IP Library Patent Application 18061324
Patent Application
App. No. 18/061,324

TECHNIQUES FOR THREAD REDUCTION IN PROCESSING TENSORS UTILIZING SPARSITY DETECTION

Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US None
App. No.
18/061,324
Abstract

A system and method reduces thread spawning in processing tensor inputs. The method includes generating a result of a block of a tensor input with a predefined kernel on a processing circuitry, the processing circuitry configured to process in parallel a plurality of threads; performing a depth test on the generated result; generating for an indicator bit a first indicator bit value based on the depth test, the first indicator bit value indicating that the result is sparse; generating for the indicator bit a second indicator bit value based on the depth test, the second indicator bit value indicating that the result is not sparse; and spawning a thread for processing the result and a second predefined kernel, based on the indicator bit having the second indicator bit value.

Claims (68)

1 . A method for thread reduction in tensor processing, comprising:

generating a result of a block of a tensor input with a predefined kernel on a processing circuitry, the processing circuitry configured to process in parallel a plurality of threads;

performing a depth test on the generated result;

generating for an indicator bit a first indicator bit value based on the depth test, the first indicator bit value indicating that the result is sparse;

generating for the indicator bit a second indicator bit value based on the depth test, the second indicator bit value indicating that the result is not sparse; and

spawning a thread for processing the result and a second predefined kernel, based on the indicator bit having the second indicator bit value.

2 . The method of claim 1 , further comprising:

storing the result and a value of the indicator bit in a memory.

3 . The method of claim 1 , further comprising:

generating for the indicator bit a value indicating that the result is sparse, in response to determining that the depth test indicates that sparsity of the block is within a threshold value.

4 . The method of claim 3 , wherein the threshold is any one of: dynamic, static, and adaptive.

5 . The method of claim 1 , further comprising:

performing a second depth test on a plurality of results, the plurality of results including the generated result.

6 . The method of claim 5 , further comprising:

generating for the indicator bit the first indicator bit value based on the second depth test, the first indicator bit value indicating that the result is sparse.

7 . The method of claim 1 , wherein the generated result is a block representing a plurality of pixels.

8 . The method of claim 1 , further comprising:

processing the thread on a core of the processing circuitry, wherein the processing circuitry is a multi-core processing circuitry; and

generating a second result based on an output of the core.

9 . The method of claim 8 , further comprising:

generating the second result further based on a plurality of zero values, in response to determining that the indicator bit has the first indicator bit value.

10 . The method of claim 1 , further comprising:

performing structured pruning of the predefined kernel.

11 . The method of claim 1 , further comprising:

performing unstructured pruning of the predefined kernel.

12 . The method of claim 1 , further comprising:

generating a value for the indicator bit based on a weight associated with the predefined kernel.

13 . The method of claim 1 , further comprising:

quantizing a value of the block, wherein the block includes a plurality of values.

14 . The method of claim 13 , wherein the value is stored as a floating point value, and the quantized value is stored as an integer.

15 . A non-transitory computer readable medium having stored thereon instructions for causing a processing circuitry to execute a process, the process comprising:

generating a result of a block of a tensor input with a predefined kernel on a processing circuitry, the processing circuitry configured to process in parallel a plurality of threads;

performing a depth test on the generated result;

generating for an indicator bit a first indicator bit value based on the depth test, the first indicator bit value indicating that the result is sparse;

generating for the indicator bit a second indicator bit value based on the depth test, the second indicator bit value indicating that the result is not sparse; and

spawning a thread for processing the result and a second predefined kernel, based on the indicator bit having the second indicator bit value.

16 . A system for thread reduction in tensor processing, comprising:

a processing circuitry; and

a memory, the memory containing instructions that, when executed by the processing circuitry, configure the system to:

generate a result of a block of a tensor input with a predefined kernel on a processing circuitry, the processing circuitry configured to process in parallel a plurality of threads;

perform a depth test on the generated result;

generate for an indicator bit a first indicator bit value based on the depth test, the first indicator bit value indicating that the result is sparse;

generate for the indicator bit a second indicator bit value based on the depth test, the second indicator bit value indicating that the result is not sparse; and

spawn a thread for processing the result and a second predefined kernel, based on the indicator bit having the second indicator bit value.

17 . The method of claim 16 , further comprising:

storing the result and a value of the indicator bit in a memory.

18 . The method of claim 16 , further comprising:

generating for the indicator pit a value indicating that the result is sparse, in response to determining that the depth test indicates that sparsity of the block is within a threshold value.

19 . The method of claim 18 , wherein the threshold is any one of: dynamic, static, and adaptive.

20 . The method of claim 16 , further comprising:

performing a second depth test on a plurality of results, the plurality of results including the generated result.

21 . The method of claim 20 , further comprising:

generating for the indicator bit the first indicator bit value based on the second depth test, the first indicator bit value indicating that the result is sparse.

22 . The method of claim 16 , wherein the generated result is a block representing a plurality of pixels.

23 . The method of claim 16 , further comprising:

processing the thread on a core of the processing circuitry, wherein the processing circuitry is a multi-core processing circuitry; and

generating a second result based on an output of the core.

24 . The method of claim 23 , further comprising:

generating the second result further based on a plurality of zero values, in response to determining that the indicator bit has the first indicator bit value.

25 . The method of claim 16 , further comprising:

performing structured pruning of the predefined kernel.

26 . The method of claim 16 , further comprising:

performing unstructured pruning of the predefined kernel.

27 . The method of claim 16 , further comprising:

generating a value for the indicator bit based on a weight associated with the predefined kernel.

28 . The method of claim 16 , further comprising:

quantizing a value of the block, wherein the block includes a plurality of values.

29 . The method of claim 28 , wherein the value is stored as a floating point value, and the quantized value is stored as an integer.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2026
From: THINK SILICON SINGLE MEMBER P.C. AND APPLIED MATERIALS, INC.
To: QUALCOMM INCORPORATED
Reel/Frame 075735/0803 →
CHANGE OF NAME Recorded Mar 6, 2026
From: THINK SILICON RESEARCH AND TECHNOLOGY SINGLE MEMBER S.A.
To: THINK SILICON SINGLE MEMBER P.C.
Reel/Frame 075032/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2022
From: KERAMIDAS, GEORGIOS; MITAS, NIKOLAOS; TSALIAGKOS, DIMITRIOS
To: THINK SILICON RESEARCH AND TECHNOLOGY SINGLE MEMBER S.A.
Reel/Frame 061980/0330 →