IP Library Granted Patent US 12,431,478
Granted Patent B2
US 12,431,478 · App. 17/947,327 · Granted Sep 30, 2025

Hybrid CMOS micro-LED display layout

Inventors: Toni Lopez (Vaals, NL); Florent Monestier (Aachen, DE)
Assignee: LUMILEDS SINGAPORE PTE. LTD.
H01L25/167H01L25/0753H10H20/857
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,431,478
App. No.
17/947,327
Granted
Sep 30, 2025
Kind
B2
Abstract

Described is a CMOS power plane including interleaving contact areas, alternating V led and V cat contact areas, on at least two long sides of the μLED display area. By this way, V led and cathode current are injected uniformly along the four sides of the μLED display panel. A large cathode current distribution ring on V led and V cat circuits is used to distribute the current along the four sides of the panel. The current distribution ring surrounds a pixel die area. An insulated area may be included on the cathode current redistribution ring adjacent one of the of μbumps.

Claims (24)

1. A CMOS power plane comprising:

a cathode redistribution ring having an inner portion and an outer portion, the inner portion surrounding a perimeter of a die pixel area, the outer portion comprising an common supply voltage V led interleaved with a cathode current distribution area along a first side, a second side, a third side, and a fourth side of the CMOS power plane; and

a plurality of cathode μbumps contacting the inner portion of the cathode redistribution ring along the perimeter of the die pixel area.

2. The CMOS power plane of claim 1 , wherein there are at least three common supply voltage Vied interleaved with at least three cathode current distribution areas.

3. The CMOS power plane of claim 1 , further comprising an insulated area on the cathode redistribution ring adjacent one of the plurality of cathode μbumps, wherein the insulated area comprises etched lines.

4. The CMOS power plane of claim 1 , further comprising an insulated area on the cathode redistribution ring adjacent one of the plurality of cathode ubumps, wherein the insulated area comprises a dielectric material.

5. The CMOS power plane of claim 1 , further comprising a plurality of PMOS transistors connected to the die pixel area.

6. The CMOS power plane of claim 1 , wherein the plurality of cathode ubumps are electrically connected to a common cathode grid.

7. The CMOS power plane of claim 1 , wherein the die pixel area comprises a plurality of pixels.

8. The CMOS power plane of claim 1 , further comprising an insulated area on the cathode redistribution ring adjacent one of the plurality of cathode μbumps, wherein the insulated area has a size of greater than 80 μm.

9. The CMOS power plane of claim 1 , further comprising an insulated area on the cathode redistribution ring adjacent one of the plurality of cathode μbumps, wherein the insulated area is at least 10 μm away from one of the plurality of cathode μbumps.

10. The CMOS power plane of claim 1 , wherein there are eight common supply voltage V led interleaved with ten cathode current distribution areas.

11. A CMOS layout comprising:

a power plane on a substrate, the power plane having a plurality of alternating V led contact areas and cathode contact areas dispersed along a first side, a second side, a third side, and a fourth side of the power plane;

a cathode current redistribution ring extending along the first side, the second side, the third side, and the fourth side of the power plane;

a plurality of cathode μbumps connecting each of the plurality of alternating Vled contact areas and cathode contact areas to a corresponding p contact of a plurality of pixels; and

a common cathode grid electrically connecting the plurality of pixels and the plurality of cathode μbumps.

12. The CMOS layout of claim 11 , wherein there are at least three V led contact areas alternating with at least three cathode contact areas.

13. The CMOS layout of claim 11 , further comprising an insulated area on the cathode current redistribution ring adjacent one of the plurality of cathode μbumps, wherein the insulated area comprises etched lines.

14. The CMOS layout of claim 11 , further comprising a plurality of PMOS transistors connected in parallel to at least one of a plurality of pixels.

15. The CMOS layout of claim 11 , further comprising an insulated area on the cathode current redistribution ring adjacent one of the plurality of cathode μbumps, wherein the insulated area has a size of greater than 80 μm.

16. The CMOS layout of claim 11 , further comprising an insulated area on the cathode current redistribution ring adjacent one of the plurality of cathode ubumps, wherein the insulated area is at least 10 μm away from one of the plurality of cathode ubumps.

17. The CMOS layout of claim 11 , further comprising an insulated area on the cathode current redistribution ring adjacent one of the plurality of cathode μbumps, wherein the insulated area comprises a dielectric material.

