IP Library Granted Patent US 12,231,178
Granted Patent B2
US 12,231,178 · App. 18/227,476 · Granted Feb 18, 2025

Over-the-air calibration of antenna system

Inventors: David Francois Jacquet (Vaulnaveys le Haut, FR); Masoud Kahrizi (Irvine, CA); Robert Baummer, Jr. (Redmond, WA); Jean-Noel Rozec (Pontoise, FR); Fabrice Jean André Belvèze (Claix, FR); Paul Lee Pearson (Biviers, FR); Francois Lucien Emile Icher (Grenoble, FR); Marc Gens (Saint Martin d'Uriage, FR); Pascal Triaire (Jarrie, FR)
Assignee: Space Exploration Technologies Corp.
H04B17/11H01Q3/2617H01Q3/38H01Q3/42H04B1/0082H04B1/38H04B17/12H04B17/19
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Quick Facts
Patent No.
US 12,231,178
App. No.
18/227,476
Granted
Feb 18, 2025
Kind
B2
Abstract

In an embodiment, an apparatus includes a first baseband section to receive a calibration signal; a first radio frequency (RF) section configured to generate a RF calibration signal based on modulating the calibration signal. The calibration signal comprises an orthogonal code based signal. The apparatus includes a second RF section to receive the RF calibration signal and generate a received calibration signal based on demodulating the RF calibration signal; a calibration section; a first antenna electrically coupled to the first RF section and configured to transmit the RF calibration signal; and a second antenna electrically coupled to the second RF section and configured to receive the RF calibration signal. The calibration section is configured to determine one or more of gain, baseband delay, or RF delay to calibrate the first RF section; and the second antenna is switchable between receiving the RF calibration signal and transmitting an encoded data signal.

Claims (41)

1. An apparatus included in a communications system, the apparatus comprising:

a first baseband section configured to receive a calibration signal;

a first RF section configured to generate a RF calibration signal based on modulating the calibration signal, wherein the calibration signal comprises an orthogonal code based signal;

a second RF section configured to receive the RF calibration signal over-the-air and configured to generate a received calibration signal based on demodulating the RF calibration signal;

a calibration section;

a first antenna electrically coupled to the first RF section and configured to transmit the RF calibration signal; and

a second antenna electrically coupled to the second RF section and configured to receive the RF calibration signal, wherein:

the received calibration signal and a reference signal associated with the RF calibration signal comprise inputs to the calibration section;

the calibration section is configured to determine one or more of gain, baseband delay, or RF delay compensation values, based on the inputs, to calibrate the first RF section; and

the second antenna is switchable between receiving the RF calibration signal and transmitting an encoded data signal.

2. The apparatus of claim 1 , further comprising a waveform generator electrically coupled to the first baseband section and configured to generate and provide the calibration signal to the first baseband section.

3. The apparatus of claim 1 , wherein the calibration signal comprises a code division multiple access (CDMA) signal.

4. The apparatus of claim 1 , wherein calibration of the first RF section comprises one or more of gain, baseband delay, or RF delay offsets caused by one or both of the first RF section or the first antenna.

5. The apparatus of claim 1 , wherein the first and second antennas are included in a phased array antenna.

6. The apparatus of claim 1 , wherein the reference signal associated with the RF calibration signal comprises a combination of the calibration signal and an encoded data signal, wherein a data signal comprises a regular signal to be transmitted by the first RF section, and wherein the first baseband section is configured to encode the data signal to generate the encoded data signal and combine the encoded data signal with the calibration signal.

7. The apparatus of claim 1 , wherein the calibration section is configured to determine correlations based on the received calibration signal and one of the calibration signal or an output of the first baseband section associated with the RF calibration signal, wherein the calibration section is configured to determine initial gain and delay values based on the correlations, and wherein the calibration section is configured to determine a difference value based on the initial gain and delay values.

8. The apparatus of claim 7 , wherein if the difference value is within a pre-set value, then the initial gain and delay values comprise the one or more gain, baseband delay, or RF delay compensation values.

9. The apparatus of claim 7 , wherein if the difference value is greater than a pre-set value, then the calibration section is configured to iterate to determine new gain and delay values based on the initial gain and delay values, and wherein the calibration section is configured to determine a new difference value based on the new gain and delay values.

10. The apparatus of claim 9 , wherein if the new difference value is within the pre-set value, then the new gain and delay values comprise the one or more gain, baseband delay, or RF delay compensation values.

