Accelerometer stuck condition compensation for devices with multiple accelerometers
The present disclosure is directed to accelerometer measurement compensation for a device with first and second accelerometers. The first and second accelerometers are included in first and second components, respectively, of the device that are configured to rotate with respect to a hinge. The device detects a stuck condition of the first accelerometer, and compensates acceleration measurements of the first accelerometer by exploiting redundant information from the second accelerometer and applying a runtime calibration of undesired offsets.
1 . A device, comprising:
a first component including a first accelerometer configured to generate a first acceleration measurement;
a second component including a second accelerometer configured to generate a second acceleration measurement, the first component and the second component being coupled to each other and configured to rotate around a rotation axis; and
a processor configured to:
detect a stuck condition of the first accelerometer in which a sensing component of the first accelerometer is unable to move, the sensing component configured to measure acceleration along the rotation axis;
compensate, in response to the stuck condition being detected, the first acceleration measurement using the second acceleration measurement; and
activate, in response to the stuck condition being detected for a first time, the second accelerometer from a low power state.
2 . The device of claim 1 wherein
each of the first and second acceleration measurements includes a first axis acceleration, a second axis acceleration, and a third axis acceleration,
the first axis acceleration is acceleration along an axis parallel to the rotation axis, and
in the compensation of the first acceleration measurement,
the first axis acceleration of the first acceleration measurement is set to the first axis acceleration of the second acceleration measurement,
the second axis acceleration of the first acceleration measurement is offset by a first value, and
the third axis acceleration of the first acceleration measurement is offset by a second value.
3 . The device of claim 1 wherein
each of the first and second acceleration measurements includes a first axis acceleration, a second axis acceleration, and a third axis acceleration,
the first axis acceleration is acceleration along an axis parallel to the rotation axis, and
in the compensation of the first acceleration measurement,
the first axis acceleration of the first acceleration measurement is set to the first axis acceleration of the second acceleration measurement,
a first value is set to a difference between the second axis acceleration of the first acceleration measurement and the second axis acceleration of the second acceleration measurement,
the second axis acceleration of the first acceleration measurement is offset by the first value,
a second value is set to a difference between the third axis acceleration of the first acceleration measurement and the third axis acceleration of the second acceleration measurement, and
the third axis acceleration of the first acceleration measurement is offset by the second value.
4 . The device of claim 3 wherein the first and second values are set in a case where the device is in a steady state in which the device is stationary for a determined amount of time, and a flat state in which the first component and the second component face the same direction.
5 . The device of claim 4 wherein the processor is configured to detect the flat state based on a simulated acceleration measurement of the first accelerometer and the second acceleration measurement.
6 . The device of claim 5 wherein
the simulated acceleration measurement includes a first axis simulated acceleration, a second axis simulated acceleration, and a third axis simulated acceleration,
the first axis simulated acceleration is set to the first axis acceleration of the second acceleration measurement,
the second axis simulated acceleration is set to the second axis acceleration of the first acceleration measurement offset by a third value, and
the third axis simulated acceleration is set to the third axis acceleration of the first acceleration measurement offset by a fourth value.
7 . The device of claim 4 wherein the processor is configured to detect the steady state based on the first acceleration measurement and the second acceleration measurement.
8 . The device of claim 1 wherein
each of the first and second acceleration measurements includes a first axis acceleration, a second axis acceleration, and a third axis acceleration, and
in the compensation of the first acceleration measurement, the first axis acceleration of the first acceleration measurement is set to the first axis acceleration of the second acceleration measurement.
9 . The device of claim 1 wherein
each of the first and second acceleration measurements includes a first axis acceleration, a second axis acceleration, and a third axis acceleration,
the first axis acceleration is acceleration along an axis parallel to the rotation axis, and
the processor detects the stuck condition in response to an absolute value of the first axis acceleration of the first acceleration measurement being greater than a determined threshold value for a determined amount of time.
10 . A method, comprising:
generating, by a first accelerometer in a first component of a device, a first acceleration measurement;
generating, by a second accelerometer in a second component of the device, a second acceleration measurement,
the first component and the second component being coupled to each other and configured to rotate around a rotation axis,
each of the first and second acceleration measurements includes a first axis acceleration, a second axis acceleration, and a third axis acceleration,
the first axis acceleration is acceleration along an axis parallel to the rotation axis;
detecting, by the device, a stuck condition of the first accelerometer in which a sensing component of the first accelerometer is unable to move, the sensing component configured to measure acceleration along the rotation axis; and
compensating, in response to the stuck condition being detected, the first acceleration measurement using the second acceleration measurement, the compensating of the first acceleration measurement includes:
setting the first axis acceleration of the first acceleration measurement to the first axis acceleration of the second acceleration measurement,
offsetting the second axis acceleration of the first acceleration measurement by a first value, and
offsetting the third axis acceleration of the first acceleration measurement by a second value.
11 . The method of claim 10 wherein
the compensating of the first acceleration measurement, includes:
setting the first value to a difference between the second axis acceleration of the first acceleration measurement and the second axis acceleration of the second acceleration measurement, and
setting the second value to a difference between the third axis acceleration of the first acceleration measurement and the third axis acceleration of the second acceleration measurement.
12 . The method of claim 11 wherein the first and second values are set in a case where the device is in a steady state in which the device is stationary for a determined amount of time, and a flat state in which the first component and the second component face the same direction.
13 . The method of claim 10 wherein
the detecting of the stuck condition is in response to detecting an absolute value of the first axis acceleration of the first acceleration measurement is greater than a determined threshold value for a determined amount of time.
14 . A device, comprising:
a first component including a first accelerometer configured to measure a first acceleration along a first axis, a second acceleration along a second axis, and a third acceleration along a third axis;
a second component coupled to the first component, the first component and the second component configured to rotate around an axis parallel to the first axis, the second component including a second accelerometer configured to measure a fourth acceleration along the first axis, a fifth acceleration along the second axis, and a sixth acceleration along the third axis; and
a processor configured to:
detect a stuck condition in a case where an absolute value of the first acceleration is greater than a determined threshold value for a determined amount of time;
compensate, in response to the stuck condition being detected, the first acceleration, the second acceleration, and the third acceleration based on the fourth acceleration, the fifth acceleration, and the sixth acceleration; and
set, in response to the stuck condition being detected, the first acceleration to the fourth acceleration, offset the second acceleration by a first value, and offset the third acceleration by a second value.
15 . The device of claim 14 wherein the processor is configured to:
determine the device is in a steady state in which the device is stationary for a determined amount of time;
determine the device is in a flat state in which the first component and the second component face the same direction; and
in response to the device being determined to be in the steady state and the flat state, set the first value to a difference between the second acceleration and the fifth acceleration, and set the second value to a difference between the third acceleration and the sixth acceleration.
16 . The device of claim 14 wherein the processor is configured to set the first acceleration to the fourth acceleration in response to the stuck condition being detected.