18. The CMOS layout of claim 11 , wherein the alternating V led contact areas and cathode contact areas are uniformly dispersed along the first side, the second side, the third side, and the fourth side of the power plane.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 10, 2025
From: LUMILEDS LLC
To: LUMILEDS SINGAPORE PTE. LTD.
Reel/Frame 071888/0086 →
RELEASE OF SECURITY INTEREST Recorded Jan 29, 2025
From: SOUND POINT AGENCY LLC
To: LUMILEDS LLC; LUMILEDS HOLDING B.V.
Reel/Frame 070046/0001 →
SECURITY INTEREST Recorded Jan 5, 2023
From: LUMILEDS LLC; LUMILEDS HOLDING B.V.
To: SOUND POINT AGENCY LLC
Reel/Frame 062299/0338 →
PATENT SECURITY AGREEMENT Recorded Dec 9, 2022
From: LUMILEDS, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 062114/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2022
From: LOPEZ, TONI; MONESTIER, FLORENT
To: LUMILEDS LLC
Reel/Frame 061313/0972 →
Continuity (2)
Provisional Application 63249785 · Sep 29, 2021
Related Publication 20230101822A1 · Mar 30, 2023
References Cited (162)
US 6410942B1 · Thibeault et al. · 2002 [cited by applicant]
US 6657236B1 · Thibeault et al. · 2003 [cited by applicant]
US 6821804B2 · Thibeault et al. · 2004 [cited by applicant]
US 8222811B2 · Vaufrey et al. · 2012 [cited by applicant]
US 8258044B2 · Brun et al. · 2012 [cited by applicant]
US 8487340B2 · Gilet et al. · 2013 [cited by applicant]
US 8638032B2 · Maindron et al. · 2014 [cited by applicant]
US 8647957B2 · Borowik et al. · 2014 [cited by applicant]
US 8697548B2 · Borowik et al. · 2014 [cited by applicant]
US 8698396B2 · Maindron et al. · 2014 [cited by applicant]
US 8890111B2 · Templier et al. · 2014 [cited by applicant]
US 9093607B2 · Gilet et al. · 2015 [cited by applicant]
US 9109296B2 · Metaye et al. · 2015 [cited by applicant]
US 9112112B2 · Do et al. · 2015 [cited by applicant]
US 9192290B2 · Spinnler et al. · 2015 [cited by applicant]
US 9209366B2 · Maindron et al. · 2015 [cited by applicant]
US 9263633B2 · Gilet et al. · 2016 [cited by applicant]
US 9396970B2 · Gillot et al. · 2016 [cited by applicant]
US 9422628B2 · Simonato et al. · 2016 [cited by applicant]
US 9496465B2 · Sugimoto et al. · 2016 [cited by applicant]
US 9507204B2 · Pelka et al. · 2016 [cited by applicant]
US 9601542B2 · Robin et al. · 2017 [cited by applicant]
US 9722160B2 · Nakabayashi · 2017 [cited by applicant]
US 9768350B2 · Bavencove et al. · 2017 [cited by applicant]
US 9887184B2 · Takeya et al. · 2018 [cited by applicant]
US 9945526B2 · Singer et al. · 2018 [cited by applicant]
US 9978727B2 · Takeya et al. · 2018 [cited by applicant]
US 9997688B2 · Takeya et al. · 2018 [cited by applicant]
US 10002928B1 · Raring et al. · 2018 [cited by applicant]
US 10018325B2 · Kim et al. · 2018 [cited by applicant]
US 10050026B2 · Takeya et al. · 2018 [cited by applicant]
US 10068884B2 · Takeya et al. · 2018 [cited by applicant]
US 10145518B2 · Do et al. · 2018 [cited by applicant]
US 10964845B2 · Dimitropoulos et al. · 2021 [cited by applicant]
US 11621173B2 · Hin · 2023 [cited by examiner]
US 11631594B2 · Hin · 2023 [cited by examiner]
US 20090179831A1 · Yamashita et al. · 2009 [cited by applicant]
US 20110151607A1 · Landis et al. · 2011 [cited by applicant]
US 20110287606A1 · Brun et al. · 2011 [cited by applicant]
