Methods for manufacturing an electronic device
Methods for manufacturing an electronic device are provided. A representative method includes providing a substrate. The substrate has an active layer, a first patterned metal layer passing through a passivation layer to electrically connected to the active layer, a second patterned metal layer passing through an insulating layer to electrically connected to the first patterned metal layer, and a metal layer under the second patterned metal layer. A part of the metal layer does not serve as a portion of a thin film transistor, and the part of the metal layer serves as a portion of a gate line. The method includes providing a carrier substrate supporting a plurality of elements, conducting a testing to the elements, transferring the elements from the carrier substrate to the second patterned metal layer of the substrate, and fixing the elements to the substrate.
1. A method for manufacturing an electronic device comprising:
providing a substrate, the substrate having an active layer, a first patterned metal layer passing through a passivation layer to electrically connected to the active layer, a second patterned metal layer passing through an insulating layer to electrically connected to the first patterned metal layer, and a metal layer under the second patterned metal layer, wherein a part of the metal layer does not serve as a portion of a thin film transistor, and the part of the metal layer serves as a portion of a gate line;
providing a carrier substrate supporting a plurality of elements;
conducting a testing to the plurality of elements;
transferring at least one of the plurality of elements from the carrier substrate to the second patterned metal layer of the substrate; and
fixing the at least one of the plurality of elements to the substrate.
2. The method of claim 1 , wherein the testing comprises photoluminescence testing.
3. The method of claim 1 , wherein the testing comprises electroluminescence testing.
4. The method of claim 1 , wherein conducting the testing comprises determining whether the at least one of the plurality of elements is good or defective.
5. The method of claim 1 , further comprising determining a first group of the plurality of elements as good and a second group of the plurality of elements as defective, and transferring the first group of the plurality of elements from the carrier substrate to the substrate.