IP Library Granted Patent US 12,426,384
Granted Patent B2
US 12,426,384 · App. 18/103,692 · Granted Sep 23, 2025

Detection device, display device, and illumination device with detection function

Inventors: Tadayoshi Katsuta (Tokyo, JP); Yoshitaka Ozeki (Tokyo, JP)
Assignee: Magnolia White Corporation
H10F30/223H10F39/18H10F39/8057G06V40/1318
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Quick Facts
Patent No.
US 12,426,384
App. No.
18/103,692
Granted
Sep 23, 2025
Kind
B2
Abstract

According to an aspect, a detection device includes a substrate and a plurality of photodiodes arranged on the substrate. Each of the photodiodes comprises a p-type semiconductor layer, an i-type semiconductor layer, and an n-type semiconductor layer stacked on the substrate. Each of the photodiodes includes a plurality of first regions in each of which the p-type semiconductor layer, the i-type semiconductor layer, and the n-type semiconductor layer are stacked so as to be directly in contact with one another, and a second region in which at least the p-type semiconductor layer and the i-type semiconductor layer are stacked so as to be separate from each other. Adjacent first regions included in the plurality of first regions are coupled together by at least the p-type semiconductor layer.

Claims (35)

1. A detection device comprising:

a substrate; and

a plurality of photodiodes arranged on the substrate,

wherein each of the photodiodes comprises a p-type semiconductor layer, an i-type semiconductor layer, and an n-type semiconductor layer stacked on the substrate,

wherein each of the photodiodes comprises

a plurality of first regions in each of which the p-type semiconductor layer, the i-type semiconductor layer, and the n-type semiconductor layer are stacked so as to be directly in contact with one another, and

a second region in which at least the p-type semiconductor layer and the i-type semiconductor layer are stacked so as to be separate from each other, and

wherein adjacent first regions included in the plurality of first regions are coupled together by at least the p-type semiconductor layer.

2. The detection device according to claim 1 , wherein a distance between the p-type semiconductor layer and the n-type semiconductor layer in the second region is longer than a distance between the p-type semiconductor layer and the n-type semiconductor layer in each first region.

3. The detection device according to claim 1 , wherein the second region comprises an insulating film provided between the p-type semiconductor layer and the i-type semiconductor layer.

4. The detection device according to claim 1 , wherein the second region comprises a plurality of insulating films provided between the p-type semiconductor layer and the i-type semiconductor layer.

5. The detection device according to claim 3 , wherein a thickness of the insulating film provided between the p-type semiconductor layer and the i-type semiconductor layer is larger than a thickness of the i-type semiconductor layer.

6. The detection device according to claim 4 , wherein a thickness of each of the insulating films provided between the p-type semiconductor layer and the i-type semiconductor layer is larger than a thickness of the i-type semiconductor layer.

7. The detection device according to claim 1 , further comprising transistors provided corresponding to the photodiodes,

wherein the p-type semiconductor layer is provided in the same layer as a semiconductor layer of each of the transistors.

8. The detection device according to claim 1 ,

wherein the photodiode comprises a third region in which the p-type semiconductor layer is provided, and the i-type semiconductor layer and the n-type semiconductor layer do not overlap the p-type semiconductor layer, and

wherein the third region comprises

an insulating film provided on the p-type semiconductor layer and

a signal line provided on the insulating film provided on the p-type semiconductor layer.

9. The detection device according to claim 1 , wherein the first regions are arranged in a triangular lattice pattern in a plan view from a direction orthogonal to the substrate.

10. The detection device according to claim 1 , wherein the n-type semiconductor layer that couples together adjacent first regions is arranged so as not to overlap a part of the p-type semiconductor layer that couples together the adjacent first regions in a plan view from a direction orthogonal to the substrate.

11. A display device comprising:

the detection device according to claim 1 ; and

a light-transmitting display,

wherein the detection device is provided on a back side of the display.

12. The display device according to claim 11 , wherein the display is a selfluminous display.

13. An illumination device with a detection function comprising:

the detection device according to claim 1 ; and

a light-transmitting illumination device,

wherein the detection device is provided on a back side of the illumination device.

14. An illumination device with a detection function comprising:

the detection device according to claim 1 ; and

a light-transmitting illumination device,

wherein the detection device includes a light-transmitting region in an area other than an area provided with the photodiodes and is provided on a back side of the illumination device.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2025
From: JAPAN DISPLAY INC.
To: MAGNOLIA WHITE CORPORATION
Reel/Frame 071793/0491 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2023
From: KATSUTA, TADAYOSHI; OZEKI, YOSHITAKA
To: JAPAN DISPLAY INC.
Reel/Frame 062561/0347 →
Priority Claims (2)
JP 2020-132399 · Aug 4, 2020 · national
JP 2021-064983 · Apr 6, 2021 · national
Continuity (2)
Continuation PCTJP2021021080 · Jun 2, 2021
Related Publication 20230178674A1 · Jun 8, 2023
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