Systems and methods for testing and measuring compounds

1. A water testing and measuring system, comprising:

a water generator configured to generate water by extracting water vapor from ambient air;

a compound generator configured to apply a compound to the water generated by the water generator;

a measurement device comprising:

a first and second reference electrode assembled on a first circuit as a reference pair; and

a first sensor electrode;

and

a microcontroller configured to:

apply a current to the first and second reference electrodes on the first circuit to electrolyze the water generated by the water generator, wherein the current is applied to the first and second reference electrodes but not to the first sensor electrode;

measure a reference voltage between the reference pair of the first circuit indicating a reference potential of electrolysis of the water generated by the water generator;

measure a first sense voltage between the first sensor electrode and the first reference electrode indicating a potential of the water generated by the water generator;

receive the reference voltage and the first sense voltage;

determine a concentration measurement in the water generated by the water generator based on a voltage difference between the reference voltage and the first sense voltage; and

control the compound generator to apply the compound to the water generated by the water generator based on the concentration measurement to ensure that the water generated by the water generator is tested safe.

2. The water testing and measuring system of claim 1 , wherein the first sense voltage indicating the potential of the water relates to: a pH potential, or an ion concentration chemical potential of the water generated by the water generator.

3. The water testing and measuring system of claim 1 , wherein the microcontroller is further configured to control the compound generator by increasing or decreasing the concentration of the compound in the water generated by the water generator based on the concentration measurement.

4. The water testing and measuring system of claim 1 , wherein the microcontroller is further configured to control the compound generator by activating the compound generator if the concentration measurement reaches a first specified threshold and deactivating the compound generator if the concentration measurement reaches a second specified threshold.

5. The water testing and measuring system of claim 4 , wherein the microcontroller is further configured to determine the first specified threshold indicates that the compound should be applied to reduce a concentration of microbial life in the water generated by the water generator, and the second specified threshold indicates a concentration of the compound in the water generated by the water generator is sufficient.

6. The water testing and measuring system of claim 4 , wherein the microcontroller is further configured to, in response to reaching the second specified threshold, implement a timeout period during which the measurement device does not measure the reference voltage or the first sense voltage.

7. The water testing and measuring system of claim 6 , wherein a duration of the timeout period is about one hour or less.

8. The water testing and measuring system of claim 1 , wherein the microcontroller is further configured to control the compound generator in a closed loop control technique in which the microcontroller is configured to:

activate the compound generator to maintain the concentration measurement at a first concentration measurement threshold; and

deactivate, in response to reaching a second concentration measurement threshold, one or more of the measurement device and the compound generator.

9. The water testing and measuring system of claim 1 , wherein the microcontroller is further configured to:

compare the concentration measurement to a library of pre-stored conditions; and

control the compound generator based on the comparison of the concentration measurement to the library of the pre-stored conditions.

10. The water testing and measuring system of claim 1 , wherein the microcontroller is further configured to provide a constant current of about 1 μA to about 10 μA of current to the first circuit.

11. The water testing and measuring system of claim 1 , wherein the water generator, the compound generator, the microcontroller and the measurement device are in communication with each other over a network.

12. The water testing and measuring system of claim 1 , further comprising a computing device in communication with the measurement device, the compound generator and the water generator; the computing device being configured to:

monitor data measured by the measurement device; and

transmit control commands to the measurement device, the compound generator and the water generator.

13. The water testing and measuring system of claim 1 , wherein the first reference electrode, the second reference electrode and the first sensor electrode are each constructed of a similar metal that is stable under the conditions applied to the measurement device when submerged in the water generated by the water generator.

14. The water testing and measuring system of claim 1 , wherein the first reference electrode, the second reference electrode and the first sensor electrode are each constructed of a similar metal.

15. The water testing and measuring system of claim 1 , wherein the first reference electrode, the second reference electrode and the first sensor electrode are each constructed of a metal, or a glass-like carbon.

16. The water testing and measuring system of claim 1 , wherein the measurement device further comprises a temperature measurement component that is configured to measure a second sense voltage indicating a temperature of the water generated by the water generator.

17. The water testing and measuring system of claim 1 , wherein the measurement device is configured to operate in a reverse polarization mode during which a constant current applied to the water is reversed to produce a reaction on the first reference electrode and the second reference electrode.

18. The water testing and measuring system of claim 1 , wherein the measurement device further comprises a third reference electrode that is paired on a second circuit with the first sensor electrode.

19. The water testing and measuring system of claim 1 , wherein the microcontroller is further configured to:

short the first reference electrode and the first sensor electrode to an electrical ground, thereby applying a reducing potential to purge a surface of the first reference electrode and a surface of the first sensor electrode of the compound;

cease an electrical current to the first sensor electrode such that current is applied to the first and second reference electrodes but not to the first sensor electrode.

20. The water testing and measuring system of claim 1 , wherein the first sensor electrode, after being shorted and/or purged of all or substantially all oxidizing compounds on its surface, may begin again to be oxidized by the compound present in the water.

21. The water testing and measuring system of claim 20 , wherein the microcontroller is further configured to determine the concentration measurement in the water based on a maximum of the first sense voltage and a time to reach the maximum of the first sense voltage.

22. The water testing and measuring system of claim 20 , wherein the microcontroller is further configured to determine a concentration measurement of microbes in the water based on a slope of the first sense voltage versus time after purging the surface of the first sensor electrode indicating a recovery of the first sense voltage.