Dynamic profilometric imaging using multiscale patterns
A system for dynamic profilometric imaging using multiscale pattern(s) is described. The system may include a projector that projects a multiscale pattern on an environment including a target of interest. The system may also include an imaging sensor that receives reflections of the projected multiscale pattern from the target of interest. The system may further include a controller of the camera and the projector which performs profilometric imaging of the target of interest by dynamically adjusting an operational parameter of the camera, the projector, and/or the controller. The multiscale pattern(s) may contain useful features at multiple scales and/or may be optimal at predetermined depths and/or resolutions. By dynamically adjusting the operational parameter, such a profilometric imaging system may perform there-dimensional (3D) scene reconstruction while maintaining optimal performance, power efficiency and profilometric resolution.
1. A system, comprising:
a projector to project a beam comprising a plurality of multiscale patterns on a plurality of spectral channels;
an image sensor comprising a pixel array to receive reflections of the projected plurality of multiscale patterns, the pixel array comprising at least one superpixel, wherein the at least one superpixel comprises a plurality of sub-pixels, and the plurality of sub-pixels comprises:
a first sub-pixel sensitive to a first spectral band, and
a second sub-pixel sensitive to a second spectral band; and
a controller, communicatively coupled to the projector and the image sensor, the controller to perform profilometric imaging of a target object by dynamically adjusting at least one operational parameter of the image sensor, the projector, or the controller.
2. The system of claim 1 , wherein the controller is further to determine at least one of the at least one operating parameter or a value of the at least one operating parameter.
3. The system of claim 2 , wherein the controller is further to perform an initial evaluation of at least one of the target object or an environment of the target object to determine the at least one of the at least one operating parameter or a value of the at least one operating parameter.
4. The system of claim 1 , wherein
the projector is to project the beam by pulsing the projected beam,
the at least one operational parameter is a timing of the pulsing of the projector, and
the timing of the pulsing is dynamically adjusted to perform the profilometric imaging of the target object.
5. The system of claim 4 , wherein:
the plurality of multiscale patterns comprises at least one speckle pattern, and
the timing of the pulsing is dynamically adjusted thereby changing a resolution of the at least one speckle pattern.
6. The system of claim 1 , wherein the plurality of multiscale patterns comprises at least one of a fractal multiscale pattern or a plurality of fractal multiscale patterns.
7. The system of claim 6 , wherein the plurality of fractal multiscale patterns is a fractal series of multiscale patterns.
8. The system of claim 1 , wherein
the projector comprises at least one mechanical component and at least one electronic component, and
the at least one operational parameter comprises a parameter of the at least one mechanical component.
9. The system of claim 8 , wherein the projector comprises at least one of a micro-electromechanical system (MEMS), a micro-optoelectronic system (MOEMS), a spatial light modulator, a deformable mirror, a galvanometric scanner, or an acousto-optic scanner.
10. A method for profilometric imaging, comprising:
projecting, by a color projector, a beam comprising a plurality of multiscale patterns;
receiving, by a color camera, reflections of the projected plurality of multiscale patterns, wherein the color camera comprises a pixel array comprising at least one superpixel, the at least one superpixel comprises a plurality of sub-pixels, wherein the plurality of sub-pixels comprises:
first sub-pixel sensitive to a first spectral band, and
a second sub-pixel sensitive to a second spectral band; and
performing profilometric imaging of a target object by dynamically adjusting at least one operating parameter of a profilometric imaging device, based at least on the projected plurality of multiscale patterns and the received reflections.
11. The method for profilometric imaging of claim 10 , further comprising:
determining the at least one operating parameter.
12. The method for profilometric imaging of claim 10 , further comprising:
pulsing the projected beam; and
performing the profilometric imaging of the target object by dynamically adjusting a timing of the pulsing.
13. The method of profilometric imaging of claim 10 , wherein the projected plurality of multiscale patterns comprises a fractal series of multiscale patterns, further comprising:
determining at least one multiscale pattern in the fractal series of multiscale patterns to provide three-dimensional (3D) information regarding the target object,
wherein the profilometric imaging of the target object is performed by dynamically adjusting to project only the determined at least one multiscale pattern.
14. The method of profilometric imaging of claim 10 , wherein the color projector comprises at least one mechanical component and at least one electronic component, and wherein the profilometric imaging of the target object is performed by dynamically adjusting the at least one parameter of the at least one mechanical component of the color projector.
15. A near-eye display device, comprising:
a display; and
a profilometric imaging system comprising:
a color projector to project a beam comprising a plurality of multiscale patterns; and
a color image sensor to receive reflections of the projected plurality of multiscale patterns, wherein the color image sensor comprises a pixel array comprising at least one superpixel, the at least one superpixel comprises a plurality of sub-pixels, wherein the plurality of sub-pixels comprises:
first sub-pixel sensitive to a first spectral band, and
a second sub-pixel sensitive to a second spectral band; and
a controller to perform profilometric imaging of a target object by dynamically adjusting at least one operating parameter of the profilometric imaging system, based at least on the projected plurality of multiscale patterns and the received reflections.
16. The near-eye display device of claim 15 , wherein the color projector and the color image sensor are inward-facing.
17. The near-eye display device of claim 15 , wherein the color projector and the color image sensor are outward-facing.
18. The near-eye display device of claim 15 , wherein the controller is further to determine at least one of the at least one operating parameter or a value of the at least one operating parameter.
19. The near-eye display device of claim 18 , wherein the controller is further to perform an initial evaluation of at least one of the target object or an environment of the target object to determine the at least one of the at least one operating parameter or a value of the at least one operating parameter.
20. The method for profilometric imaging of claim 10 , further comprising:
determining at least one of the at least one operating parameter or a value of the at least one operating parameter.