11. The apparatus of claim 9 , wherein if the new difference value is greater than the pre-set value, then the calibration section is configured to iterate to determine another new gain and delay values based on the new gain and delay values, and wherein the calibration section is configured to determine another new difference value based on the another new gain and delay values.

12. The apparatus of claim 1 , further comprising:

a second baseband section, wherein the second baseband section is configured to receive a second calibration signal; and

a third RF section wherein the third RF section is configured to generate a second RF calibration signal based on the second calibration signal, wherein:

the second calibration signal differs from the calibration signal in at least orthogonality;

the first RF section and the third RF section simultaneously transmit the RF calibration signal and the second RF calibration signal; and

the second RF section is configured to receive the second RF calibration signal over-the-air simultaneously with receiving the RF calibration signal, wherein the second RF section is configured to generate a received second calibration signal based on the second RF calibration signal.

13. The apparatus of claim 12 , wherein the received second calibration signal and a second reference signal associated with the second RF calibration signal comprise second inputs to the calibration section, and wherein the calibration section is configured to determine one or more of second gain, baseband delay, or RF delay compensation values, based on the second inputs, to calibrate the second RF section.

14. The apparatus of claim 1 , wherein the first RF section includes one or more IQ gain and phase compensators and one or more time delay filters, and wherein the one or more IQ gain and phase compensators is configured in accordance with the gain and RF delay compensation values and the one or more time delay filters is configured in accordance with the baseband delay compensation value to pre-compensate for gain and delay offsets associated with one or both of the first RF section or antenna electrically coupled to the first RF section.

15. The apparatus of claim 1 , wherein the reference signal comprises an output of the first baseband section.

16. The apparatus of claim 1 , wherein the reference signal comprises the calibration signal.

17. An apparatus included in a communications system, the apparatus comprising:

a baseband section configured to receive a calibration signal;

an RF section configured to generate a RF calibration signal based on modulating the calibration signal, wherein the calibration signal comprises an orthogonal code based signal, wherein the RF calibration signal is void of encoding by the baseband section;

a receive section configured to receive the RF calibration signal over-the-air, wherein the receive section includes a second RF section, wherein the second RF section is configured to generate a received calibration signal based on the RF calibration signal; and

a calibration section, wherein:

the received calibration signal and a reference signal associated with the RF calibration signal comprise inputs to the calibration section; and

the calibration section is configured to determine one or more of gain, baseband delay, or RF delay compensation values, based on the inputs, to calibrate the RF section.

18. The apparatus of claim 17 , further comprising:

wherein calibration of the receive section comprises one or more of gain, baseband delay, or RF delay offsets caused by one or both of the second RF section or an antenna coupled to the second RF section.

