Spin-orbit torque memory devices
View Patent ↗Spin-orbit torque magnetoresistive random access memory (SOT MRAM) devices are provided. Each of the SOT MRAM devices integrates a SOT layer and an interconnect layer at a same metal level using a topological conductor (i.e., a topological metal or a topological semimetal) as both the interconnect layer and the SOT layer. The SOT MRAM devices further include a magnetic tunnel junction (MTJ) structure contacting the SOT layer, and a contact structure contacting the MTJ structure.
1 . A memory structure comprising:
a spin-orbit torque (SOT) layer and an interconnect layer located at a same metal level of a back-end-of-the-line (BEOL) structure, wherein both the spin-orbit torque (SOT) layer and the interconnect layer are composed of a topological conductor;
a magnetic tunnel junction (MTJ) structure having a magnetic free layer forming an interface with the SOT layer;
a MTJ contact structure contacting the MTJ structure; and
an encapsulation liner located along a sidewall of the MTJ structure and a sidewall of the MTJ contact structure, and in direct contact with both the SOT layer and the interconnect layer.
2 . The memory structure of claim 1 , wherein the topological conductor comprises a material selected from a metal or semimetal, wherein the metal or semimetal has bandstructure protected conducting surface states with the surface conductivity that is greater than the bulk conductivity of the metal or semimetal.
3 . The memory structure of claim 2 , wherein the topological conductor comprises a Weyl semimetal, a multi-fold fermion semimetal, a magnetic Weyl semimetal, a Kramers-Weyl fermion semimetal or a triple-point topological metal.
4 . The memory structure of claim 1 , wherein the MTJ structure comprises, from bottom to top, the magnetic free layer, a tunnel barrier layer, a magnetic reference layer, and an electrode layer.
5 . The memory structure of claim 1 , wherein the MTJ structure comprises, from bottom to top, an electrode layer, a magnetic reference layer, a tunnel barrier layer, and the magnetic free layer.
6 . The memory structure of claim 1 , wherein the MTJ contact structure is composed of an electrically conductive metal, an electrically conductive metal alloy or another topological conductor.
7 . The memory structure of claim 1 , wherein the SOT layer and the interconnect layer are spaced apart by an interconnect dielectric layer.
8 . The memory structure of claim 1 , further comprising a SOT contact structure electrically connected to the SOT layer by a via structure.
9 . The memory structure of claim 8 , wherein the SOT contact structure comprises an electrically conductive metal, an electrically conductive metal alloy or another topological conductor, wherein the another topological conductor is compositionally the same as or compositionally different from the topological conductor that provides the SOT layer and the interconnect layer.
10 . The memory structure of claim 1 , further comprising a SOT contact structure electrically connected to the SOT layer by a via portion of the SOT contact structure.
11 . The memory structure of claim 10 , wherein the SOT contact structure comprises an electrically conductive metal, an electrically conductive metal alloy or another topological conductor, wherein the another topological conductor is compositionally the same as or compositionally different from the topological conductor that provides the SOT layer and the interconnect layer.
12 . The memory structure of claim 1 , further comprising at least one via structure contacting a bottommost surface of the SOT layer.
13 . The memory structure of claim 12 , wherein the at least one via structure is composed of an electrically conductive metal, electrically conductive material alloy or another topological conductor, wherein the another topological conductor is compositionally the same as or compositionally different from the topological conductor that provides the SOT layer and the interconnect layer.
14 . The memory structure of claim 1 , further comprising a via structure located beneath the interconnect layer.
15 . The memory structure of claim 1 , wherein the SOT layer is electrically connected to a source/drain region of a transistor.
16 . A memory structure comprising:
a spin-orbit torque (SOT) layer and an interconnect layer located at a same metal level of a back-end-of-the-line (BEOL) structure, wherein both the SOT layer and the interconnect layer are composed of a topological conductor, wherein the SOT layer further comprises at least one via portion that is located on a side of the SOT layer that is opposite the side of the SOT layer that contacts the MTJ structure, the SOT layer and the at least one via portion are both composed of the topological conductor;
a magnetic tunnel junction (MTJ) structure having a magnetic free layer forming an interface with the SOT layer; and
a MTJ contact structure contacting the MTJ structure.
17 . A structure comprising:
a memory device region comprising a memory structure located therein, the memory structure comprises a spin-orbit torque (SOT) layer and an interconnect layer located at a same metal level of a back-end-of-the-line (BEOL) structure, wherein both the spin-orbit torque (SOT) layer and the interconnect layer are composed of a topological conductor, a magnetic tunnel junction (MTJ) structure having a magnetic free layer forming an interface with the SOT layer, and a MTJ contact structure contacting the MTJ structure; and
a non-memory device region located adjacent to the memory device region, the non-memory device region comprises another interconnect layer, wherein the another interconnect layer is located at the same metal level as both the SOT layer and the interconnect layer, and the another interconnect layer is composed of the topological conductor.
18 . The structure of claim 17 , wherein the topological conductor comprises a material selected from a metal or semimetal, wherein the metal or semimetal has bandstructure protected conducting surface states with the surface conductivity that is greater than the bulk conductivity of the metal or semimetal.
19 . The structure of claim 18 , wherein the topological conductor comprises a Weyl semimetal, a multi-fold fermion semimetal, a magnetic Weyl semimetal, a Kramers-Weyl fermion semimetal or a triple-point topological metal.
20 . The structure of claim 17 , wherein the SOT layer is electrically connected to a source/drain region of a transistor located in the memory device region, and the another interconnect layer is electrically connected to a source/drain region of a transistor located in the non-memory device region.