IP Library Granted Patent US 12,346,580
Granted Patent B2
US 12,346,580 · App. 18/178,313 · Granted Jul 1, 2025

Systems and methods for managing metric data

Inventors: Behrooz Badii (Westport, CT); Yann Thomas Ramin (Folsom, CA)
Assignee: BITDRIFT, INC.
G06F3/0626G06F3/0653G06F3/0673
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,346,580
App. No.
18/178,313
Granted
Jul 1, 2025
Kind
B2
Abstract

A computing platform may be configured to (i) receive metric data for a metric that was produced by a metric producer, (ii) identify a metric handling rule that applies to the metric, wherein the identified metric handling rule comprises a handling action of storing metric data for the metric in a specified storage location (e.g., a different tier of a multi-tier storage architecture), and (iii) handle the received metric data for the metric in accordance with the identified metric handling rule by storing the received metric data in the specified storage location.

Claims (41)

1. A method implemented by a computing platform, the method comprising:

analyzing past utilization of a metric based on (i) read activity information for the metric, (ii) write activity information for the metric, and (iii) query activity information for the metric;

based on the analyzing, determining a predicted likelihood that metric data for the metric will be utilized in the future;

using the predicted likelihood to facilitate creation of a metric handling rule comprising a handling action of storing metric data for the metric in a specified storage location;

receiving metric data for the metric that was produced by a metric producer;

determining that the metric handling rule applies to the metric; and

handling the received metric data for the metric in accordance with the metric handling rule by storing the received metric data in the specified storage location.

2. The method of claim 1 , wherein the computing platform comprises a multi-tier storage architecture, and wherein the specified storage location comprises a specified tier of the multi-tier storage architecture.

3. The method of claim 2 , wherein a default storage location for metric data comprises a first tier of the multi-tier storage architecture, and wherein the specified tier of the multi-tier storage architecture comprises a second tier of the multi-tier storage architecture that differs from the first tier.

4. The method of claim 3 , wherein the first tier comprises a hot tier of the multi-tier storage architecture and the second tier comprises a cold tier of the multi-tier storage architecture.

5. The method of claim 1 , wherein the metric handling rule further comprises a handling action of sampling metric data for the metric according to a given sampling rate.

6. The method of claim 1 , wherein the metric handling rule further comprises a handling action of compressing metric data for the metric.

7. The method of claim 1 , wherein the metric handling rule further comprises a handling action of conditionally storing metric data for the metric based on a comparison to previously-stored metric data for the metric.

8. The method of claim 1 , wherein the metric handling rule comprises a metric handling rule for a set of multiple metrics that encompasses the metric.

9. A non-transitory computer-readable medium comprising program instructions stored thereon that are executable to cause a computing platform to perform functions comprising:

analyzing past utilization of a metric based on (i) read activity information for the metric, (ii) write activity information for the metric, and (iii) query activity information for the metric;

based on the analyzing, determining a predicted likelihood that metric data for the metric will be utilized in the future;

using the predicted likelihood to facilitate creation of a metric handling rule comprising a handling action of storing metric data for the metric in a specified storage location;

receiving metric data for the metric that was produced by a metric producer;

determining that the metric handling rule applies to the metric; and

handling the received metric data for the metric in accordance with the metric handling rule by storing the received metric data in the specified storage location.

10. The non-transitory computer-readable medium of claim 9 , wherein the computing platform comprises a multi-tier storage architecture, and wherein the specified storage location comprises a specified tier of the multi-tier storage architecture.

11. The non-transitory computer-readable medium of claim 10 , wherein a default storage location for metric data comprises a first tier of the multi-tier storage architecture, and wherein the specified tier of the multi-tier storage architecture comprises a second tier of the multi-tier storage architecture that differs from the first tier.

12. The non-transitory computer-readable medium of claim 11 , wherein the first tier comprises a hot tier of the multi-tier storage architecture and the second tier comprises a cold tier of the multi-tier storage architecture.

13. The non-transitory computer-readable medium of claim 9 , wherein the metric handling rule further comprises a handling action of sampling metric data for the metric according to a given sampling rate.

14. The non-transitory computer-readable medium of claim 9 , wherein the metric handling rule further comprises a handling action of compressing metric data for the metric.

15. The non-transitory computer-readable medium of claim 9 , wherein the metric handling rule further comprises a handling action of conditionally storing metric data for the metric based on a comparison to previously-stored metric data for the metric.

16. A computing platform comprising:

at least one processor;

at least one non-transitory computer-readable medium; and

program instructions stored on the at least one non-transitory computer-readable medium that are executable by the at least one processor such that the computing platform is configured to:

analyze past utilization of a metric based on (i) read activity information for the metric, (ii) write activity information for the metric, and (iii) query activity information for the metric;

based on the analyzing, determine a predicted likelihood that metric data for the metric will be utilized in the future;

use the predicted likelihood to facilitate creation of a metric handling rule comprising a handling action of storing metric data for the metric in a specified storage location;

receive metric data for the metric that was produced by a metric producer;

determine that the metric handling rule applies to the metric; and

handle the received metric data for the metric in accordance with the metric handling rule by storing the received metric data in the specified storage location.

17. The computing platform of claim 16 , further comprising a multi-tier storage architecture, wherein the specified storage location comprises a specified tier of the multi-tier storage architecture.

18. The computing platform of claim 17 , wherein a default storage location for metric data comprises a first tier of the multi-tier storage architecture, and wherein the specified tier of the multi-tier storage architecture comprises a second tier of the multi-tier storage architecture that differs from the first tier.

19. The computing platform of claim 18 , wherein the first tier comprises a hot tier of the multi-tier storage architecture and the second tier comprises a cold tier of the multi-tier storage architecture.

20. The computing platform of claim 16 , wherein the metric handling rule further comprises one or more of (i) a handling action of sampling metric data for the metric according to a given sampling rate, (ii) a handling action of compressing metric data for the metric, or (iii) a handling action of conditionally storing metric data for the metric based on a comparison to previously-stored metric data for the metric.

Assignments (3)
CHANGE OF NAME Recorded Nov 30, 2023
From: CONTRAST LABS, INC.
To: BITDRIFT, INC.
Reel/Frame 065723/0172 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2023
From: LYFT, INC.
To: CONTRAST LABS, INC.
Reel/Frame 064316/0960 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2023
From: BADII, BEHROOZ; RAMIN, YANN THOMAS
To: LYFT, INC.
Reel/Frame 063197/0886 →