wherein the imaging optic comprises an imaging mirror which is optimized for a non-plano spot part surface.
19 . The device of claim 13 , further comprising means for controlling the temperature of the camera.
20 . The device of claim 13 , wherein the device is used with a deterministic finishing machine.
21 . The device of claim 20 , wherein the deterministic finishing device comprises an MRF machine.
22 . A deflectometry device that is part of a deterministic finishing machine comprising a display, an imaging optic, a stop, and a camera imaging assembly including a camera lens and a camera; wherein
the imaging optic is designed based on the geometry of the test part surface prescription;
the display is positioned proximate the imaging optic which is positioned proximate the test part surface, which is held by the deterministic finishing machine during the test part surface measurement, and the display and imaging optic are configured for directing the display light towards the test part surface when the test part is held by the deterministic finishing machine in the measurement position, and for redirecting reflected display light from the test part surface back to the imaging optic where the light is then directed to the stop;
the stop is positioned proximate the camera imaging assembly and geometrically controls the light reflected by the test part surface that is admitted to the camera lens, the admitted light is then refracted by the camera lens and focused onto the camera detector; and
a data analyzer which is used to estimate the shape of the test part surface from the camera images; the deterministic finishing machine has means for holding a spot part surface to be measured in an accurate position, which negates the need for a separate kinematic part holder.
23 . The device of claim 22 , wherein the device is used to assess material removal generated by a MRF machine.
24 . The device of claim 22 , wherein the display comprises a micro-OLED display.
25 . The device of claim 22 , wherein the imaging optic comprises an imaging lens which is optimized for a plano test part surface.
26 . The device of claim 22 , wherein the imaging optic comprises an achromatic doublet collimating lens.
27 . The device of claim 22 , wherein the imaging optic comprises an imaging lens which is optimized for a non-plano test part surface.
28 . The device of claim 22 , wherein the imaging optic comprises an imaging mirror which is optimized for measuring a plano test part surface.
29 . The device of claim 22 , wherein the imaging optic comprises an imaging mirror which is optimized for a non-plano test part surface.
30 . The device of claim 22 , further comprising means to control the temperature of the camera.