IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD

1 . A system, comprising:

a light source configured to emit a probing beam to illuminate an optical element;

an image sensor configured to be rotatable around the optical element within a predetermined rotation range; and

a controller configured to control the image senor to move to a plurality of angular sub-ranges of the predetermined rotation range to receive a plurality of scattered beams output from the optical element,

wherein the image sensor is configured to generate a plurality of sets of speckle pattern image data based on the received scattered beams, and

wherein the sets of speckle pattern image data provide two-dimensional (“2D”) spatial information of speckles.

2 . The system of claim 1 , wherein the image sensor is a camera sensor.

3 . The system of claim 1 , wherein the angular sub-ranges include at least two different angular spans.

4 . The system of claim 1 , wherein the controller is configured to determining exposure times for the imaging sensor for the plurality of angular sub-ranges of the predetermined rotation range.

5 . The system of claim 4 , wherein the exposure times for the plurality of angular sub-ranges are different.

6 . The system of claim 4 , wherein the controller is configured to pre-set the exposure times in the imaging sensor for the plurality of angular sub-ranges.

7 . The system of claim 6 , wherein

the controller is configured to, with the light source turned on, move the imaging sensor around the optical element to the plurality of angular sub-ranges to generate the plurality of sets of speckle pattern image data based on the plurality of scattered beams output from the optical element, using the respective pre-set exposure times at the respective angular sub-ranges, and

the plurality of sets of speckle pattern image data include first sets of intensity data relating to the scattered beams output from the optical element.

8 . The system of claim 7 , wherein

the controller is configured to, with the light source turned off, move the imaging sensor around the optical element to the plurality of angular sub-ranges to generate a plurality of sets of dark frame image data, using the respective pre-set exposure times at the respective angular sub-ranges, and

the plurality of sets of dark frame image data include second sets of intensity data.

9 . The system of claim 8 , wherein the controller is configured to process the plurality of sets of speckle pattern image data and the plurality of sets of dark frame image data to obtain an angular-dependent scattering intensity profile of the optical element.

10 . The system of claim 9 , wherein the controller is configured to:

subtract the second sets of intensity data from the corresponding first sets of intensity data to obtain third sets of intensity data for the plurality of scattered beams output from the optical element;

normalize the third sets of intensity data by the corresponding exposure times; and

process the normalized third sets of intensity data to obtain an angular-dependent scattering intensity profile of the optical element.

11 . The system of claim 1 , wherein the light source includes a plurality of laser light sources associated with a plurality of laser wavelengths.

12 . A method, comprising:

determining a plurality of exposure times of an image sensor for a plurality of angular sub-ranges of a predetermined rotation range around an optical element;

with a light source turned on, moving the imaging sensor around the optical element to the plurality of angular sub-ranges to generate a plurality of sets of speckle pattern image data based on a plurality of scattered beams output from the optical element, using the respective pre-set exposure times at the respective angular sub-ranges;

with the light source turned off, moving the imaging sensor around the optical element to the plurality of angular sub-ranges to generate a plurality of sets of dark frame image data, using the respective pre-set exposure times at the respective angular sub-ranges; and

processing the plurality of sets of speckle pattern image data and the plurality of sets of dark frame image data to obtain an angular-dependent scattering intensity profile of the optical element.

13 . The method of claim 12 , further comprising pre-setting the determined exposure times in the imaging sensor for the plurality of angular sub-ranges.

14 . The method of claim 12 , wherein the image sensor is a camera sensor.

15 . The method of claim 12 , wherein the angular sub-ranges include at least two different angular spans.

16 . The method of claim 12 , wherein the exposure times for the plurality of angular sub-ranges are different.

17 . The method of claim 12 , wherein the plurality of sets of speckle pattern image data include first sets of intensity data relating to the scattered beams output from the optical element, and the plurality of sets of dark frame image data include second sets of intensity data.

18 . The method of claim 17 , wherein processing the plurality of sets of speckle pattern image data and the plurality of sets of dark frame image data to obtain an angular-dependent scattering intensity profile of the optical element further comprises:

subtracting the second sets of intensity data from the corresponding first sets of intensity data to obtain third sets of intensity data for the plurality of scattered beams output from the optical element.

19 . The method of claim 18 , wherein processing the plurality of sets of speckle pattern image data and the plurality of sets of dark frame image data to obtain an angular-dependent scattering intensity profile of the optical element further comprises:

normalizing the third sets of intensity data by the corresponding exposure times.

20 . The method of claim 19 , wherein processing the plurality of sets of speckle pattern image data and the plurality of sets of dark frame image data to obtain an angular-dependent scattering intensity profile of the optical element further comprises:

processing the normalized third sets of intensity data to obtain the angular-dependent scattering intensity profile of the optical element.