IP Library Granted Patent US 11,950,377
Granted Patent B1
US 11,950,377 · App. 18/300,828 · Granted Apr 2, 2024

Flexible interconnect circuits for battery packs

Inventors: Jean-Paul Ortiz (White Lake, MI); Malcom Parker Brown (Mountain View, CA); Casey Anderson (San Carlos, CA); Will Findlay (San Carlos, CA); Gabrielle Tate (Royal Oak, MI); Shawn D'Gama (Wixom, MI); Arturo Cantu-Chavez (San Carlos, CA)
Assignee: CelLink Corporation
H05K3/46H05K1/0201H05K1/118H05K2201/10037
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Quick Facts
Patent No.
US 11,950,377
App. No.
18/300,828
Granted
Apr 2, 2024
Kind
B1
Abstract

Provided are flexible interconnect circuits comprising signal circuit elements. For example, a signal circuit element can be formed from the same metal sheet as a signal trace, thereby being monolithic with the signal circuit element. This integration of signal circuit elements into a flexible interconnect circuit reduces the number of additional operations and components (e.g., attaching external circuit elements). In some examples, a flexible interconnect circuit is used in a battery pack for interconnecting batteries while providing external terminals on the same side of the pack. Specifically, a flexible interconnect circuit comprises an interconnecting conductive layer (for connecting to batteries) and a return conductive layer, both extending between the first and second circuit edges. Each of these conductive layers comprises a corresponding external terminal at the first edge, while these layers are interconnected at the second edge. Otherwise, these layers are isolated from each other between the circuit edges.

Claims (25)

1. A method of fabricating a flexible interconnect circuit comprising a set of current controlling slits, the method comprising:

receiving a conductive layer design corresponding to a conductive layer of the flexible interconnect circuit, wherein the conductive layer design comprises design-contact-forming portions corresponding to contact-forming portions of the conductive layer;

determining a resistive heating map for the conductive layer based on an electric current map comprising target current values, wherein:

each of the target current values corresponds to one of the design-contact-forming portions and represents a maximum current to be flowed through a corresponding one of the contact-forming portions, and

the resistive heating map comprises heating rate values for different points in the conductive layer design; and

when any of the heating rate values in the resistive heating map falls outside of resistive-heating-map limits, adding or changing a design set of current controlling slits in the conductive layer design and determining the resistive heating map using the conductive layer design with the design set of current controlling slits until all of the heating rate values in the resistive heating map are within the resistive-heating-map limits; and

patterning the conductive layer in accordance with the conductive layer design comprising the design set of current controlling slits, wherein patterning the conductive layer comprises forming the set of current controlling slits corresponding to the design set of current controlling slits.

2. The method of claim 1 , wherein each slit in the design set of current controlling slits has a width (W) of less than 1 millimeter.

3. The method of claim 1 , wherein each slit in the design set of current controlling slits has an aspect ratio of a slit width (W) to a slit depth (D) of less than 10.

4. The method of claim 1 , wherein at least one slit in the design set of current controlling slits is a through slit forming a full separation between two portions of the conductive layer design.

5. The method of claim 1 , wherein at least one slit in the design set of current controlling slits is a partial slit providing only a partial separation between two portions of the conductive layer design and maintaining a part monolithic contact between the two portions.

6. The method of claim 5 , wherein the partial slit has a ratio of a slit depth (D) to a conductive layer thickness (T) of greater than 0.5.

7. The method of claim 1 , wherein the design set of current controlling slits in the conductive layer design is updated to provide resistances between set pairs of the contact-forming portions within resistance limits.

8. The method of claim 1 , wherein determining the resistive heating map for the conductive layer comprises accounting for environmental heat losses by the conductive layer.

9. The method of claim 1 , wherein the conductive layer at least partially overlaps with and adheres to a first insulator layer.

10. The method of claim 9 , wherein at least one slit in the set of current controlling slits at least partially overlaps with the first insulator layer.

11. The method of claim 9 , wherein the conductive layer at least partially extends between the first insulator layer and a second insulator layer.

12. The method of claim 1 , wherein the resistive-heating-map limits comprise multiple different current density values for different portions of the conductive layer design.

13. The method of claim 1 , wherein the resistive-heating-map limits comprise multiple different heating rate values for different portions of the conductive layer design.

14. The method of claim 13 , wherein the multiple different heating rate values of the resistive-heating-map limits are determined from current densities in the different portions of the conductive layer design.

15. The method of claim 14 , wherein updating the design set of current controlling slits in the conductive layer design is performed until the current densities in the different portions of the conductive layer design are within current density limits.

16. The method of claim 1 , wherein determining the resistive heating map is performed using computer modeling.

17. The method of claim 1 , wherein the conductive layer is formed from aluminum.

18. The method of claim 1 , wherein the conductive layer has a thickness of at least 100 micrometers.

19. The method of claim 1 , wherein the flexible interconnect circuit is configured for interconnecting batteries.

Assignments (2)
NOTICE OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Apr 18, 2024
From: CELLINK CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 067166/0404 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 14, 2023
From: ORTIZ, JEAN-PAUL; BROWN, MALCOM PARKER; ANDERSON, CASEY; FINDLAY, WILL; TATE, GABRIELLE; D'GAMA, SHAWN; CANTU-CHAVEZ, ARTURO
To: CELLINK CORPORATION
Reel/Frame 063330/0017 →
Continuity (1)
Provisional Application 63363032 · Apr 15, 2022
Cited By (1)
US 12,604,404