US 20120007134A1 · Miyai et al. · 2012 [cited by applicant]
US 20120205614A1 · Templier et al. · 2012 [cited by applicant]
US 20120223875A1 · Lau · 2012 [cited by examiner]
US 20130020115A1 · Mataye et al. · 2013 [cited by applicant]
US 20130112945A1 · Gilet et al. · 2013 [cited by applicant]
US 20140077156A1 · Bavencove et al. · 2014 [cited by applicant]
US 20140094878A1 · Gossler et al. · 2014 [cited by applicant]
US 20140138719A1 · Maindron et al. · 2014 [cited by applicant]
US 20140367705A1 · Bibl et al. · 2014 [cited by applicant]
US 20150118544A1 · Oukassi · 2015 [cited by applicant]
US 20150144590A1 · Simonato et al. · 2015 [cited by applicant]
US 20150187740A1 · Mcgroddy et al. · 2015 [cited by applicant]
US 20150228873A1 · Gebuhr et al. · 2015 [cited by applicant]
US 20150280060A1 · Gilet et al. · 2015 [cited by applicant]
US 20150380461A1 · Robin et al. · 2015 [cited by applicant]
US 20160079565A1 · Maindron et al. · 2016 [cited by applicant]
US 20160190400A1 · Jung et al. · 2016 [cited by applicant]
US 20160218240A1 · Bouvier et al. · 2016 [cited by applicant]
US 20160293811A1 · Hussell et al. · 2016 [cited by applicant]
US 20170080457A1 · Eymery et al. · 2017 [cited by applicant]
US 20170098746A1 · Bergmann et al. · 2017 [cited by applicant]
US 20170137645A1 · Manceau et al. · 2017 [cited by applicant]
US 20170186612A1 · Almadori et al. · 2017 [cited by applicant]
US 20170243860A1 · Hong et al. · 2017 [cited by applicant]
US 20170293065A1 · Kim · 2017 [cited by applicant]
US 20170358563A1 · Cho et al. · 2017 [cited by applicant]
US 20170358724A1 · Shichijo et al. · 2017 [cited by applicant]
US 20180017939A1 · Allier et al. · 2018 [cited by applicant]
US 20180019369A1 · Cho et al. · 2018 [cited by applicant]
US 20180019373A1 · Lehnhardt et al. · 2018 [cited by applicant]
US 20180061316A1 · Shin et al. · 2018 [cited by applicant]
US 20180074372A1 · Takeya et al. · 2018 [cited by applicant]
US 20180090540A1 · Von Malm et al. · 2018 [cited by applicant]
US 20180138157A1 · Im et al. · 2018 [cited by applicant]
US 20180145059A1 · Welch et al. · 2018 [cited by applicant]
US 20180149328A1 · Cho et al. · 2018 [cited by applicant]
US 20180156406A1 · Feil et al. · 2018 [cited by applicant]
US 20180166470A1 · Chae · 2018 [cited by applicant]
US 20180174519A1 · Kim et al. · 2018 [cited by applicant]
US 20180174931A1 · Henley · 2018 [cited by applicant]
US 20180210282A1 · Song et al. · 2018 [cited by applicant]
US 20180238511A1 · Hartmann et al. · 2018 [cited by applicant]
US 20180259137A1 · Lee et al. · 2018 [cited by applicant]
US 20180259570A1 · Henley · 2018 [cited by applicant]
US 20180272605A1 · Gmeinsieser et al. · 2018 [cited by applicant]
US 20180283642A1 · Liao et al. · 2018 [cited by applicant]
US 20180297510A1 · Fiederling et al. · 2018 [cited by applicant]
US 20180339643A1 · Kim · 2018 [cited by applicant]
US 20180339644A1 · Kim · 2018 [cited by applicant]
US 20180354406A1 · Park · 2018 [cited by applicant]
US 20210148553A1 · Hin et al. · 2021 [cited by applicant]
US 20220037303A1 · Aoki · 2022 [cited by examiner]
US 20230099850A1 · Lopez · 2023 [cited by examiner]
US 20230101822A1 · Lopez et al. · 2023 [cited by applicant]
US 20230118272A1 · Lopez · 2023 [cited by examiner]
US 20230126041A1 · Wildeson · 2023 [cited by examiner]
