Structure for forming a parallel X-ray beam, X-ray diagnostic apparatus, and method
A structure according to an embodiment is disposed between an X-ray emitter and a subject, and includes a scatterer configured to scatter X-rays emitted from the X-ray emitter, and a transmitter configured to transmit X-rays at a predetermined angle, among the X-rays scattered by the scatterer.
1 . A structure that is disposed between an X-ray emitter and a subject, the structure comprising:
a scatterer made of a material capable of scattering X-rays and transmitting the scattered X-rays, the scatterer being configured to scatter X-rays emitted from the X-ray emitter, wherein the scattering of the X-rays by the material is either Compton scattering or Thomson scattering; and
a transmitter configured to transmit X-rays at a single, predetermined angle, among the X-rays scattered by the scatterer,
wherein the scatterer has a convex-shaped portion on an incidence surface, where the X-rays emitted from the X-ray emitter become incident.
2 . The structure according to claim 1 , wherein the material is an acrylic material.
3 . An X-ray diagnostic apparatus, comprising:
an X-ray emitter configured to emit X-rays;
a structure provided between the X-ray emitter and a subject; and
an X-ray detector configured to detect X-rays transmitted through the structure, wherein
the structure includes:
a scatterer made of a material capable of scattering X-rays and transmitting the scattered X-rays, the scatterer being configured to scatter the X-rays emitted from the X-ray emitter, wherein the scattering of the X-rays by the material is either Compton scattering or Thomson scattering; and
a transmitter configured to transmit X-rays at a single, predetermined angle, among the X-rays scattered by the scatterer,
wherein the scatterer has a convex-shaped portion on an incidence surface, where the X-rays emitted from the X-ray emitter become incident.
4 . The X-ray diagnostic apparatus according to claim 3 , further comprising processing circuitry configured to generate an X-ray image of the subject based on the X-rays detected by the X-ray detector.
5 . The X-ray diagnostic apparatus according to claim 4 , wherein the processing circuitry is further configured to perform a correction for eliminating a systematic error in pixel values at respective detected positions in the X-ray image.
6 . The X-ray diagnostic apparatus according to claim 5 , wherein the processing circuitry is further configured to apply the correction to the X-ray image based on a correction X-ray image captured without the subject placed between the X-ray emitter and the X-ray detector.
7 . The X-ray diagnostic apparatus according to claim 3 , further comprising a support configured to support the structure.
8 . The X-ray diagnostic apparatus according to claim 7 , wherein the structure is integrated with the X-ray detector.
9 . The X-ray diagnostic apparatus according to claim 7 , wherein the structure is integrated with the X-ray emitter.
10 . The X-ray diagnostic apparatus according to claim 3 , further comprising an X-ray aperture configured to control a range to be irradiated with the X-rays emitted from the X-ray emitter, wherein
the structure is configured to transmit X-rays resulting from the X-ray aperture having controlled the range to be irradiated with the X-rays emitted from the X-ray emitter.
11 . The X-ray diagnostic apparatus according to claim 10 , wherein the structure is built into the X-ray aperture or disposed in front of the X-ray aperture.
12 . The X-ray diagnostic apparatus according to claim 10 , wherein
the range to be irradiated with the X-rays is smaller than a range to be included in an X-ray image of the subject, and
the X-ray emitter, the structure, and the X-ray aperture are shifted in a direction orthogonal to the single, predetermined angle so as to irradiate the range to be included in the X-ray image with the X-rays.
13 . A method, comprising:
emitting X-rays from an X-ray emitter; and
detecting, with an X-ray detector, X-rays at a single predetermined angle from the emitted X-rays that are ( 1 ) scattered by a scatterer made of a material capable of scattering X-rays and transmitting the scattered X-rays, and ( 2 ) transmitted through a transmitter, wherein the scattering of the X-rays by the material is either Compton scattering or Thomson scattering,
wherein the scatterer has a convex-shaped portion on an incidence surface, where the X-rays emitted from the X-ray emitter becomes incident.
14 . The method according to claim 13 , wherein
the X-ray detector is configured to detect X-rays at the single, predetermined angle, the X-rays having been scattered by the scatterer and transmitted through the transmitter, among the X-rays emitted from the X-ray emitter, and
the method further comprises generating an X-ray image of a subject based on the X- rays detected by the X-ray detector.
15 . The method according to claim 14 , further comprising applying, to the X-ray image, a correction for eliminating a systematic error in pixel values corresponding to respective detected positions.
16 . The method according to claim 15 , further comprising applying the correction to the X-ray image based on a correction X-ray image captured without the subject placed between the X-ray emitter and the X-ray detector.
17 . The method according to claim 14 , wherein a structure including the scatterer and the transmitter is supported by a support.
18 . The method according to claim 17 , wherein the structure is integrated with the X-ray detector.
19 . The method according to claim 17 , wherein the structure is integrated with the X-ray emitter.