IP Library Granted Patent US 12,519,000
Granted Patent B2
US 12,519,000 · App. 18/334,024 · Granted Jan 6, 2026

Automated teach apparatus for robotic systems and method therefor

Inventors: Justo Graciano (Hayward, CA); Helen Hwang (Fremont, CA); Erick Pastor (San Jose, CA)
Assignee: Brooks Automation US, LLC
H01L21/681B25J9/1697H01L21/67161
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Quick Facts
Patent No.
US 12,519,000
App. No.
18/334,024
Granted
Jan 6, 2026
Kind
B2
Abstract

An automatic teaching system for a substrate processing apparatus, the automatic teaching system comprising a frame having a workpiece load station with a predetermined load station reference location, a robot transport mounted to the frame and having a movable transport arm with an end effector having a predetermined end effector reference location, and a drive section driving the movable transport arm in at least one degree of freedom motion relative to the frame, a machine vision system including both at least one fixed imaging sensor and at least one movable imaging sensor removably connected to the frame and configured to image at least one target of the machine vision system, a load jig disposed for removable engagement with the workpiece load station, with both the at least one fixed imaging sensor and the at least one movable imaging sensor mounted to the load jig, the fixed imaging sensor.

Claims (30)

1. A method for automatic teaching of a substrate processing apparatus, the method comprising:

providing a frame of an automatic teaching system having a workpiece load station with a predetermined load station reference location;

providing a robot transport mounted to the frame and having:

a movable transport arm with an end effector having a predetermined end effector reference location, and

a drive section driving the movable transport arm in at least one degree of freedom motion relative to the frame;

providing a load jig disposed for removable engagement with the workpiece load station;

imaging at least one target of a machine vision system, the machine vision system including both at least one fixed imaging sensor and at least one movable imaging sensor removably connected to the frame, with both the at least one fixed imaging sensor and the at least one movable imaging sensor mounted to the load jig, the fixed imaging sensor having a predetermined pose with respect to the predetermined load station reference location, wherein the movable transport arm has at least one arm target, of the at least one target, in a predetermined position with respect to the predetermined end effector reference location and in view of the fixed imaging sensor with the load jig engaged with the workpiece load station; and

justifying, with the movable imaging sensor having a justification feature on a base of the movable imaging sensor, the movable imaging sensor in a predetermined position relative to the predetermined end effector reference location.

2. The method of claim 1 , wherein the frame has another workpiece holding station apart from the load station for holding a workpiece thereon, the another workpiece holding station having a predetermined holding station reference location.

3. The method of claim 1 , further comprising a controller communicably connected to the drive section to move the movable transport arm and communicably connected to the at least one fixed imaging sensor, the method further comprising moving with the controller, the movable transport arm to at least one teach position relative to the load jig and image, with the at least one fixed imaging sensor, the at least one arm target with the movable transport arm in the at least one teach position for resolving, based on the image of the at least one arm target, offset between the predetermined end effector reference location and the predetermined load station reference location and between the predetermined end effector reference location and the justification feature of the base of the movable imaging sensor.

4. The method of claim 3 , wherein the load jig is configured as a mock substrate carrier, with an opening in a front wall of the mock substrate carrier arranged for end effector entry into the mock substrate carrier through the front wall, and a field of view of the at least one fixed imaging sensor faces the opening in the front wall of the load jig.

5. The method of claim 4 , wherein the at least one arm target is disposed facing the front wall and the opening on approach of the movable transport arm, along the motion path extending through the opening, to the workpiece load station and entry into the mock substrate carrier.

6. The method of claim 4 , wherein the opening of the load jig is oriented in a vertical plane.

7. The method of claim 4 , wherein the at least one fixed imaging sensor is positioned for imaging the at least one arm target in a direction extending through the opening of the load jig so that the resolved offset frees end effector extension through the opening into an interior of the load jig.

8. The method of claim 4 , wherein the at least one fixed imaging sensor is positioned for imaging the at least one arm target in a direction extending through the opening of the load jig so that the controller confirms, based on the resolved offset, unobstructed arm extension of the end effector into an interior of the load jig.

9. The method of claim 4 , wherein the at least one fixed imaging sensor is positioned for imaging the at least one arm target in a crossing direction extending at a crossing angle to an extension path of the end effector extending through the opening into an interior of the load jig.

10. The method of claim 4 , wherein the resolved offset, based on the image of the at least one arm target image in the direction extending through the opening, operates to align the at least one arm target to another progressive teach position, so that offset resolution based on the image of the at least one arm target in the crossing direction progressively resolves the resolved offset.

11. The method of claim 3 , wherein the at least one fixed imaging sensor is positioned for imaging at least one end effector target disposed on the end effector, on a wafer plane defined by the end effector and in a predetermined position with respect to the predetermined end effector reference location.

12. The method of claim 1 , wherein the at least one teach position comprises a series of teach positions, each teach position being spaced from each other by a predetermined distance along a motion path of the at least one arm target defined by movable transport arm motion in the at least one degree of freedom.

13. The method of claim 1 , wherein the at least one arm target has a predetermined indicia embodying a predetermined characteristic, describing at least a target plane, imaged by the at least one fixed imaging sensor so that the offset resolves in part in a reference plane of the workpiece load station based on the image of the at least one arm target.