DE 102010051286A1 · 2012 [cited by applicant]
DE 102012109460A1 · 2014 [cited by applicant]
DE 102014112551A1 · 2016 [cited by applicant]
EP 1378949A1 · 2004 [cited by applicant]
EP 2027608A1 · 2009 [cited by applicant]
EP 2203939A1 · 2010 [cited by applicant]
EP 2211387A2 · 2010 [cited by applicant]
EP 2339658A2 · 2011 [cited by applicant]
EP 2491591A1 · 2012 [cited by applicant]
EP 2499958A1 · 2012 [cited by applicant]
EP 2521161A1 · 2012 [cited by applicant]
EP 2521162A1 · 2012 [cited by applicant]
EP 2553149A1 · 2013 [cited by applicant]
EP 2617069A1 · 2013 [cited by applicant]
EP 2674516A1 · 2013 [cited by applicant]
EP 2855744B1 · 2016 [cited by applicant]
EP 3053199A1 · 2016 [cited by applicant]
EP 3144272A1 · 2017 [cited by applicant]
EP 2006921B1 · 2018 [cited by applicant]
EP 3410002A1 · 2018 [cited by applicant]
EP 3410003A1 · 2018 [cited by applicant]
EP 2710634B1 · 2020 [cited by applicant]
FR 2952366A1 · 2011 [cited by applicant]
FR 2964796A1 · 2012 [cited by applicant]
FR 2969995A1 · 2012 [cited by applicant]
FR 2972815A1 · 2012 [cited by applicant]
FR 2974940A1 · 2012 [cited by applicant]
FR 2974941A1 · 2012 [cited by applicant]
FR 2975532A1 · 2012 [cited by applicant]
FR 2991342A1 · 2013 [cited by applicant]
FR 2991999A1 · 2013 [cited by applicant]
FR 2998090A1 · 2014 [cited by applicant]
FR 3011383A1 · 2015 [cited by applicant]
FR 3041274A1 · 2017 [cited by applicant]
FR 3046155A1 · 2017 [cited by applicant]
FR 3052915A1 · 2017 [cited by applicant]
JP 2016066765A · 2016 [cited by applicant]
KR 20140118466A · 2014 [cited by applicant]
KR 20170017122A · 2017 [cited by applicant]
KR 20170018687A · 2017 [cited by applicant]
KR 20180010670A · 2018 [cited by applicant]
KR 20180114413A · 2018 [cited by applicant]
TW 201417339A · 2014 [cited by applicant]
TW 201620163A · 2016 [cited by applicant]
WO 2006138465A2 · 2006 [cited by applicant]
WO 2011045289A1 · 2011 [cited by applicant]
WO 2011048318A1 · 2011 [cited by applicant]
WO 2012035243A1 · 2012 [cited by applicant]
WO 2012156620A2 · 2012 [cited by applicant]
WO 2013182969A1 · 2013 [cited by applicant]
WO 2015044620A1 · 2015 [cited by applicant]
WO 2016079505A1 · 2016 [cited by applicant]
WO 2017068029A1 · 2017 [cited by applicant]
WO 2017102708A1 · 2017 [cited by applicant]
WO 2017184686A1 · 2017 [cited by applicant]
WO 2017216445A1 · 2017 [cited by applicant]
WO 2018091657A1 · 2018 [cited by applicant]
WO 2018139866A1 · 2018 [cited by applicant]
WO 2018143682A1 · 2018 [cited by applicant]
WO 2018159977A1 · 2018 [cited by applicant]
WO 2018169243A1 · 2018 [cited by applicant]
WO 2019092357A1 · 2019 [cited by applicant]
WO 2019126539A1 · 2019 [cited by applicant]
PCT International Search Report and Written Opinion in PCT/US2022/044327 dated Jan. 12, 2023, 11 pages. [cited by applicant]
PCT International Search Report and Written Opinion in PCT/US2022/044328 dated Jan. 9, 2023, 12 pages. [cited by applicant]
PCT International Search Report and Written Opinion in PCT/US2022/044329 dated Jan. 18, 2023, 10 pages. [cited by applicant]
Herrnsdorf, Johannes , et al., “Active-Matrix GaN Micro Light-Emitting Diode Display With Unprecedented Brightness”, IEEE Transactions on Electron Devices, vol. 62, No. 6, Jun. 2015. [cited by applicant]