Granted Patent B2

US 12,448,682 · App. 18/100,637 · Granted Oct 21, 2025

Inventor: Timothee Blanquart (Oud-Heverlee, BE)

Assignee: ASM IP Holding B.V.

C23C16/24C23C16/0209C23C16/45536

Abstract

Claims (23)

1. A method for selectively depositing an amorphous silicon film on a substrate comprising a metallic nitride surface and a metallic oxide surface, the method comprising;

providing a substrate within a reaction chamber;

heating the substrate to a deposition temperature;

contacting the substrate with a silicon iodide precursor utilizing a dilution gas and a carrier gas;

using a thermal chemical vapor deposition process, contacting the substrate with hydrogen gas concurrently with contacting the substrate with the silicon iodide precursor; and

selectively depositing the amorphous silicon film on the metallic nitride surface relative to the metallic oxide surface.

2. The method of claim 1 , wherein the metallic nitride surface comprises a transition metal nitride surface.

3. The method of claim 2 , wherein the transition metal nitride surface comprises at least one of titanium nitride, zirconium nitride, hafnium nitride, aluminum nitride, tantalum nitride, ruthenium nitride, tungsten nitride, molybdenum nitride, or cobalt nitride.

4. The method of claim 2 , wherein the transition metal nitride surface comprises at least one of titanium nitride, hafnium nitride, aluminum nitride, tantalum nitride, ruthenium nitride, tungsten nitride, and molybdenum nitride.

5. The method of claim 1 , wherein the metal oxide surface comprises at least one of titanium oxide, zirconium oxide, hafnium oxide, aluminum oxide, tantalum oxide, ruthenium oxide, tungsten oxide, molybdenum oxide, or cobalt oxide.

6. The method of claim 1 , wherein the metal oxide surface comprises at least one of titanium oxide, zirconium oxide, hafnium oxide, aluminum oxide, tantalum oxide, ruthenium oxide, tungsten oxide, or molybdenum oxide.

7. The method of claim 1 , wherein the deposition temperature is greater than 400° C.

8. The method of claim 1 , wherein the silicon iodide precursor comprises at least one of SiI 2 H 2 , SiI 4 , SiIH 3 , or SiI 3 H.

9. The method of claim 1 , wherein the selectivity is greater than 90%.

10. The method of claim 1 , wherein selectively depositing the amorphous silicon film further comprises depositing greater than 4 nanometers of the amorphous silicon film on the metallic nitride surface with substantially no deposition of the amorphous silicon film on the metallic oxide surface.

11. The method of claim 1 , wherein selectively depositing the amorphous silicon film further comprises depositing greater than 10 nanometers of the amorphous silicon film on the metallic nitride surface with substantially no deposition of the amorphous silicon film on the metallic oxide surface.

12. The method of claim 1 , wherein the metallic nitride surface comprises a surface of a metallic nitride film deposited in the same reaction chamber as the amorphous silicon film.

13. The method of claim 1 , wherein the silicon iodide precursor has a partial pressure between 0.5 Pascals and 0.7 Pascals.

14. The method of claim 1 , further comprising regulating the pressure within the reaction chamber between 1000 Pascals and 3000 Pascals.

15. The method of claim 1 , further comprising contacting the amorphous silicon film with a plasma generated from an oxygen containing gas and converting at least a portion of the amorphous silicon film to a silicon oxide film.

16. The method of claim 1 , further comprising performing one or more selective deposition-etch cycles wherein a unit cycle comprises selectively depositing the amorphous silicon film and subsequent contacting the amorphous silicon film with an etchant to remove at least a portion of the amorphous silicon film.

17. The method of claim 1 , wherein the metallic nitride film is deposited by a topographically selective deposition process.

18. The method of claim 1 , wherein the silicon iodide precursor is continuously flowed into the reaction chamber whilst selectively depositing the amorphous silicon film.

Assignments (1)

Continuity (3)

References Cited (400)