IP Library Granted Patent US 12,399,079
Granted Patent B2
US 12,399,079 · App. 18/034,754 · Granted Aug 26, 2025

Devices and methods for measuring the amount of frequency modulation

Inventors: Tatsuya Okamoto (Musashino, JP); Daisuke Iida (Musashino, JP); Yusuke Koshikiya (Musashino, JP); Nazuki Honda (Musashino, JP)
Assignee: Nippon Telegraph and Telephone Corporation
G01M11/3172G01D5/35358H04B10/071
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,399,079
App. No.
18/034,754
Granted
Aug 26, 2025
Kind
B2
Abstract

The present disclosure relates to a frequency modulation amount measuring device that measures an optical spectral shift of scattered light at a position in an optical transmission line, and calculates a frequency modulation amount at the position, using the measured optical spectral shift.

Claims (19)

1. A frequency modulation amount measuring device, comprising a processor and a non-transitory computer readable medium storing a program, wherein execution of the program causes the processor to perform operations comprising:

measuring an optical spectral shift of scattered light at a position to be analyzed in an optical transmission line, and

calculating a frequency modulation amount at the position to be analyzed, using the measured optical spectral shift.

2. The frequency modulation amount measuring device according to claim 1 , wherein the operations further comprises

obtaining a phase change amount at the position to be analyzed, using the measured optical spectral shift, and

calculating the frequency modulation amount at the position to be analyzed, using the obtained phase change amount.

3. The frequency modulation amount measuring device according to claim 1 , wherein the operations further comprises

measuring a backscattered light waveform in the optical transmission line multiple times, each measurement at a different time point, using optical frequency domain reflectometry (OFDR),

extracting an optical spectrum at the position to be analyzed from the backscattered light waveform obtained by the measurement; and

calculating the optical spectral shift at the position to be analyzed, using the extracted optical spectrum.

4. The frequency modulation amount measuring device according to claim 1 , wherein the operations further comprises

measuring optical spectral shifts at a plurality of positions to be analyzed in the optical transmission line,

calculating frequency modulation amounts at the plurality of positions to be analyzed, and

calculating a frequency modulation amount in a section in the optical transmission line, the section including the plurality of positions to be analyzed.

5. The frequency modulation amount measuring device according to claim 4 , wherein the operations further comprises

indicating the frequency modulation amount in the section in the optical transmission line by a histogram.

6. A frequency modulation amount measuring method comprising:

measuring an optical spectral shift of scattered light at a position to be analyzed in an optical transmission line, and

calculating a frequency modulation amount at the position to be analyzed, using the measured optical spectral shift.

Assignments (2)
CHANGE OF NAME Recorded Aug 14, 2025
From: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
To: NTT, INC.
Reel/Frame 072468/0951 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 1, 2023
From: OKAMOTO, TATSUYA; IIDA, DAISUKE; KOSHIKIYA, YUSUKE; HONDA, NAZUKI
To: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
Reel/Frame 063493/0038 →
Continuity (1)
Related Publication 20230400379A1 · Dec 14, 2023
References Cited (28)
US 4569588A · Nishiwaki · 1986 [cited by examiner]
US 7208722B2 · Goto · 2007 [cited by examiner]
US 8670673B2 · Eiselt · 2014 [cited by examiner]
US 8724101B2 · Hotate · 2014 [cited by examiner]
US 9163958B2 · Zadok · 2015 [cited by examiner]
US 9571189B2 · Lin · 2017 [cited by examiner]
US 9983095B2 · Matsuura · 2018 [cited by examiner]
US 10488259B2 · Bartels · 2019 [cited by examiner]
US 11047767B2 · Furukawa · 2021 [cited by examiner]
US 11098998B2 · Tsuchida · 2021 [cited by examiner]
US 11326981B2 · Furukawa · 2022 [cited by examiner]
US 11506521B2 · Matsuura · 2022 [cited by examiner]
US 11920974B2 · Okamoto · 2024 [cited by examiner]
US 11994376B2 · Okamoto · 2024 [cited by examiner]
US 20020131042A1 · Iwama · 2002 [cited by examiner]
US 20030007142A1 · Hotate · 2003 [cited by examiner]
US 20120057432A1 · Hill · 2012 [cited by examiner]
US 20140043614A1 · Dhayalan · 2014 [cited by examiner]
US 20160182149A1 · Domínguez López · 2016 [cited by examiner]
US 20170366257A1 · Hayward · 2017 [cited by examiner]
US 20210215532A1 · Okamoto et al. · 2021 [cited by applicant]
US 20230324202A1 · Matsuura · 2023 [cited by examiner]
US 20230386308A1 · Murphy · 2023 [cited by examiner]
JP 2019211309 · 2019 [cited by applicant]
WO WO2019235232A1 · 2019 [cited by examiner]
Jiang et al., “Long-distance frequency transfer over an urban fiber link using optical phase stabilization,” J. Opt. Soc. Am. B, 2008, 25(12):2029-2035. [cited by applicant]
Williams et al., “High-stability transfer of an optical frequency over long fiber-optic links,” J. Opt. Soc. Am. B, 2008, 25(8):1284-1293. [cited by applicant]
Kreger et al., “High Resolution Distributed Strain or Temperature Measurements in Single- and Multi-mode Fiber Using Swept-Wavelength Interferometry, ” Proc. OFS, 2006, ThE42, 4 pages. [cited by applicant]