INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND RECORDING MEDIUM
An information processing apparatus performs electromagnetic field analysis over a plurality of stages. The information processing apparatus includes a hardware processor connected to a memory. The hardware processor sequentially selects an analysis target and determines one or more analysis regions in the analysis target. The one or more analysis regions are determined on the basis of a parameter relative to mutual influence between structures included in the analysis target. The hardware processor performs electromagnetic field analysis on the one or more analysis regions. The structures include a first structure and a second structure. At least one of the one or more analysis regions includes an entirety of the first structure and part of the second structure.
1 . An information processing apparatus performing electromagnetic field analysis over a plurality of stages, the information processing apparatus comprising
a hardware processor connected to a memory and configured to:
sequentially select an analysis target;
determine one or more analysis regions in the analysis target, the one or more analysis regions being determined on the basis of a parameter relative to mutual influence between structures included in the analysis target; and
perform electromagnetic field analysis on the one or more analysis regions, wherein
the structures include a first structure and a second structure, and
at least one of the one or more analysis regions includes an entirety of the first structure and part of the second structure.
2 . The information processing apparatus according to claim 1 , wherein the parameter includes at least one of: frequencies of signals emitted by the structures, power consumption of the structure, a distance between the first structure and the second structure, a material of the structure, and a self-resonant frequency of the structure.
3 . The information processing apparatus according to claim 2 , wherein the parameter further includes a ground condition indicating a size and a shape of a ground of one of the structures serving as a signal source.
4 . The information processing apparatus according to claim 1 , wherein the hardware processor is configured to determine, on the basis of the parameter, respective sizes of the analysis regions, boundary conditions indicating states of respective boundary portions of the analysis regions, and mesh conditions including respective mesh fineness of the analysis regions.
5 . The information processing apparatus according to claim 1 , wherein the hardware processor is configured to determine, on the basis of the parameter, respective sizes of the analysis regions, boundary conditions indicating states of respective boundary portions of the analysis regions, and mesh conditions including respective mesh fineness of the analysis regions.
6 . The information processing apparatus according to claim 3 , wherein the hardware processor is configured to determine, on the basis of the parameter, respective sizes of the analysis regions, boundary conditions indicating states of respective boundary portions of the analysis regions, and mesh conditions including respective mesh fineness of the analysis regions.
7 . The information processing apparatus according to claim 4 , wherein the hardware processor is further configured to output an analysis result of the electromagnetic field analysis.
8 . The information processing apparatus according to claim 7 , wherein the hardware processor is configured to perform control a display device to display information indicating the respective sizes of the analysis regions.
9 . The information processing apparatus according to claim 8 , wherein the hardware processor is configured to perform control the display device to display information indicating the boundary conditions together with the information indicating the respective sizes of the analysis regions.
10 . The information processing apparatus according to claim 8 , wherein the hardware processor is configured to perform control the display device to display information indicating the mesh conditions together with the information indicating the respective sizes of the analysis regions.
11 . The information processing apparatus according to claim 9 , wherein the hardware processor is configured to perform control the display device to display information indicating the mesh conditions together with the information indicating the respective sizes of the analysis regions.
12 . An information processing method implemented by an information processing apparatus performing electromagnetic field analysis over a plurality of stages, the information processing method comprising:
sequentially selecting an analysis target;
determining one or more analysis regions in the analysis target, the one or more analysis regions being determined on the basis of a parameter relative to mutual influence between structures included in the analysis target; and
performing electromagnetic field analysis on the one or more analysis regions, wherein
the structures include a first structure and a second structure, and
at least one of the one or more analysis regions includes an entirety of the first structure and part of the second structure.
13 . A non-transitory computer-readable recording medium on which programmed instructions are recorded, the instructions causing a computer to execute processing, the computer being included in an information processing apparatus performing electromagnetic field analysis over a plurality of stages, the processing executed by the computer comprising:
sequentially selecting an analysis target;
determining one or more analysis regions in the analysis target, the one or more analysis regions being determined on the basis of a parameter relative to mutual influence between structures included in the analysis target; and
performing electromagnetic field analysis on the one or more analysis regions, wherein
the structures include a first structure and a second structure, and
at least one of the one or more analysis regions includes an entirety of the first structure and part of the second structure.