Rare earth frits for fluorescence and methods for laser marking applications
Fluorescent rare earth glass frits are suitable for laser marking. A marking composition including fluorescent glass frits is disclosed that is capable of emitting fluorescence under irradiation of ultraviolet rays. A method of forming marks or indicia on a substrate using the fluorescent rare earth glass frits is also disclosed.
1. A marking composition for forming marks or indicia on a substrate, the composition comprising:
from about 60 to about 95 wt. % of a carrier;
from about 5 wt. % to about 40 wt. % a glass frit, the glass frit comprising:
from about 8 to about 60 wt. % SiO 2 ,
from about 0 to about 30 wt. % Al 2 O 3 ,
from about 0.1 to about 15 wt. % B 2 O 3 ,
from about 5 to about 30 wt. % Na 2 O,
from about 0 to about 8 wt. % CaO,
from about 0 to about 8 wt. % Li 2 O,
from about 0 to about 30 wt. % SrO, and
from about 0.1 to about 50 wt. % of at least one compound selected from the group consisting of terbium compound, europium compound, cerium compound, gadolinium compound, samarium compound, dysprosium compound, vanadium compound, and combinations thereof, wherein;
the glass frit has an average particle size within the range of from about 0.1 to about 20 microns, and wherein;
the glass frit is devoid of at least one of lead, cadmium, nickel, chromium and combinations thereof.
2. The marking composition of claim 1 , wherein the at least one compound is selected from the group consisting of terbium compound, europium compound, and cerium compound.
3. The marking composition of claim 1 , the glass frit comprising:
from about 8 to about 55 wt. % SiO 2 ,
from about 0.1 to about 25 wt. % Al 2 O 3 ,
from about 0.1 to about 10 wt. % B 2 O 3 ,
from about 8 to about 21 wt. % Na 2 O,
from about 0.1 to about 2 wt. % CaO,
from about 0.1 to about 4 wt. % Li 2 O,
from about 0 to about 18 wt. % SrO, and
from about 0.1 to about 20 wt. % of at least one compound selected from the group consisting of terbium compound, europium compound, cerium compound, gadolinium compound, samarium compound, dysprosium compound, vanadium compound, and combinations thereof.
4. The marking composition of claim 3 , the glass frit comprising:
from about 32 to about 55 wt. % SiO 2 ,
from about 0.1 to about 4 wt. % Al 2 O 3 ,
from about 1 to about 10 wt. % B 2 O 3 ,
from about 10 to about 21 wt. % Na 2 O,
from about 0.1 to about 3 wt. % CaO,
from about 0.1 to about 5 wt. % Li 2 O,
from about 0 to about 5 wt. % SrO, and
from about 0.1 to about 20 wt. % of at least one compound selected from the group consisting of terbium compound, europium compound, cerium compound, gadolinium compound, samarium compound, dysprosium compound, vanadium compound, and combinations thereof.
5. The marking composition of claim 3 , the glass frit comprising:
from about 34 to about 55 wt. % SiO 2 ,
from about 0.1 to about 3 wt. % Al 2 O 3 ,
from about 6 to about 10 wt. % B 2 O 3 ,
from about 13 to about 21 wt. % Na 2 O,
from about 0.1 to about 3 wt. % CaO,
from about 0.1 to about 4 wt. % Li 2 O,
from about 0 to about 5 wt. % SrO, and
from about 0.1 to about 20 wt. % of at least one compound selected from the group consisting of terbium compound, europium compound, cerium compound, gadolinium compound, samarium compound, dysprosium compound, vanadium compound, and combinations thereof.
6. The marking composition of claim 3 , the glass frit comprising:
from about 17 to about 40 wt. % SiO 2 ,
from about 10 to about 25 wt. % Al 2 O 3 ,
from about 0.1 to about 7 wt. % B 2 O 3 ,
from about 8 to about 16 wt. % Na 2 O,
from about 0 to about 3 wt. % CaO,
from about 0 to about 4 wt. % Li 2 O,
from about 10 to about 18 wt. % SrO, and
from about 0.1 to about 10 wt. % of at least one compound selected from the group consisting of terbium compound, europium compound, cerium compound, gadolinium compound, samarium compound, dysprosium compound, vanadium compound, and combinations thereof.
7. The marking composition of claim 6 , the glass frit comprising:
from about 30 to about 40 wt. % SiO 2 ,
from about 10 to about 20 wt. % Al 2 O 3 ,
from about 0.1 to about 5 wt. % B 2 O 3 ,
from about 8 to about 16 wt. % Na 2 O,
from about 0 to about 2 wt. % CaO,
from about 0 to about 4 wt. % Li 2 O,
from about 1 to about 15 wt. % SrO, and
from about 0.1 to about 8 wt. % of at least one compound selected from the group consisting of terbium compound, europium compound, cerium compound, gadolinium compound, samarium compound, dysprosium compound, vanadium compound, and combinations thereof.
8. The marking composition of claim 1 , the glass frit comprising:
from about 28 to about 60 wt. % SiO 2 ,
from about 0.1 to about 7 wt. % Al 2 O 3 ,
from about 0.1 to about 15 wt. % B 2 O 3 ,
from about 14 to about 30 wt. % Na 2 O,
from about 0 to about 2 wt. % CaO,
from about 0 to about 4 wt. % Li 2 O,
from about 0.1 to about 7 wt. % SrO, and
from about 0.1 to about 7 wt. % of at least one compound selected from the group consisting of terbium compound, europium compound, cerium compound, gadolinium compound, samarium compound, dysprosium compound, vanadium compound, and combinations thereof.
9. The marking composition of claim 1 , wherein the glass frit is devoid of lead, cadmium, nickel, chromium, and compounds thereof.
10. The marking composition of claim 1 , wherein the glass frit has an average particle size within the range of from about 1 to about 15 microns.
11. The marking composition of claim 1 , wherein the glass frit has an average particle size within the range of from about 3 to about 10 microns.
12. The marking composition of claim 1 , wherein the glass frit has a coefficient of thermal expansion between about 85×10 −7 /° K to about 150×10 −7 /° K.