IP Library Patent Application 18282269
Patent Application
App. No. 18/282,269

COPPER PARTICLES AND METHOD FOR MANUFACTURING SAME

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Quick Facts
Patent No.
US None
App. No.
18/282,269
Abstract

Copper particles are provided mainly containing a copper element. In the copper particles, a ratio (S1/B) of a first crystallite size S1 to a particle size B is 0.23 or less, where the first crystallite size is obtained using Scherrer equation from a full width at half maximum of a peak derived from ( 111 ) plane of copper in X-ray diffraction measurement, and the particle size is calculated from a BET specific surface area. In the copper particles, a ratio (S1/S2) of the first crystallite size S1 to a second crystallite size S2 is 1.35 or less, where the second crystallite size is obtained using Scherrer equation from a full width at half maximum of a peak derived from ( 220 ) plane of copper in X-ray diffraction measurement. A method for manufacturing the copper particles is also provided.

Claims (12)

1 . Copper particles mainly comprising a copper element,

wherein a ratio (S1/B) of a first crystallite size S1 to a particle size B is 0.23 or less, the first crystallite size being obtained using Scherrer equation from a full width at half maximum of a peak derived from ( 111 ) plane of copper in X-ray diffraction measurement, and the particle size being calculated from a BET specific surface area, and

a ratio (S1/S2) of the first crystallite size S1 to a second crystallite size S2 is 1.35 or less, the second crystallite size being obtained using Scherrer equation from a full width at half maximum of a peak derived from ( 220 ) plane of copper in X-ray diffraction measurement.

2 . The copper particles according to claim 1 , wherein the particle size is from 100 nm to 500 nm.

3 . The copper particles according to claim 1 or 2 , wherein a ratio (S1/S3) of the first crystallite size S1 to a third crystallite size S3 is 1.25 or less, the third crystallite size being obtained using Scherrer equation from a full width at half maximum of a peak derived from ( 311 ) plane of copper in X-ray diffraction measurement.

4 . The copper particles according to claim 1 , wherein the copper particles contain a carbon element, and a content of the carbon element is 1000 ppm or less.

5 . The copper particles according to claim 1 , wherein the copper particles contain a phosphorus element, and a content of the phosphorus element is 300 ppm or more.

6 . A method for manufacturing copper particles, comprising:

a first reduction step of reducing copper ions, thereby producing cuprous oxide; and

a second reduction step of reducing the cuprous oxide, thereby producing copper particles,

wherein polyphosphoric acid with two or more phosphoric acid units or a salt of the polyphosphoric acid is allowed to be present in a reaction system during or before the second reduction step.

7 . The manufacturing method according to claim 6 , wherein the first reduction step and the second reduction step are performed in a same reaction system.

Assignments (2)
CHANGE OF NAME Recorded Nov 14, 2025
From: MITSUI MINING & SMELTING CO., LTD.
To: MITSUI KINZOKU COMPANY, LIMITED
Reel/Frame 073574/0634 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2023
From: AKIZAWA, MIZUKI; IDE, HITOHIKO; SASAKI, TAKAFUMI
To: MITSUI MINING & SMELTING CO., LTD.
Reel/Frame 064915/0775 →