19. The apparatus of claim 18 , wherein the RF calibration signal is void of encoding by the baseband section.

20. The apparatus of claim 17 , wherein the calibration signal comprises a code division multiple access (CDMA) signal.

Assignments (7)
CERTIFICATE OF CONVERSION (STATE OF DELAWARE TO STATE OF TEXAS; NEW FILE NO.: 805421124; FILED : 02-14-2024) Recorded Feb 14, 2025
From: SPACE EXPLORATION TECHNOLOGIES CORP.
To: SPACE EXPLORATION TECHNOLOGIES CORP.
Reel/Frame 070631/0644 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2023
From: JACQUET, DAVID FRANCOIS; BELVÈZE, FABRICE JEAN ANDRÉ; PEARSON, PAUL LEE; GENS, MARC; ROZEC, JEAN-NOEL
To: STMICROELECTRONICS (GRENOBLE 2) SAS
Reel/Frame 064420/0175 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2023
From: ICHER, FRANCOIS LUCIEN EMILE; TRIAIRE, PASCAL
To: STMICROELECTRONICS (ALPS) SAS
Reel/Frame 064420/0293 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2023
From: KAHRIZI, MASOUD; BAUMMER, ROBERT, JR.
To: SPACE EXPLORATION TECHNOLOGIES CORP.
Reel/Frame 064420/0021 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2023
From: STMICROELECTRONICS (GRENOBLE 2) SAS
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 064420/0489 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2023
From: STMICROELECTRONICS INTERNATIONAL N.V.
To: SPACE EXPLORATION TECHNOLOGIES CORP.
Reel/Frame 064420/0601 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2023
From: STMICROELECTRONICS (ALPS) SAS
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 064420/0427 →
Continuity (4)
Continuation 17747895 · May 18, 2022
Continuation 15931443 · May 13, 2020
Provisional Application 62847873 · May 14, 2019
Related Publication 20230388029A1 · Nov 30, 2023
References Cited (53)
US 4651159A · Ness · 1987 [cited by applicant]
US 6690952B2 · Nishimori · 2004 [cited by examiner]
US 7079596B1 · Namura · 2006 [cited by applicant]
US 7116949B2 · Irie et al. · 2006 [cited by applicant]
US 7733991B2 · Ryter · 2010 [cited by applicant]
US 8045926B2 · Martikkala et al. · 2011 [cited by applicant]
US 8175538B1 · Chen et al. · 2012 [cited by applicant]
US 8862080B2 · Kishimoto · 2014 [cited by applicant]
US 9118111B2 · Naguib et al. · 2015 [cited by applicant]
US 9503302B2 · Lin · 2016 [cited by examiner]
US 9673916B2 · Mow et al. · 2017 [cited by applicant]
US 9800284B2 · Papadopoulos · 2017 [cited by examiner]
US 10484106B2 · Garcia et al. · 2019 [cited by applicant]
US 10805143B2 · Qian et al. · 2020 [cited by applicant]
US 11133875B2 · Wang · 2021 [cited by examiner]
US 11296409B1 · Yousefi et al. · 2022 [cited by applicant]
US 11322838B1 · Ramachandran et al. · 2022 [cited by applicant]
US 11431092B1 · Jacquet et al. · 2022 [cited by applicant]
US 11489252B2 · Yetisir · 2022 [cited by applicant]
US 11527833B1 · Yousefi et al. · 2022 [cited by applicant]
US 11729684B1 · Chen et al. · 2023 [cited by applicant]
US 11784408B2 · Yetisir · 2023 [cited by applicant]
US 20030214437A1 · Rawnick et al. · 2003 [cited by applicant]
US 20040048584A1 · Vaidyanathan et al. · 2004 [cited by applicant]
US 20040229592A1 · Matsui et al. · 2004 [cited by applicant]
US 20050281318A1 · Neugebauer · 2005 [cited by applicant]
US 20060058022A1 · Webster et al. · 2006 [cited by applicant]
US 20100066631A1 · Puzella et al. · 2010 [cited by applicant]
US 20100093282A1 · Martikkala et al. · 2010 [cited by applicant]
US 20100142590A1 · Hohne et al. · 2010 [cited by applicant]
US 20140242914A1 · Monroe · 2014 [cited by applicant]
US 20140364132A1 · Rey et al. · 2014 [cited by applicant]
US 20150139046A1 · Wang et al. · 2015 [cited by applicant]
US 20150382268A1 · Hampel et al. · 2015 [cited by applicant]
US 20160372828A1 · Geis et al. · 2016 [cited by applicant]
US 20170005408A1 · Gomadam et al. · 2017 [cited by applicant]
US 20170077613A1 · Banu et al. · 2017 [cited by applicant]
US 20170093539A1 · Wang · 2017 [cited by applicant]
US 20170117946A1 · Lee et al. · 2017 [cited by applicant]
US 20170324486A1 · Garcia et al. · 2017 [cited by applicant]
US 20180219637A1 · Mow et al. · 2018 [cited by applicant]
US 20190182023A1 · Banu et al. · 2019 [cited by applicant]
US 20200271747A1 · Wu et al. · 2020 [cited by applicant]
US 20200296635A1 · Rastegardoost et al. · 2020 [cited by applicant]
US 20200328789A1 · Pritsker et al. · 2020 [cited by applicant]
US 20220095179A1 · Qiao et al. · 2022 [cited by applicant]
US 20220353766A1 · Hunukumbure · 2022 [cited by applicant]
US 20220404462A1 · Bradstreet · 2022 [cited by applicant]
CA 2771852A1 · 2012 [cited by applicant]
EP 1286416B1 · 2009 [cited by applicant]
WO 2014129863A1 · 2014 [cited by applicant]
Ashok Agrawal et al., “A Calibration Technique for Active Phased Array Antennas”, John Hopkins University Applied Physics Laboratory, p. 223-228, IEEE, © 2003. [cited by applicant]
International Search Report and Written Opinion, dated Aug. 24, 2020, for PCT/US2020/032751 (12 pages). [cited by applicant]