14. The method of claim 1 , wherein the movable transport arm has more than one of the arm target disposed so that each arm target, imaged by the at least one fixed imaging sensor, characterizes different offset aspects, each of which correspond to different respective drive axis pairs of the drive section effecting the at least one degree of freedom motion of the movable transport arm, that correspond to different respective reference planes of the workpiece load station, so that each different offset aspect is resolved by a separate image of the respective arm target, and offset resolution is effected in entirety by combination of the resolved different offset aspect.

15. The method of claim 14 , wherein a first of the different respective drive axis pairs that correspond to a first of the at least one arm target, shares a drive axis with a second of the different respective drive axis pairs that correspond to a second one of the at least one arm target, wherein resolution of a second of the different offset aspect confirms or serves to refine part of a first offset aspect with respect to a load station reference axis corresponding to the shared drive axis and resolved with the first of the at least one arm target.

16. The method of claim 1 , wherein the movable transport arm has more than one of the at least one arm target disposed so that each arm target, imaged by the at least one fixed imaging sensor, separately characterizes different offset aspects, so that a first of the at least one arm target characterizes a first offset aspect and a second of the at least one arm target characterizes a second offset aspect different from the first offset aspect, and wherein the different characterization defined respectively by the first of the at least one arm target and the second of the at least one arm target are arranged so that resolution of the second offset aspect confirms or serves to refine part of the first offset aspect, with respect to a load station reference axis, the first offset aspect being separately resolved with the first of the at least one arm target.

17. The method of claim 1 , wherein the movable transport arm has more than one of the at least one arm target disposed so that each arm target, imaged by the at least one fixed imaging sensor, characterizes different offset aspects, each of which corresponds to a different respective at least one drive axis effecting the at least one degree of freedom motion of the movable transport arm, that corresponds to a different respective reference axis of the workpiece load station, so that each different offset aspect is resolved by a separate image of a respective arm target, and offset resolution is effected in entirety by combination of the separately resolved different offset aspect.

18. The method of claim 1 , wherein the at least one fixed imaging sensor comprises more than one fixed imaging sensors, each with a different predetermined pose so that an image sensor plane of each respective fixed imaging sensor corresponds to different respective load station reference plane, and the at least one arm target has an orientation corresponding to each respective fixed imaging sensor so that each fixed imaging sensor forms with a respective arm target different couples corresponding to and comprising the respective fixed image sensor and the respective arm target.

19. The method of claim 1 , wherein the at least one fixed image sensor is positioned for imaging the at least one arm target in more than one crossing direction, each of which extends at a crossing angle to the extension path of the end effector and to each other, each serving to progressively resolve the resolved offset along a respective axis corresponding to each degree of freedom of the at least one degree of freedom of arm motion effected by the drive section.

20. The method of claim 1 , wherein the justification feature of the base has an engagement feature that engages the end effector and justifies the at least one movable imaging sensor in a predetermined pose with respect to the predetermined end effector reference location.

21. The method of claim 1 , wherein the load jig has at least one mock workpiece holding slot, each of which corresponds to and represents a different workpiece holding slot of a workpiece carrier at the workpiece load station, and defines a different one of the predetermined load station reference location.

22. The method of claim 1 , wherein the base of the at least one movable imaging sensor is held in the load jig and is arranged for carriage and transport to and from the load jig and each holding station of the frame with the end effector, and the at least one movable imaging sensor has at least one movable imaging sensor mounted to the base so as to be disposed on the end effector with the base carried by the end effector, in a predetermined position with respect to the predetermined end effector reference location.

23. The method of claim 1 , further comprising at least one distance measuring sensor mounted on the base, so as to be carried and transported by the end effector holding the base, wherein the at least one distance measuring sensor senses distance in a distance sensing direction substantially aligned with a field of view of the at least one movable imaging sensor so that the field of view and distance sensing direction are substantially collimated with respect to each other.

Assignments (4)
FIRST SUPPLEMENTAL FIRST LIEN PATENT SECURITY AGREEMENT Recorded Oct 31, 2025
From: BROOKS AUTOMATION US, LLC; BROOKS AUTOMATION HOLDING, LLC
To: BARCLAYS BANK PLC
Reel/Frame 073428/0517 →
FIRST SUPPLEMENTAL SECOND LIEN PATENT SECURITY AGREEMENT Recorded Oct 31, 2025
From: BROOKS AUTOMATION US, LLC; BROOKS AUTOMATION HOLDING, LLC
To: GOLDMAN SACHS BANK USA
Reel/Frame 073461/0133 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2023
From: GRACIANO, JUSTO; PASTOR, ERICK
To: BROOKS AUTOMATION INC
Reel/Frame 063944/0626 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2023
From: BROOKS AUTOMATION INC
To: BROOKS AUTOMATION HOLDING, LLC
Reel/Frame 063990/0449 →
Continuity (3)
Continuation 17362565 · Jun 29, 2021
Provisional Application 63046289 · Jun 30, 2020
Related Publication 20230343626A1 · Oct 26, 2023
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