Test device, test method, and test machine
A test device includes a test plate and an adapter box. The rest plate includes a test port, and a first positioning portion disposed on the test plate. The adapter box includes a box body configured to detachably mount Solid State Drives to be tested, and a second positioning portion disposed on the box body and configured to cooperate with the first positioning portion to cause the Solid State Drives to be tested to form a communication connection with the test port.
1 . A test device, comprising:
a test plate, comprising:
a test port; and
a first positioning portion disposed on the test plate; and
an adapter box, comprising:
a box body comprising mounting grooves configured to detachably mount multiple Solid State Drives to be tested along the mounting grooves; and
a second positioning portion disposed on and connected to the box body,
wherein:
the first positioning portion is configured to receive the second positioning portion, which is separate from the first positioning portion, to combine the adapter box that carries the multiple Solid State Drives to be tested with the test plate; and
a relative position between the test port and the box body is adjusted by engagement of the first positioning portion with a locking assembly rotatably connected with the first positioning portion, to cause the multiple Solid State Drives to be tested in the box body to form a communication connection with the test port.
2 . The test device of claim 1 , wherein
the first positioning portion includes a slide groove; and
the second positioning portion includes a slide rail for being slidably connected with the slide groove.
3 . The test device of claim 2 , wherein the slide rail includes positioning fulcrums that are disposed along a sliding direction of the slide rail and are slidably connected with the slide groove.
4 . The test device of claim 3 , further comprising the locking assembly, comprising:
a pressure lever rotatably connected with the first positioning portion; and
a stop block disposed on the pressure lever to rotate with the pressure lever, wherein at least part of the stop block is configured to be snap-fitted to a side of one of the positioning fulcrums facing away from the test plate.
5 . The test device of claim 4 , wherein
the stop block comprises a limiting groove extending in a rotation plane of the pressure lever;
the pressure lever is in a locked state or an avoidance state with respect to the first positioning portion;
a first end of the limiting groove is snap-fitted to the one of the positioning fulcrums to cause the multiple Solid State Drives to be tested to form a communication connection with the test port when the pressure lever is in the locked state;
a distance between a second end of the limiting groove and a rotation center of the pressure lever is greater than a distance between the first end and the rotation center; and
the second end of the limiting groove pushes against the one of the positioning fulcrums, and the multiple Solid State Drives to be tested break the communication connection with the test port when the pressure lever is in the avoidance state.
6 . The test device of claim 4 , wherein the stop block is fixedly connected with the pressure lever.
7 . The test device of claim 4 , wherein the stop block is slidably connected with the first positioning portion and slidably connected with the pressure lever.
8 . The test device of claim 1 , wherein
the adapter box further comprises test adapter plates that are detachably mounted to the box body and are configured to mount the multiple Solid State Drives to be tested; and
one of the test adapter plates comprises:
a circuit board;
a first port configured to form a communication connection with the multiple Solid State Drives to be tested; and
a second port communicatively connected with the first port through the circuit board and configured to form a communication connection with the test port.
9 . The test device of claim 8 , wherein
one of the test adapter plates further comprises a buckle and at least one securing position that is disposed in a direction away from the first port, the buckle being adapted to be detachably fixed to one of the at least one securing position; and
a distance between the securing position and the first port is adapted to the multiple Solid State Drives to be tested.
10 . The test device of claim 8 , wherein the first port is an M.2 slot, the second port is a U.2 golden finger, and the test port is a U.2 slot.
11 . The test device of claim 8 , wherein the adapter box further comprises a fool-proof structure including a first component located at the box body and a second component located at the one of the test adapter plates, the first component being matched with the second component, and the box body is mounted to the one of the test adapter plates in a predetermined direction.
12 . The test device of claim 1 , wherein the adapter box is disposed as a hollowed-out structure.
13 . The test device of claim 1 , wherein the test device further comprises a processor communicatively connected with the test port, the processor being configured to control scanning processing of the multiple Solid State Drives to be tested.
14 . The test device of claim 1 , wherein
the second positioning portion is configured to move relative to the first positioning portion to be received by the first positioning portion to arrange an adapter plate of the adapter box in a testing position with respect to the test port of the test plate; and
the first positioning portion comprises a slide groove, and the second positioning portion comprises a slide rail for being slidably connected with the slide groove, the slide rail comprising positioning fulcrums disposed along a sliding direction of the slide rail and slidably connected with the slide groove.
15 . A test machine, comprising:
a test device, comprising:
a test plate, comprising:
a test port; and
a first positioning portion disposed on the test plate; and
an adapter box, comprising:
a box body comprising mounting grooves configured to detachably mount multiple Solid State Drives to be tested along the mounting grooves; and
a second positioning portion disposed on and connected to the box body,
wherein:
the first positioning portion is configured to receive the second positioning portion, which is separate from the first positioning portion, to combine the adapter box that carries the multiple Solid State Drives to be tested with the test plate; and
a relative position between the test port and the box body is adjusted by engagement of the first positioning portion with a locking assembly rotatably connected with the first positioning portion, to cause the multiple Solid State Drives to be tested in the box body to form a communication connection with the test port;
a processor communicatively connected with the test port of the test device; and
a memory communicatively connected with the processor, and storing computer-executable instructions which, when executed by the processor, scan the multiple Solid State Drives to be tested through the test port.
16 . The test machine of claim 15 , wherein the computer-executable instructions are further executed by the processor to store data of the multiple Solid State Drives to be tested obtained by scanning processing as a data set.
17 . The test machine of claim 16 , wherein the computer-executable instructions are further executed by the processor to determine whether the multiple Solid State Drives are qualified according to the data set.
18 . A test method, comprising:
mounting multiple Solid State Drives to be tested using a test device, wherein the test device comprises:
a test plate, comprising:
a test port; and
a first positioning portion disposed on the test plate; and
an adapter box, comprising:
a box body comprising mounting grooves configured to detachably mount the multiple Solid State Drives to be tested along the mounting grooves; and
a second positioning portion disposed on and connected to the box body,
wherein:
the first positioning portion is configured to receive the second positioning portion, which is separate from the first positioning portion, to combine the adapter box that carries the multiple Solid State Drives to be tested with the test plate; and
a relative position between the test port and the box body is adjusted by engagement of the first positioning portion with a locking assembly rotatably connected with the first positioning portion, to cause the multiple Solid State Drives to be tested in the box body to form a communication connection with the test port; and
scanning the multiple Solid State Drives to be tested.
19 . The test method of claim 18 , further comprising:
storing data of the multiple Solid State Drives to be tested as a data set.
20 . The test method of claim 19 , further comprising:
determining whether the multiple Solid State Drives are qualified according to the data set.