Granted Patent B2

US 12,385,854 · App. 18/149,401 · Granted Aug 12, 2025

Inventor: Dan-Cristian Dinca (Chelmsford, MA)

Assignee: Rapiscan Holdings, Inc.

G01N23/04G01V5/224

Abstract

Claims (49)

1. A method of performing an on-the-fly adjustment of calibration data corresponding to an X-ray inspection system that comprises an X-ray source in data communication with a computing device, the method being implemented in the computing device having one or more physical processors programmed with a plurality of program instructions that, when executed by the one or more physical processors, cause the computing device to perform the method, the method comprising:

generating, by the X-ray inspection system, a first plurality of calibration data, wherein the first plurality of calibration data is stored in a memory in data communication with the computing device;

generating, using the X-ray inspection system, data representative of X-ray scan image of a cargo container;

segmenting data representative of the X-ray scan image into a plurality of regions of interest, wherein at least some of the plurality of regions of interest contain only one type of material having at least one of a known effective atomic number (Zeff) or a known identification code;

determining, using the first plurality of calibration data, first data indicative of Zeff of the at least some of the plurality of regions of interest;

comparing the first data with second data indicative of Zeff corresponding to the known Zeff or known identification code;

adjusting the first plurality of calibration data to generate a second plurality of calibration data if the first data and the second data differ more than a predefined threshold; and

using the second plurality of calibration data to process the data representative of the X-ray scan image to generate and display the processed X-ray scan image.

2. The method of claim 1 , further comprising:

calculating a Zeff value for each pixel in the X-ray scan image;

applying a smoothing function to the Zeff values of multiple pixels, associated with each of the plurality of regions of interest, in order to generate smoothed Zeff-based regions of interest;

applying a predefined color map to the smoothed Zeff-based regions of interest to generate a color-cded X-ray scan image; and

displaying the color-coded X-ray scan image.

3. The method of claim 2 , wherein the Zeff value for each pixel is calculated using the second plurality of calibration data if the first data and the second data differ more than the predefined threshold, and wherein the Zeff value for each pixel is calculated using the first plurality of calibration data if the first data and the second data do not differ more than the predefined threshold.

4. The method of claim 2 , wherein the smoothing function comprises at least one a simple running average function, a shape preserving smoothing filter function, an image-guided segmentation function or K-means clustering function.

5. The method of claim 1 , wherein the at least some of the plurality of regions of interest correspond to one or more empty regions of the cargo container or one or more unobstructed regions of the cargo container.

6. The method of claim 1 , wherein at least one of the plurality of regions of interest corresponds to of a volume encompassing only a top surface of the cargo container, a volume encompassing only a front end of the cargo container.

7. The method of claim 1 , wherein the first plurality of calibration data is generated by:

placing, between a radiation source and detectors of the X-ray inspection system, a set of materials with known atomic numbers and densities, wherein the set of materials have different thicknesses; and

recording responses of the detectors for each material of the set of materials.

8. The method of claim 7 , wherein the X-ray scan image represents recorded data corresponding to both low and high energies of the radiation source.

9. The method of claim 1 , wherein at least one of the plurality of regions of interest corresponds to a volume encompassing only a front end of the cargo container.

10. The method of claim 1 , wherein at least one of the plurality of regions of interest corresponds to a volume encompassing only a rear end of the cargo container.

11. An X-ray inspection system comprising:

a radiation source;

an array of detectors;

a computing device in data communication with the radiation source and the array of detectors, wherein the computing device has one or more physical processors programmed with a plurality of program instructions that, when executed by the one or more physical processors, cause the computing device to:

generate a first plurality of calibration data, wherein the first plurality of calibration data are stored in a memory associated with the computing device;

generate, using data detected by the array of detectors, an X-ray scan image of a cargo container;

segment the X-ray scan image into a plurality of regions of interest, wherein at least some of the plurality of regions of interest contain a single type of a material associated with a known atomic number or a single type of a material associated with a known identification code;

determine, using the first plurality of calibration data, first data indicative of a first effective atomic number of the single type of the material associated with the known atomic number or a second effective atomic number of the single type of the material associated with the known identification code for at least some of the plurality of regions of interest;

compare the first data with second data indicative of a known effective atomic number corresponding to the material associated with the known atomic number or a known effective atomic number corresponding to the material associated with the known identification code;

adjust the first plurality of calibration data to generate a second plurality of calibration data if the first data and the second data differ more than a predefined amount; and

replace the first plurality of calibration data by the second plurality of calibration data in the memory.

12. The X-ray inspection system of claim 9 , wherein the plurality of program instructions, when executed by the one or more physical processors, further cause the computing device to:

calculate an effective atomic number value for each pixel in the X-ray scan image;

apply a smoothing functionalgorithm to the effective atomic number values of multiple pixels, associated with each the at least some of the plurality of regions of interest, in order to generate smoothed effective atomic number-based regions of interest;

apply a predefined color map to the smoothed effective atomic number-based regions of interest to generate a color-coded X-ray scan image; and

display the color-coded X-ray scan image.

13. The X-ray inspection system of claim 12 , wherein the effective atomic number value for each pixel is calculated using the second plurality of calibration data if the first data and the second data differ more than the predefined amount, and wherein the effective atomic number value for each pixel is calculated using the first plurality of calibration data if the first data and the second data do not differ more than the predefined amount.

14. The X-ray inspection system of claim 12 , wherein the smoothing function includes at least one of a simple running averages, shape preserving smoothing filter function, an image-guided segmentation function or a K-means clustering function.

15. The X-ray inspection system of claim 11 , wherein at least some of the plurality of regions of interest are empty or unobstructed.

16. The X-ray inspection system of claim 9 , wherein at least one of the plurality of regions of interest corresponds to a volume encompassing only a top surface of the cargo container.

17. The X-ray inspection system of claim 9 , wherein the first plurality of calibration data is generated by:

placing, between the radiation source and the array of detectors, set of materials with known atomic numbers and densities, wherein the set of materials have different thicknesses; and

recording a response of the array of detectors for each material in the set of materials.

18. The X-ray inspection system of claim 15 , wherein the X-ray scan image comprises data representative low and high energies of the radiation source.

19. The X-ray inspection system of claim 11 , wherein at least one of the plurality of regions of interest corresponds to a volume encompassing only a front end of the cargo container.

20. The X-ray inspection system of claim 11 , wherein at least one of the plurality of regions of interest corresponds to a volume encompassing only a rear end of the cargo container.

Assignments (2)

Continuity (2)

References Cited (400)