IP Library Granted Patent US 12,067,710
Granted Patent B2
US 12,067,710 · App. 18/296,995 · Granted Aug 20, 2024

Method and apparatus for spot-checking visual inspection system

Inventors: Qian Wu (Ningde, CN); Jiwei Chen (Ningde, CN); Guannan Jiang (Ningde, CN)
Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
G06T7/001G06T2207/30108
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Quick Facts
Patent No.
US 12,067,710
App. No.
18/296,995
Granted
Aug 20, 2024
Kind
B2
Abstract

A spot-checking method for a visual inspection system includes obtaining a plurality of to-be-inspected images, inspecting the plurality of to-be-inspected images to obtain defect types and/or parameters of a target object in the plurality of to-be-inspected images, and confirming availability of the visual inspection system based on the defect types and/or the parameters.

Claims (53)

1. A spot-checking method for a visual inspection system, comprising:

obtaining a plurality of to-be-inspected images;

inspecting the plurality of to-be-inspected images to obtain defect types and/or parameters of a target object in the plurality of to-be-inspected images, comprising:

determining a size of the target object in each of the plurality of to-be-inspected images by calculating a number of pixels included in the target object in the each of the plurality of to-be-inspected images; and

confirming availability of the visual inspection system based on the defect types and/or the parameters, comprising:

confirming the availability of the visual inspection system by comparing the number of pixels included in the target object in each of the plurality of to-be-inspected images with a threshold.

2. The spot-checking method according to claim 1 , wherein obtaining the plurality of to-be-inspected images comprises:

obtaining the plurality of to-be-inspected images from a specimen image library, wherein a defect type of each image in the specimen image library is known.

3. The spot-checking method according to claim 1 , wherein inspecting the plurality of to-be-inspected images to obtain defect types and/or the parameters of the target object in the plurality of to-be-inspected images further comprises:

performing defect detection on the plurality of to-be-inspected images by using a defect detection algorithm in the visual inspection system, to obtain the defect types of the target object in the plurality of to-be-inspected images.

4. The spot-checking method according to claim 1 , wherein confirming the availability of the visual inspection system based on the defect types and/or the parameters further comprises:

confirming, in response to the defect type of the target object in each of the plurality of to-be-inspected images being identical to a known defect type, that a defect detection algorithm of the visual inspection system is available.

5. The spot-checking method according to claim 1 , wherein obtaining the plurality of to-be-inspected images comprises:

running a standard target object inspection process; and

obtaining images of the target object captured by the visual inspection system as the plurality of to-be-inspected images.

6. The spot-checking method according to claim 1 , wherein the target object includes a battery cell or a sheet film.

7. The spot-checking method according to claim 1 , wherein inspecting the plurality of to-be-inspected images to obtain the defect types and/or the parameters of the target object in the plurality of to-be-inspected images further comprises:

performing grayscale measurement on each of the plurality of to-be-inspected images through the visual inspection system, to obtain grayscale of the target object in each of the plurality of to-be-inspected images.

8. The spot-checking method according to claim 1 , wherein confirming the availability of the visual inspection system based on the defect types and/or the parameters further comprises:

confirming, in response to the size of the target object in each of the plurality of to-be-inspected images being consistent with the threshold, that hardware of the visual inspection system is available.

9. The spot-checking method according to claim 8 , wherein the hardware comprises a plurality of cameras and a plurality of light sources.

10. The spot-checking method according to claim 9 , further comprising, before obtaining the plurality of to-be-inspected images:

receiving a selection instruction of a camera; and

setting the threshold of the target object corresponding to the camera.

11. The spot-checking method according to claim 10 , further comprising:

setting a number of times that the camera is to be spot-checked.

12. A non-transitory computer-readable storage medium storing a computer program that, when executed on a computer, causes the computer to perform the spot-checking method according to claim 1 .

13. A spot-checking apparatus for a visual inspection system, comprising:

an obtaining unit, configured to obtain a plurality of to-be-inspected images; and

a processing unit, configured to:

inspect the plurality of to-be-inspected images to obtain defect types and/or parameters of a target object in the plurality of to-be-inspected images, comprising:

determining a size of the target object in each of the plurality of to-be-inspected images by calculating a number of pixels included in the target object in the each of the plurality of to-be-inspected images; and

confirm availability of the visual inspection system based on the defect types and/or the parameters, comprising:

confirming the availability of the visual inspection system by comparing the number of pixels included in the target object in each of the plurality of to-be-inspected images with a threshold.

14. The spot-checking apparatus according to claim 13 , wherein the obtaining unit is further configured to obtain the plurality of to-be-inspected images from a specimen image library, wherein a defect type of each image in the specimen image library is known.

15. The spot-checking apparatus according to claim 13 , wherein the processing unit is further configured to:

perform defect detection on the plurality of to-be-inspected images by using a defect detection algorithm in the visual inspection system, to obtain the defect types of the target object in the plurality of to-be-inspected images.

16. The spot-checking apparatus according to claim 13 , wherein the processing unit is further configured to:

confirm, in response to the defect type of the target object in each of the plurality of to-be-inspected images being identical to a known defect type, that a defect detection algorithm of the visual inspection system is available.

17. The spot-checking apparatus according to claim 13 , wherein:

the processing unit is further configured to run a standard target object inspection process; and

the obtaining unit is further configured to obtain images of the target object captured by the visual inspection system as the plurality of to-be-inspected images.

18. The spot-checking apparatus according to claim 13 , wherein the processing unit is further configured to:

perform grayscale measurement on each of the plurality of to-be-inspected images through the visual inspection system, to obtain grayscale of the target object in each of the plurality of to-be-inspected images.

19. A spot-checking apparatus for a visual inspection system, comprising:

a memory storing a program; and

a processor configured to call the program from the memory and run the program to:

obtain a plurality of to-be-inspected images;

inspect the plurality of to-be-inspected images to obtain defect types and/or parameters of a target object in the plurality of to-be-inspected images, comprising:

determining a size of the target object in each of the plurality of to-be-inspected images by calculating a number of pixels included in the target object in the each of the plurality of to-be-inspected images; and

confirm availability of the visual inspection system based on the defect types and/or the parameters, comprising:

confirming the availability of the visual inspection system by comparing the number of pixels included in the target object in each of the plurality of to-be-inspected images with a threshold.

20. The spot-checking method according to claim 1 , wherein the threshold comprises a number of pixels included in the target object in an image captured by a camera at a standard position.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 6, 2024
From: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
To: CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
Reel/Frame 068338/0402 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 7, 2023
From: WU, QIAN; CHEN, JIWEI; JIANG, GUANNAN
To: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Reel/Frame 063251/0355 →
Continuity (2)
Continuation PCTCN2022115748 · Aug 30, 2022
Related Publication 20240070849A1 · Feb 29, 2024