Error analysis in a sensor
A method for analyzing a sensor with respect to unstable errors, wherein a gradient signal is generated based on a sensor signal. Based on the gradient signal, an evaluation unit is used to assign a slope category to a first slope of the sensor signal and a second slope of the sensor signal, the second slope following the first slope. The evaluation unit ascertains a class of error based on the slope categories assigned to the first slope and the second slope.
1 . A method for sensor error analysis for unstable errors, wherein a sensor outputs an analog sensor signal as a function of a measured variable, the method comprising:
generating a gradient signal as a function of the sensor signal;
assigning, by an evaluation unit, a flank category of a plurality of specified flank categories to a first flank of the sensor signal based on the gradient signal;
assigning, by the evaluation unit, a flank category of the plurality of flank categories to a second flank of the sensor signal based on the gradient signal, wherein the second flank follows the first flank; and
determining, by the evaluation unit, an error class as a function of the flank category assigned to the first flank and the flank category assigned to the second flank,
wherein:
the first flank is assigned to a first flank category of the plurality of flank categories only in response to the gradient signal exceeding a positive first gradient limiting value during the first flank; and
the second flank is assigned to the first flank category only in response to the gradient signal exceeding the first gradient limiting value during the second flank.
2 . The method of claim 1 , wherein:
the first flank is assigned to a second flank category of the plurality of flank categories only in response to the gradient signal falling below a negative second gradient limiting value during the first flank; and
the second flank is assigned to the second flank category only in response to the gradient signal falling below the second gradient limiting value during the second flank.
3 . The method of claim 2 , wherein:
the first flank is assigned to the first flank category only in response to the sensor signal exceeding a first signal limiting value during the first flank and/or the second flank is assigned to the first flank category only in response to the sensor signal exceeding the first signal limiting value during the second flank; and/or
the first flank is assigned to the second flank category only in response to the sensor signal falling below a second signal limiting value during the first flank and/or the second flank is assigned to the second flank category only in response to the sensor signal falling below the second signal limiting value during the second flank.
4 . The method of claim 2 , wherein the error class is determined to be an intermittent short circuit of a sensor signal output to a first reference potential terminal in response to the first flank being assigned to the first flank category and the second flank being assigned to the second flank category.
5 . The method of claim 4 , wherein the error class is determined to be an intermittent short circuit of the sensor signal output to a second reference potential terminal in response to the first flank being assigned to the second flank category and the second flank being assigned to the first flank category, wherein the first reference potential terminal and the second reference potential terminal are at different electrical reference potentials.
6 . The method of claim 2 , wherein:
the plurality of flank categories include at least three flank categories; and
the first flank is assigned to a third flank category of the at least three flank categories only in response to the gradient signal exceeding a positive third gradient limiting value and not exceeding the first gradient limiting value during the first flank.
7 . The method of claim 6 , wherein the error class is determined to be an intermittent open circuit of the signal output only in response to the first flank being assigned to the third flank category and the second flank being assigned to the second flank category.
8 . The method of claim 2 , wherein:
the plurality of flank categories include at least three flank categories; and
the first flank is assigned to a third flank category of the at least three flank categories only in response to the gradient signal falling below a negative fourth gradient limiting value and not falling below the second gradient limiting value during the first flank.
9 . The method of claim 8 , wherein the error class is determined to be an open circuit of the signal output in response to the first flank being assigned to the third flank category and the second flank being assigned to the first flank category.
10 . The method of claim 1 , wherein at least one diagnostic signal is generated as a function of a height of the first flank and/or a height of the second flank.
11 . The method of claim 10 , wherein the at least one diagnostic signal is generated as a function of the determined error class.
12 . A diagnostic device for sensor error analysis with respect to unstable errors, wherein the sensor outputs an analog sensor signal as a function of a measured variable, wherein the diagnostic device comprising:
a differentiator configured to generate a gradient signal as a function of the sensor signal; and
an evaluation unit configured to:
assign a flank category of a plurality of specified flank categories to a first flank of the sensor signal based on the gradient signal;
assign a flank category of the plurality of flank categories to a second flank, following the first flank, of the sensor signal based on the gradient signal; and
determine an error class as a function of the flank category assigned to the first flank and the flank category assigned to the second flank, wherein:
the first flank is assigned to a first flank category of the plurality of flank categories only in response to the gradient signal exceeding a positive first gradient limiting value during the first flank; and
the second flank is assigned to the first flank category only in response to the gradient signal exceeding the first gradient limiting value during the second flank.
13 . The diagnostic device of claim 12 , further comprising an integrator configured to generate a diagnostic signal by integration of the gradient signal during the first flank and/or during the second flank.
14 . A transportation vehicle having the diagnostic device of claim 13 .
15 . The diagnostic device of claim 12 , wherein the integrator generates the diagnostic signal as a function of the determined error type.
16 . The diagnostic device of claim 12 , wherein:
the first flank is assigned to a second flank category of the plurality of flank categories only in response to the gradient signal falling below a negative second gradient limiting value during the first flank; and
the second flank is assigned to the second flank category only in response to the gradient signal falling below the second gradient limiting value during the second flank.
17 . The diagnostic device of claim 16 , wherein:
the first flank is assigned to the first flank category only in response to the sensor signal exceeding a first signal limiting value during the first flank and/or the second flank is assigned to the first flank category only in response to the sensor signal exceeding the first signal limiting value during the second flank; and/or
the first flank is assigned to the second flank category only in response to the sensor signal falling below a second signal limiting value during the first flank and/or the second flank is assigned to the second flank category only in response to the sensor signal falling below the second signal limiting value during the second flank.
18 . The diagnostic device of claim 16 , wherein the error class is determined to be an intermittent short circuit of a sensor signal output to a first reference potential terminal in response to the first flank being assigned to the first flank category and the second flank being assigned to the second flank category.
19 . The diagnostic device of claim 18 , wherein the error class is determined to be an intermittent short circuit of the sensor signal output to a second reference potential terminal in response to the first flank being assigned to the second flank category and the second flank being assigned to the first flank category, wherein the first reference potential terminal and the second reference potential terminal are at different electrical reference potentials.
20 . The diagnostic device of claim 16 , wherein:
the plurality of flank categories include at least three flank categories; and
the first flank is assigned to a third flank category of the at least three flank categories only in response to the gradient signal exceeding a positive third gradient limiting value and not exceeding the first gradient limiting value during the first flank.
21 . The diagnostic device of claim 20 , wherein the error class is determined to be an intermittent open circuit of the signal output only in response to the first flank being assigned to the third flank category and the second flank being assigned to the second flank category.
22 . The diagnostic device of claim 16 , wherein:
the plurality of flank categories include at least three flank categories; and
the first flank is assigned to a third flank category of the at least three flank categories only in response to the gradient signal falling below a negative fourth gradient limiting value and not falling below the second gradient limiting value during the first flank.
23 . The diagnostic device of claim 22 , wherein the error class is determined to be an open circuit of the signal output in response to the first flank being assigned to the third flank category and the second flank being assigned to the first flank category.
24 . The diagnostic device of claim 12 , wherein at least one diagnostic signal is generated as a function of a height of the first flank and/or a height of the second flank.
25 . The diagnostic device of claim 24 , wherein the at least one diagnostic signal is generated as a function of the determined error class.
26 . The method of claim 1 , wherein an integrator generates a diagnostic signal by integration of the gradient signal during the first flank and/or during the second flank.
27 . The method of claim 26 , wherein the integrator generates the diagnostic signal as a function of the determined error type.